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314 protocols using ultra plus

1

Scanning Electron Microscopy Analysis

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Scanning electron microscopy (SEM) analyses were performed using a Zeiss Ultra Plus instrument (Zeiss, Germany). Samples were coated with a thin layer of Au/Pd in a Quorum SC7620 sputter coater. Images were taken by two secondary InLens and SE2 electron detectors for higher or lower magnification, respectively. Scanning parameters were as follows: accelerating voltage, 3.5 kV; probe current, 36 pA; and pressure in the chamber, ~ 7 × 10–5 Pa.
EDX images were captured with the Zeiss Ultra Plus instrument. X-ray maps and spectra were taken by an X-MaxN 80 X-ray detector (Oxford Instruments, UK). The EDX parameters were as follows: accelerating voltage, 10 kV; probe current, 300 pA; working distance, 8.5 mm; and process time, 4 [AU].
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2

Coccolith Morphometric Analysis of Gephyrocapsa Strains

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Clonal Gephyrocapsa strains (Supplementary Table S1) from the Roscoff Culture Collection (RCC; roscoff-culture-collection.org) were maintained in K/2 (-Si,-Tris,-Cu) medium at 17 °C with 50 µmol-photons.m-2.s-1 illumination provided by daylight neon tubes with a 14:10 h L:D cycle. Samples were collected during late exponential phase before filtration using a 0.45 µm cellulose nitrate membrane filter, which were then mounted onto metallic stubs using adhesive tape and gold-coated using a sputter coater. Coccoliths and coccospheres were visualised using a Phenom ProX Desktop SEM (Phenom-World, Eindhoven, Netherlands) at the Station Biologique de Roscoff, France, on a Phillips XL-30 FEG field emission SEM (FEI, Eindhoven, Netherlands) and an Ultra Plus Zeiss at the facilities of the Natural History Museum, London, UK. Scanning electron micrographs were captured at magnifications ranging between ×8000 and ×20,000, and electron beam damage was minimised by operating the microscope at 15 kV. Morphometric measurements were carried out on the length of coccoliths, being the usual character measured for estimates of carbonate flux [48 (link)], with a minimum of 60 isolated coccoliths analysed per sample. See Supplementary Information for further details.
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Detailed Surface Analysis of Coated Materials

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The coated core material of each group (n=10) was investigated after random selection. Samples in each group were further subdivided to evaluate surface topography (n=5) and interface (n=5) through SEM (Ultra plus ZEISS, Oberkochen, Germany) equipped with EDS.
The specimens to be examined at interface were sliced to the desired shape by using a controlled-speed diamond saw machine (Sherline 5410, Sherline products, Vista, CA, USA) on a slow speed mode with water coolant. The interface of the specimens was polished with SiC grit sizes #600 and #800 on a flat surface under running water.
The samples were gold-sputtered using a sputter coater machine (JS-1600, Beijing HTCY, Beijing, China). The specimens were then examined in different magnifications through SEM. The spot and line EDS spectra were then recorded and analyzed.
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Scanning Electron Microscopy of Palladium Nanoparticles

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Morphology analysis of Chem-PdNPs and Bio-PdNPs was conducted by scanning electron microscopy (SEM). The carrier samples were allowed to air dry and pieces on each sample were removed and mounted with adhesive carbon tape on aluminium stubs in the upright position31 (link). These were viewed in a Zeiss Ultra Plus field emission scanning electron microscope (FE-SEM) (Zeiss, Germany) at 2 kV.
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5

Morphology of Au Screen-Printed Electrodes

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The morphology of the
Au screen-printed electrodes was investigated using a field-emission
scanning electron microscope Zeiss Ultra Plus (operating at 3 kV)
without coating.
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6

Comprehensive Characterization of MXene Monolayers

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Optical, AFM, and SECCM measurements of monolayer MXene flakes supported on carbon electrodes were acquired on a Park NX10 (Park Systems, South Korea). The AFM images were obtained in a non-contact mode (NCM) with a PPP-NCHR cantilever type (force constant = 42 N/m, resonance frequency = 330 kHz, Nanosensors). AFM and SECCM measurements were done in a room with temperature control. The temperature and humidity inside the SECCM and AFM Faraday cage were recorded for 7 days (see Supplementary Note 4), with a mean temperature of 22.6 ± 0.2 °C and relative humidity between 40 and 60 %RH. SEM images were acquired with a Zeiss Ultra Plus field-emision SEM with the secondary electron detectors, SE2 and In-Lens, at acceleration voltage of 3 kV. Energy dispersive X-ray spectroscopy (EDX) was performed on Zeiss Ultra Plus field-emission SEM at an acceleration voltage of 10 keV with a 20 mm² Oxford Inca EDX detector. X-ray diffraction (XRD) was obtained using the powder diffractometer Bruker D8 Discovery, in θ/2θ configuration and range of 3–75° at 2° min−1. Raman spectroscopy measurements were acquired using a WITec Alpha 300R with a 633 nm He-Ne laser source and 1800 lines/mm grating. The structural characterization measurements (EDX, Raman, and XRD) were performed on as-synthesized Ti3C2Tx thin film produced by vacuum filtration.
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7

Characterization of Hybrid ZnO-MoS2 Photocatalyst

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The morphologies of the hybrid ZnO-MoS2 photocatalyst and modified membranes were examined using a field emission scanning electron microscope (Zeiss Ultra plus, Carl Zeiss, Oberkochen, Germany). The membrane was initially pre-treated with gold (Au) sputtering to impart the electrical conductivity to get top surface and back-scattered micrographs of its cross-section morphology. The ZnO-MoS2 photocatalyst was inherently conductive, and sample imaging was performed using a high-resolution lens at an accelerating voltage of 20 kV without gold sputtering.
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8

Structural Characterization of Si Nanostructures

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Scanning Electron Microscopy (SEM) images of the Si nanostructures, as well as the prepared electrodes, were obtained with a Zeiss Ultra Plus (Carl Zeiss, Germany) at an acceleration voltage of 5 keV. X-Ray Diffraction was performed with a Bruker D5000 powder diffractometer equipped with a monochromatic Cu Kα radiation source. XRD patterns were collected between 5°<θ<90° , with a step size of 2θ = 0.02 and a time per step of 163 s.
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9

Visualizing Spray-Dried TB Microparticles

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The spray-dried TB microparticles were visually imaged using SEM at 3 keV (Zeiss Ultra Plus, Carl Zeiss Pty Ltd., Sydney, Australia). Prior to imaging, the samples were dispersed onto carbon tapes and coated with platinum using a Hummer VI sputtering device, reaching 200 Å coating thickness. Magnifications of 3000×, 10,000×, and 25,000× were used.
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10

SEM Imaging of Cell Morphology on Composite Surfaces

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Scanning electron microscope (SEM) imaging was performed to observe cell morphology and attachment on composite surfaces after one, three, and seven days of culture. Samples without cells were also imaged to examine the effect of culture medium and the presence of cells on the materials morphology. Samples were prepared by fixation in 2.5% glutaraldehyde, dehydration in a graded series of ethanol concentrations (30%, 50%, 70%, 90%, 95%, and 100%) and hexamethyldisilazane (HMDS), and gold coated using sputter method. Imaging was carried out using Zeiss Ultra Plus (Carl Zeiss AG, Oberkochen, Germany).
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