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Model jsm7100f

Manufactured by JEOL
Sourced in Japan

The JEOL Model-JSM7100F is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of samples. It features a field-emission electron gun, providing high-brightness electron beam for improved resolution and signal-to-noise ratio. The instrument is capable of magnifications up to 1,000,000x and supports various imaging modes, including secondary electron, backscattered electron, and energy-dispersive X-ray spectroscopy (EDS) analysis.

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4 protocols using model jsm7100f

1

Comprehensive Characterization of Adsorbent Materials

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The materials were analyzed using FTIR spectroscopy on a PerkinElmer instrument between 4000 and 600 cm−1 for all conceivable active functional groups. Morphological characterization was carried out utilizing Scanning Electron Microscopy (SEM) with a JEOL Model-JSM7100F equipment to analyze the surface morphology. Powder X-ray diffraction (RIGAKU) was used to determine the crystallinity of the as-prepared adsorbent using Cu–K1 radiation (l.14, 1.54) at a scan rate of 3 min−1 and a 2θ-theta range of 5–80°. In Brunauer–Emmett–Teller (BET) studies, the specific surface area of the powder is determined by the physical adsorption of a gas on the solid's surface and measuring the quantity of adsorbate gas corresponding to a monomolecular layer on the surface. Using a Zetasizer Nano ZS light scattering device (Malvern Instruments, UK) and a He–Ne laser (633 nm, 4 mW) at 298.15 K, the zeta potential of dispersed aqueous solutions (1 mg L−1) of the materials was determined. The contact angle of the powder-based membrane was measured using a sessile drop contact angle analyzer (Duravision Systems-India). A UV-visible absorption spectrophotometer, the Shimadzu UV-Vis Spectrophotometer, UV-2600, was used to determine the dye concentrations in feed and filtrate solutions.
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2

Comprehensive Material Characterization via Advanced Microscopy and Spectroscopy

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Field emission scanning electron microscopy (FE-SEM, Model JSM-7100 F, JEOL, Tokyo, Japan) was used to evaluate the surface morphologies of all samples. Cs-corrected transmission electron microscopy (Cs correct TEM, Model JEM ARM 200F, JEOL, Tokyo, Japan) at an accelerating voltage of 80–200 kV was used to examine the lattice structures and exfoliation status of all samples. This unit included an EM unit, a high-angle annular dark-field detector, an FLC unit, an ultra-scan charge-coupled detector (CCD) camera unit, and an energy-dispersive spectrometry (EDS) unit. X-ray diffraction (XRD, D/Max Ultima III Rigaku Corporation, Tokyo, Japan) was used to determine the crystallinity of the material. UV-Vis absorption spectroscopy was used to monitor the catalytic decomposition of Cr(VI) (UV-3600 Plus UV-Vis-NIR Spectrophotometer, SHIMADZU, Kyoto, Japan). In addition, UV-Vis absorption techniques were used to assess photocatalytic stability and catalyst capacity. A laser with a 532 nm wavelength was linearly polarized from the confocal Raman spectroscopy measurements (NTEGRA Spectra, NT-MDT Co., Zelenograd, Russia). The objective lens used in all experiments had 0.7 NA and a magnification of 100× (Mitutoyo, Japan). A CCD (Andor, Abingdon-on-Thames, UK) cooled to 75 °C and a spectrometer with a grating of 1800 grooves/mm blazed at 500 nm were used to obtain Raman scattering signals.
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3

Characterization of Electrospun Fiber Morphology

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The morphology and microstructure of the electrospun fibers were examined by scanning electron microscope (Model JSM- 7100F, Jeol Ltd., Tokyo, JPN). Samples were previously fixed 2.5% (v/v) glutaraldehyde in 0.1 M sodium cacodylate buffer pH 7.2, dehydrated in increasing concentrations of ethanol, dehydrated to a critical point with hexamethyldisilazane (Polysciences, Inc., Warrington, PA, USA) and coated with gold particles under vacuum in an ion sputtering device (JFC 1100, Jeol Ltd., Tokyo, JPN). The Image-J software (Java 8, NIH, Rockville Pike, MD, USA) was used to analyze the captured images. The average diameter of the fibers and pore size were calculated after measuring at least 100 fibers, and the data obtained were subjected to statistical analysis using the GraphPad Prism software version 8 (GraphPad Software, San Diego, CA, USA).
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4

Electrochemical Characterization of Fe3O4-D-Val

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All electrochemical measurements were performed by EG&G potentiostat/galvanostat (Model 263A) in a standard three-electrode system, saturated calomel electrode (SCE) as a reference electrode, GC as a working electrode, and Pt wire as a counter electrode. The synthesized Fe3O4–D–Val was analyzed by using an infrared spectrum recorded using FTIR (Bruker, ALPHA, Billerica, MA, USA). The XRD (Rigaku X-ray diffraction Ultima-IV) was performed to study the crystal structure of synthesized material. FE-SEM (JEOL model-JSM7100F) was carried out for the morphology of Fe3O4–D–Val.
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