where h is the imaged object height and a is its half-corrected width (20 (link)).
Multimode scanning probe microscope
The Multimode Scanning Probe Microscope is a highly versatile instrument designed for high-resolution imaging and analysis of surface topography. It utilizes a probe to scan the surface of a sample, generating detailed three-dimensional representations of the sample's surface features. The instrument is capable of operating in various scanning modes, enabling users to capture a wide range of data and surface information.
Lab products found in correlation
6 protocols using multimode scanning probe microscope
Tapping Mode AFM Imaging of Nanoscale Samples
where h is the imaged object height and a is its half-corrected width (20 (link)).
Characterization of Protein Aggregates by AFM and DLS
AFM. The βLGa samples were imaged on mica surfaces by a MultiMode Scanning Probe Microscope (Digital Instruments, New York, NY, USA) with a TESP tip in tapping mode. To obtain better adhesion of protein aggregates to the mica surface, chemical surface modification with (3-aminopropyl) triethoxysilane was implemented, as described in Giurleo et al. [11 (link)].
DLS. Fluctuations of scattered light intensity were measured using a homodyne technique. Round borosilicate glass cuvettes (Kimble Glass, Düsseldorf, Germany) were used for all DLS measurements. For the DLS study (details in
Atomic Force Microscopy of Amyloid Aggregation
Comprehensive Multi-Technique Characterization of Composite Materials
Imaging Alpha-Synuclein Fibrils by AFM
Characterizing Cellulose Nanofibers via AFM
were imaged on a MultiMode scanning probe microscope (Digital Instruments,
Inc., USA) in the tapping mode using a cantilever with an 8 nm radius
spherical tip (spring constant of 40 N m–1 and a
resonance frequency of ca. 260 kHz). Typically, images of size in
the range 5 μm × 5 μm, 2.5 μm × 2.5 μm,
or lower were obtained. From 512 to 1024 lines were taken per images.
Images were sampled at 1024–1536 points per lines that were
used in most cases to extract width and height features. The resolution
for CNFs’ width evaluation was evaluated to be 1.5–2.5
nm based on a half pixel contrast criterion with pixel shortest dimension
ranging from 3 to 5 nm. Five hundred CNFs were randomly selected to
individually obtain the width and height distributions. In order to
analyze the relationship between width and height, we selected 200
CNFs in a broad range of sizes.
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