The scanning electron microscopy (SEM JSM-5910, JEOL), X-Ray Diffraction (Bruker D8: XRD), surface area analysis (BET), thermogravimetric analysis (TGA) and Fourier transform infrared spectroscopy (Shimadzu, IR Prestigue-21: FTIR) was used to characterize the adsorbents. BET (Brunauer, Emmett and Teller) was accomplished on the surface area of analyser (NOVA 2200, Quanta Chrome, USA with nitrogen standard) to examine the adsorbents (raw and acidified clay), while JEOL (JSM-5910) was applied for the determination of the composition. Similarly, SEM analyses were carried out on each sample by using Pt coating that inhibits the charge indulgence during its scanning at 10 kV in an Argon atmosphere. Thermal analysis was conducted in a nitrogen atmosphere using Perkin Elmer Pyris 1, at 5 °C/min under nitrogen flow rate 20 mL/min and the temperature was ramped from 40 to 800 °C. All samples (loaded and unloaded) were recorded in a FTIR-8400S (Shimadzu) from the percentage transmittance versus wavenumber in the range of 4,000-6500 cm -1 , resolution 2 cm -1 and 32 scans, Bio-Rad Merlin software was used to record the spectra.
Jsm 5910
Manufactured by JEOL
Sourced in Japan, United States
The JSM-5910 is a scanning electron microscope (SEM) produced by JEOL. It is designed for high-resolution imaging of samples at the micro- and nano-scale. The JSM-5910 utilizes a thermionic electron gun to generate the electron beam and features a secondary electron detector for topographical imaging. The instrument offers a wide range of magnification capabilities and can accommodate a variety of sample types.
Automatically generated - may contain errors
Lab products found in correlation
Nicolet 6700, by Thermo Fisher Scientific (6 mentions)
Inca200, by Oxford Instruments (2 mentions)
Jdx 3532, by JEOL (2 mentions)
Rf 5301pc, by Shimadzu (2 mentions)
D2 phase x ray diffractometer, by Bruker (1 mentions)
Dr6000, by HACH (1 mentions)
X ray photoelectron spectrometer, by Thermo Fisher Scientific (1 mentions)
C94012, by PerkinElmer (1 mentions)
Vacuum filtration assembly, by Merck Group (1 mentions)
Analytical balance, by Shimadzu (1 mentions)
Ultrapure water system, by Merck Group (1 mentions)
Malvern zetasizer zs90, by Malvern Panalytical (1 mentions)
Series 200 hplc system, by PerkinElmer (1 mentions)
Franz diffusion cell, by PermeGear (1 mentions)
X pert pro diffractometer, by Malvern Panalytical (1 mentions)
Zetasizer nano, by Malvern Panalytical (1 mentions)
D max 2, by Rigaku (1 mentions)
Nicolet is5 atr ftir, by Thermo Fisher Scientific (1 mentions)
Sdt q600 thermal analysis system, by TA Instruments (1 mentions)
X pert pro, by Malvern Panalytical (1 mentions)
78 protocols using jsm 5910
1
Comprehensive Characterization of Adsorbents
2
Bacterial Adsorption on Materials
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Scanning electron microscope was used to observe the bacterial adsorption on the materials, the cell suspension of P. versutus CM1 was inoculated into PG and PUF and incubated at 37 °C for 72 h. The samples were cut into smaller pieces (<1 cm) and 2.5% glutaraldehyde was added for sample fixation. The samples were then rinsed three times with 0.1 M phosphate-buffered saline (PBS), followed by an ethanol dehydration series. The samples were then completely dried, mottled, coated with gold, and observed under the Jeol JSM-5910 scanning electron microscope, hereinafter SEM, (JEOL USA, Inc., Peabody, MA, USA).
3
Characterization of Welding Waste-Derived Graphene Oxide
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The welding waste-derived GO was characterized by FTIR, FESEM, EDX and XRD analysis. The composition and crystallinity of GO was investigated through X-ray diffractometer (XRD; model JDX-9C, JOEL, Tokyo, Japan) using CuKα radiation (1.54178 A° wavelength) and an Ni filter. The surface morphology and elemental composition was studied by FESEM and EDX analysis through Scanning Electron Microscope (Model JEOL-Jsm-5910; Tokyo, Japan). The functional group composition was evaluated by FTIR spectrophotometer (Schimadzu-A60, Tokyo, Japan).
4
Hydration Characterization of ECC
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Fourier transform infrared (FTIR, Nexus 870, Thermo Nicolet Corps, Waltham, MA, USA) spectroscopy, X-ray diffraction analysis (XRD, Ultima 111, Rigaku Inc., Tokyo, Japan), scanning electron microscopy (SEM, JSM 5910 JEOL, Tokyo, Japan), and energy dispersive X-ray spectroscopy (EDX, INCA 2000, Oxford Instruments, High Wycombe, UK) were employed to assess the hydration characteristics of 28 day cured ECC specimens.
