The morphology and structure were characterized by high-resolution transmission electron microscopy (JEM-2100, JEOL Co.). XRD (X'Pert, PANalytical BV) was used to analyse the crystal structure. The diffuse reflectance spectra were measured on a ultraviolet–visible spectrophotometer (UV 2550, Shimadzu Co.). The chemical compositions were characterized using XPS (PHI 5600, Perkin-Elmer Inc.) and Raman spectrum (LABRAM-HR, JY Co.). The electronic state of Ti and O atoms were measured to provide structural information by ESR (JES-FA200, JEOL Co.). The surface area was measured using the BET method with a Builder 4200 instrument (Tristar II 3020M, Micromeritics Co.) at liquid nitrogen temperature. The infrared spectra were recorded between 4,000 and 400 cm−1 with a FTIR spectrometer (Magna-IR 750, Nicolet Instrument Co.) using a potassium bromide disc technique.
Tristar 2 3020m
Manufactured by Micromeritics
Sourced in United States
The Tristar II 3020M is a high-performance surface area and porosity analyzer. It is designed to accurately determine the surface area, pore size, and pore volume of a wide range of materials using the gas adsorption technique. The instrument features automated data collection and analysis, providing reliable and reproducible results.
Automatically generated - may contain errors
Lab products found in correlation
Uv 2550, by Shimadzu (2 mentions)
Ttr 3, by Rigaku (2 mentions)
Jes fa200, by JEOL (1 mentions)
Phi 5600, by PerkinElmer (1 mentions)
X pert, by Malvern Panalytical (1 mentions)
Jem 2100, by JEOL (1 mentions)
Axis ultra dld, by Shimadzu (1 mentions)
Jem 2011, by JEOL (1 mentions)
Jem 2100f, by JEOL (1 mentions)
Labram hr evolution, by Horiba (1 mentions)
Sirion 200, by Thermo Fisher Scientific (1 mentions)
X pert pro, by Malvern Panalytical (1 mentions)
Optima 7300 dv, by PerkinElmer (1 mentions)
Escalab 250, by Thermo Fisher Scientific (1 mentions)
Thermo escalab 250xi, by Thermo Fisher Scientific (1 mentions)
H 800 transmission electron microscope, by Hitachi (1 mentions)
D8 advance, by Bruker (1 mentions)
Belcat 2, by Microtrac (1 mentions)
Jem arm200f tem stem, by JEOL (1 mentions)
Rbd upgraded phi 5000c esca system, by PerkinElmer (1 mentions)
7 protocols using tristar 2 3020m
1
Comprehensive Characterization of Nanomaterials
2
Characterization of Nanomaterial Morphology
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The product morphology is characterized by transmission electron microscopy (TEM, JEM-2011, JEOL, Tokyo, Japan) and high-resolution transmission electron microscopy (HRTEM, JEM-2100F, JEOL, Tokyo, Japan). The crystalline structure of the products is analyzed using an X-ray diffractometer (TTRIII, Rigaku, Tokyo, Japan) and a Raman spectrometer (LabRam HR Evolution, Horiba Scientific, Villeneuve d’Ascq, France). Raman spectrum measurements are carried out by the 532-nm line of an He-Ne laser as the excitation source in the spectral range of 500–3000 cm−1. X-ray diffraction (XRD) measurements are performed using a Cu-Kα radiation in the 2θ range of 10 to 70°. The elemental analysis of the products is conducted using X-ray photoelectron spectroscopy (XPS, Axis Ultra DLD, Kratos, Manchester, England). XPS spectra are obtained via a monochromatic Al irradiation source in the range of 200–700 eV. Nitrogen adsorption–desorption isotherm measurements of the products are performed using a surface area analyzer (TristarII3020M, Micromeritics, Atlanta, USA). The Brunauer–Emmett–Teller (BET) method is used to calculate the specific surface area of the products.
3
Characterization of GO/mPmPD/PVA Aerogel
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The morphology of the GO/mPmPD/PVA aerogel was obtained by scanning electron microscopy (SEM, Sirion 200, FEI Co., USA). The concentration of Ag(i ) was determined by inductively coupled plasma emission spectrometry (ICP-ES, Optima 7300 DV, PerkinElmer Inc., Electron Co., USA). The concentration of methyl orange and Congo red were determined using a UV-vis spectrophotometer (UV-2550, Shimadzu Co., Japan). The X-ray diffraction patterns of GO, GO/PmPD, and GO/mPmPD/PVA aerogel were determined using CuKα radiation and an X-ray diffractometer (XRD, X'Pert PRO, PANalytical B.V., The Netherlands). Fourier-transform-infrared (FT-IR) spectra were measured using an infrared spectrophotometer (FT-IR, Nicolet 8700, Thermo Scientific Instrument Co., USA). X-ray photoelectron spectra were recorded using an X-ray photoelectron spectrometer (XPS, ESCALAB 250, Thermo-VG Scientific Co., USA). The pore size, pore volume and surface area were measured by accelerated surface area and porosimetry (Tristar II 3020M, Micromeritics Instrument Co., USA). Thermogravimetric analysis (TGA) was carried out using a thermoanalyser at a heating rate of 10 °C min−1 under an air atmosphere flow (TGA Q5000IR, TA Instrument Co., USA).
