Titan3 g2

The crystallographic phase and microstructures of ceramics were characterized using X‐ray diffraction (XRD, PANalytical Empyrean) and scanning electron microscopy (FESEM, Apreo) in combination with electron backscatter diffraction (EBSD). The degree of pseudo‐cubic [001] texture was determined from the XRD pattern in 2θ range of 20–60° by Lotgering factor method.^[41] The local microstructure of Eu³⁺ doped PMN‐PT and interface between textured grain and BT template were observed by FEI Titan³ G2 double aberration‐corrected microscope at 300 kV. The STEM images were collected by using a high‐angle annular dark field (HAADF) detector which had a collection angle of 52–253 mrad. EDS elemental maps of the sample were collected by using a SuperX EDS system under STEM mode. The TEM sample was prepared by focused ion beam (FIB, FEI Helios 660) lift‐out technique. The atomic positions in the HRTEM images were determined by using two‐dimensional Gaussian fitting by Atomap software.^[42]

10 mL of a 1 mg mL⁻¹ solution of WS_1.8Se_0.2 or MoS_1.4Se_0.6 powder in 50% ethanol was ultrasonicated with a QSonica Q700 sonicator for 1–2 hours while chilled in an ice/water bath. The resulting suspension was subsequently centrifuged at 6000 rpm for 30 minutes. The supernatant was drop-cast onto a lacy carbon-supported TEM grid. Scanning transmission electron microscopy (STEM) was performed at 80 kV using a FEI Titan³ G2 double aberration-corrected microscope. Energy-dispersive X-ray spectroscopic elemental maps of selected monolayers and few-layer regions were also obtained to observe the atomic distribution of tungsten, sulfur, and selenium within the material. The maps were collected by using the superX EDS system on the FEI Titan,^{3 (link)} which has four detectors surrounding the sample.

TEM was performed on twinned Cu structures and merging hBN domains. The twinned Cu was cleaned by electrochemical polishing, followed by conventional ion milling using a Gatan Model 691PIPS. HR-TEM images and the corresponding SAED patterns were obtained on an aberration-corrected TEM (FEI Titan3 G2) with an acceleration voltage of 300 kV. A double-tilt analytical holder was used. In the twin structure measurement, rotation angles α and β were 20.56° and −7.75°, respectively. After α and β rotations, the twin boundary was perpendicular to the sample holder, making the twin structure easier to observe.