For the localisation of deep cerebral nuclei, an M4 Tornado bench-top μXRFinstrument (Bruker Nano GmbH, Berlin, Germany) was used. The rhodium X-ray tube was supplied with a voltage of 50 kV and a current of 600 μA throughout the measurements. The emitted X-ray fluorescence was detected by a silicon drift detector (XFlash® 5030, Bruker Nano GmbH, Berlin, Germany). Spatial resolution was approximately 25 μm. Each pixel was measured twice for 200 ms at a pressure of 20 mbar. The data was evaluated using the software ESPRIT HyperMap (Bruker Nano GmbH, Berlin, Germany).
Esprit hypermap
Manufactured by Bruker
Sourced in Germany, United States
The ESPRIT HyperMap is a high-performance elemental mapping system designed for advanced materials analysis. It provides rapid, high-resolution elemental imaging and quantification capabilities.
Automatically generated - may contain errors
Lab products found in correlation
2 protocols using esprit hypermap
1
Micro-XRF Localization of Deep Cerebral Nuclei
2
Non-Destructive X-Ray Analysis of Paraffin-Embedded Liver
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For the non-destructive analysis of a paraffin-embedded section of the WD liver sample, a laboratory bench-top mXRF spectrometer M4 Tornado (Bruker Nano GmbH, Berlin, Germany) was applied. The Rh-anode micro-focus X-ray tube was set at a voltage of 50 V and an anode current of 600 mA. The device was equipped with polycapillary optics to focus the incident X-ray beam on a size of approximately 25 mm for the Mo-K line.
For the detection of the emitted X-ray fluorescence, a silicon drift detector (SDD, XFlash s 5030, Bruker Nano GmbH) was utilized. In addition to this, the analyses were carried out in an evacuated sample chamber at 20 mbar. An area of 4.88 mm  2.67 mm of the WD sample was analyzed. The step size was set at 25 mm and each spot was analyzed for 100 ms. Data processing was performed using the software ESPRIT HyperMap (Bruker Nano GmbH) and images were generated using the software ImageJ (National Institute of Health, Bethesda, MD, USA).
For the detection of the emitted X-ray fluorescence, a silicon drift detector (SDD, XFlash s 5030, Bruker Nano GmbH) was utilized. In addition to this, the analyses were carried out in an evacuated sample chamber at 20 mbar. An area of 4.88 mm  2.67 mm of the WD sample was analyzed. The step size was set at 25 mm and each spot was analyzed for 100 ms. Data processing was performed using the software ESPRIT HyperMap (Bruker Nano GmbH) and images were generated using the software ImageJ (National Institute of Health, Bethesda, MD, USA).
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