4
Comprehensive Characterization of Sample
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The general morphology and microstructure of the sample were observed under a scanning electron microscope (SEM; Hitachi, Ltd., Tokyo, Japan) and a H-800 transmission electron microscope (TEM; Hitachi, Ltd., Tokyo, Japan). The nitrogen adsorption–desorption isotherm of the sample was measured using a porosimetry analyzer (Tristar II, 3020M, Micromeritics, USA). The structure and interaction of the sample was characterized using an X-ray diffractometer (XRD) (TTR-III, Rigaku Co., Japan) and an X-ray photoelectron spectroscope (XPS) (Thermo ESCALAB 250XI, USA), respectively. The composition of the sample was determined using a Thermo Nicolet iS10 Fourier transform infrared (FT-IR) spectrometer (Thermo Electron, Co., USA), and the spectral data were processed using the software of the spectrometer (OMNIC). The magnetic behavior of the sample was measured by a superconducting quantum interference device magnetometer (Bruker Co., Germany).
5
Structural and Acidic Analysis of Catalysts
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N2 physisorption was used to analyze
the structural characteristics
of catalysts at about −196 °C (nitrogen saturation temperature)
in an Autosorb-1 apparatus (TriStar II 3020M, Micromeritics, USA).
Powder X-ray diffraction (XRD, D8 ADVANCE, Bruker, Germany) was employed
to identify the crystalline phases of catalysts using Cu Kα
radiation (λ = 0.15406 nm) at 40 kV and 150 mA. NH3–TPD (BELCAT II, MicrotracBEL Japan) was used to determine
the acidities of catalysts. The testing conditions were referenced
from the literature.27 (link)
the structural characteristics
of catalysts at about −196 °C (nitrogen saturation temperature)
in an Autosorb-1 apparatus (TriStar II 3020M, Micromeritics, USA).
Powder X-ray diffraction (XRD, D8 ADVANCE, Bruker, Germany) was employed
to identify the crystalline phases of catalysts using Cu Kα
radiation (λ = 0.15406 nm) at 40 kV and 150 mA. NH3–TPD (BELCAT II, MicrotracBEL Japan) was used to determine
the acidities of catalysts. The testing conditions were referenced
from the literature.27 (link)
6
Comprehensive Characterization of Solid Samples
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Powder XRD patterns of samples were recorded on a Rigaku Miniflex-600 operating at 40 KV voltage and 15 mA current with Cu Kα radiation (λ = 0.15406 nm). The SEM images were taken using a field-emission SEM (JSM-6701F, JEOL) operated at an accelerating voltage of 5 kV. The morphologies of samples were examined by TEM, using a Hitachi-7700 microscope with an accelerating voltage of 100 kV. The high-resolution TEM, HAADF-STEM, and EELS mapping were carried out by JEOL JEM-ARM200F TEM/STEM with a spherical aberration corrector working at 200 kV. The XPS was carried out on a Perkin-Elmer RBD upgraded PHI-5000C ESCA system. Raman scattering spectra were performed with a Renishaw System 2000 spectrometer using the 514.5 nm line of Ar+ for excitation. Elemental analysis of Co in the solid samples was detected by an Optima 7300 DV ICP-AES. The obtained adsorption–desorption isotherms were performed on a Micromeritics Tristar II 3020 M to evaluate the BET-specific surface area.
7
Comprehensive Photocatalyst Characterization
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The morphology and structure of the as-prepared photocatalysts were characterized by SEM (Hitachi S-4800) and TEM (JEM-2011, Hitachi Co.) with an FEI Tecnai G20. The crystal phase structures were characterized by XRD (X’Pert PRO SUPER, Philips Co.) with Cu Kα radiation at 40 kV and 40 mA. UV−vis DRS was performed by a spectrometer (Lambda 650S, PerkinElmer Co.) in the range of 250 to 800 nm, and BaSO4 was used as a reference material before measurements. The PL spectra were obtained by a fluorescence spectrometer with an excitation wavelength of 350 nm (JY Fluorolog-3-Tou, Jobin Yvon Co.). The specified surface areas were measured through a BET method with a Builder 4200 instrument (Tristar II 3020 M, Micromeritics Co.). The surface atomic compositions were analyzed by XPS using an ESCALAB 250 spectrometer (Thermo Fisher Inc.). The surface properties of the photocatalysts were determined by FTIR (Vertex 70, Bruker Co.) using the KBr pellet technique. ESR measurements were performed on an ESR spectrometer (ER200-SRC, Bruker Co.). The C L-edge and N L-edge XANES spectra were recorded on the BL12B beamline at the National Synchrotron Radiation Laboratory in Hefei, China.
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