Model jsm7100f
The JEOL Model-JSM7100F is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of samples. It features a field-emission electron gun, providing high-brightness electron beam for improved resolution and signal-to-noise ratio. The instrument is capable of magnifications up to 1,000,000x and supports various imaging modes, including secondary electron, backscattered electron, and energy-dispersive X-ray spectroscopy (EDS) analysis.
4 protocols using model jsm7100f
Comprehensive Characterization of Adsorbent Materials
Comprehensive Material Characterization via Advanced Microscopy and Spectroscopy
Characterization of Electrospun Fiber Morphology
Electrochemical Characterization of Fe3O4-D-Val
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