5
Green Synthesis of Gold Nanoparticles
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The gold nanoparticles, which were formed by reacting HAuCl4 and E. milii were detected by UV-Visible spectrophotometer (Hitachi U-3200, Japan), FTIR (Shimadzu, Prestige-21, Japan), atomic force microscope (Agilent Technologies 5500, USA), scanning electron microscope (JSM-5910-JEOL, Japan) and by noticeable color change. By varying the ratio of gold solution and plant extract, the intensity of the peak was changing and a change to visible color was noted. Gold–milii solutions were used in a ratio of 1:1, 2:1, 3:1 and 4:1--- 20:5. The 20 ml 1 mM gold solution and 5 ml plant extract (i.e. 20:5) gave a uniform and sharp peak at 540 nm with an absorbance of 1.89 (Fig. 1 ). With this ratio a bulk solution was made for further studies.![]()
UV-Visible spectra of Au-EM. UV-Visible spectra showing successful formation of Au-EM by observing peaks in the region specified for gold nanoparticles
6
Activated Carbon from Oil Palm Trunk
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All chemical reagents were of analytical grade and used without further purification. Oil palm trunk chips were purchased from a local factory. Phosphoric acid (H3PO4, 80%) and MB were purchased from Sigma-Aldrich, (Petaling Jaya, Malaysia).
The surface morphology of oil palm trunk activated carbon (OPTAC) was characterized using a scanning electron microscope (model JSM-5910, JEOL USA, Peabody, MA, USA). A Nicolet iS20 spectrophotometer was used for the identification of chemical functional groups present in OPTAC through FTIR-ATR analysis. Meanwhile, a Bruker D2 Phase X-ray diffractometer with Cu-Kα (λ = 0.154060 Å) radiation source operating at 40 kV and 25 mA was utilized for studying the diffraction patterns of OPTAC. A UV-vis spectrophotometer (HACH DR6000) was used for the determination of MB removal percentage.
The surface morphology of oil palm trunk activated carbon (OPTAC) was characterized using a scanning electron microscope (model JSM-5910, JEOL USA, Peabody, MA, USA). A Nicolet iS20 spectrophotometer was used for the identification of chemical functional groups present in OPTAC through FTIR-ATR analysis. Meanwhile, a Bruker D2 Phase X-ray diffractometer with Cu-Kα (λ = 0.154060 Å) radiation source operating at 40 kV and 25 mA was utilized for studying the diffraction patterns of OPTAC. A UV-vis spectrophotometer (HACH DR6000) was used for the determination of MB removal percentage.
7
Characterization of Drug-Loaded Nanoparticles
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SEM (JSM-5910, JEOL, Tokyo, Japan) analysis was utilized for the characterization of surface morphology and shape of drug-loaded nanoparticles. For the SEM analysis, the lyophilized nanoparticles were spread on the adhesive carbon tape attached to the stub. The nanoparticles surface was coated with gold (Au) via a coater (Argon Sputtering, SPI Module Control) for about 90 s under a vacuum. The prepared sample was then analyzed under SEM.
8
Characterization of FA-CS-5FU-NP Morphology
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The surface morphology of FA-CS-5FU-NP-Bf and FA-CS-5FU-NP-Bo were analyzed using a scanning electron microscope (JSM5910, JEOL, Akishima, Japan) and fluorescence microscope (SWIFT, M3300-D, LA, USA).
9
Characterization of ZnO Nanoparticles
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The shape and size of ZnO-NPs was investigated by employing SEM JSM5910 (JEOL, Japan). The image was obtained with a scanning electron microscope after using fine powder of ZnO-NPs at a 20 kV accelerating voltage.
10
Characterization of Nanocomposite Materials
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The morphology of the prepared
nanocomposites
was obtained by scanning electron microscopy (SEM) (JSM 5910, Jeol,
Japan) at various magnifications of 500×, 1000×, 5000×,
and 10,000×. A Fourier transform infrared (FTIR) spectroscope
Vertex 70 (Bruker, Billerica, MA, USA) with a DLaTGS detector and
a He Ne laser in the 4000–500 cm–1 range
was used to examine the nanocomposite structure. On an automated pore
size and surface area analyzer, the Brunauer–Emmett–Teller
(BET) surface area and pore size distribution were calculated using
N2 adsorption–desorption (JW-BK122W, Beijing JWGB),
an energy-dispersive X-ray (EDX) system (INCA200/Oxford Instruments)
was used for elemental composition, and a UV–visible double
beam spectrophotometer (Model SP-3000DB, Optima, Japan) was used for
absorbance measurement using quartz cuvettes. The spectral bandwidth
and wavelength range for this instrument is 1 nm and 190 to 1100 nm.
nanocomposites
was obtained by scanning electron microscopy (SEM) (JSM 5910, Jeol,
Japan) at various magnifications of 500×, 1000×, 5000×,
and 10,000×. A Fourier transform infrared (FTIR) spectroscope
Vertex 70 (Bruker, Billerica, MA, USA) with a DLaTGS detector and
a He Ne laser in the 4000–500 cm–1 range
was used to examine the nanocomposite structure. On an automated pore
size and surface area analyzer, the Brunauer–Emmett–Teller
(BET) surface area and pore size distribution were calculated using
N2 adsorption–desorption (JW-BK122W, Beijing JWGB),
an energy-dispersive X-ray (EDX) system (INCA200/Oxford Instruments)
was used for elemental composition, and a UV–visible double
beam spectrophotometer (Model SP-3000DB, Optima, Japan) was used for
absorbance measurement using quartz cuvettes. The spectral bandwidth
and wavelength range for this instrument is 1 nm and 190 to 1100 nm.
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