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Xpert pro mpd x

Manufactured by Philips

The Philips XPert PRO MPD X is a versatile laboratory X-ray diffractometer designed for materials analysis and research. It offers high-resolution data collection and advanced features for various applications in materials science, nanotechnology, and crystallography. The core function of the XPert PRO MPD X is to perform X-ray diffraction analysis to characterize the structural properties of a wide range of materials.

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2 protocols using xpert pro mpd x

1

Multimodal Characterization of Nanomaterials

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Transmission electron microscopy (TEM) images were taken with a JEM-2100F transmission electron microscope (JEOL) operating at 200 kV. Energy dispersive X-ray (EDX) mapping images were obtained on a JEM-2100F equipped with an energy dispersive X-ray analyzer. Inductively coupled plasma optical emission spectrometry (ICP-OES) were performed on a Thermo Scientific ICAP 6300 Duo View Spectrometer. Dynamic light scattering (DLS) and zeta potential measurements were performed on a Malvern Zetasizer Nano ZS90. X-ray diffraction (XRD) patterns were recorded on a Philips XPert PRO MPD X-ray diffractometer operated at 35 kV and 45 mA with Cu-Kα radiation. The upconversion luminescent properties were studied using a Horiba Jobin Yvon FluoroLog3 spectrometer equipped with a 980 nm diode laser as excitation. The downconversion luminescent properties were studied using an Acton SP2300i spectrometer equipped with an InGaAs linear array detector (Princetion OMA-V) and using a 980 nm diode laser as excitation. NIR fluorescence images of the downconversion emission were obtained using 2D InGaAs array (Ninox 640, Raptor Photonics) with 640 × 512 pixel using a 980 nm diode laser as excitation. Raman spectra were obtained with polarized incident laser light (λ = 532 nm) on Jobin Yvon T64000.
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2

Multimodal Characterization of Nanomaterials

Check if the same lab product or an alternative is used in the 5 most similar protocols
Transmission electron microscopy (TEM) images were taken with a JEM-2100F transmission electron microscope (JEOL) operating at 200 kV. Energy dispersive X-ray (EDX) mapping images were obtained on a JEM-2100F equipped with an energy dispersive X-ray analyzer. Inductively coupled plasma optical emission spectrometry (ICP-OES) were performed on a Thermo Scientific ICAP 6300 Duo View Spectrometer. Dynamic light scattering (DLS) and zeta potential measurements were performed on a Malvern Zetasizer Nano ZS90. X-ray diffraction (XRD) patterns were recorded on a Philips XPert PRO MPD X-ray diffractometer operated at 35 kV and 45 mA with Cu-Kα radiation. The upconversion luminescent properties were studied using a Horiba Jobin Yvon FluoroLog3 spectrometer equipped with a 980 nm diode laser as excitation. The downconversion luminescent properties were studied using an Acton SP2300i spectrometer equipped with an InGaAs linear array detector (Princetion OMA-V) and using a 980 nm diode laser as excitation. NIR fluorescence images of the downconversion emission were obtained using 2D InGaAs array (Ninox 640, Raptor Photonics) with 640 × 512 pixel using a 980 nm diode laser as excitation. Raman spectra were obtained with polarized incident laser light (λ = 532 nm) on Jobin Yvon T64000.
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