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Spectrum 65 ft ir spectrophotometer

Manufactured by PerkinElmer
Sourced in United States

The Spectrum 65 FT-IR spectrophotometer is a high-performance Fourier Transform Infrared (FT-IR) instrument designed for analytical applications. It provides accurate and reliable infrared spectroscopic data for a wide range of samples and materials.

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4 protocols using spectrum 65 ft ir spectrophotometer

1

Comprehensive Characterization of Nanomaterials

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SEM and TEM images were recorded using an
EVO-18 microscope (ZEISS, Oberkochen, Germany) and an FEI Tecnai-G2
F30 microscope (FEI Co., Hillsboro, OR) spectrometer, respectively.
XPS spectra were obtained using a K-α spectrometer (Thermo Fisher
Scientific Co., Waltham, MA). The FTIR spectra were collected with
a Spectrum 65 FTIR spectrophotometer (PerkinElmer Co., Ltd., Waltham,
MA). The UV–vis absorption spectra were obtained using a Shimadzu
UV-6100 UV–vis-NIR spectrophotometer (Shanghai Mapada Instruments
Co., Ltd., Shanghai, China). Red excitation light was provided by
a PEAC 200A system (Ada Hengsheng Technology Development Co., Ltd.,
Tianjin, China). The distance between the illumination source and
the sample cell was maintained at 10 cm. PEC measurements were performed
using an electrochemical workstation (CHI760e, Chenhua Instrument
Co., Ltd., Shanghai, China). ITO slices (≤6 Ω, South
China Xiangcheng Technology Co., Ltd., Shenzhen, China) with an active
surface area of 0.25 cm2 were used as the working electrode
vs Ag/AgCl as the reference electrode.
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2

ATR FT-IR Spectroscopy of Protein Samples

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ATR FT-IR spectra were measured as previously described on a Perkin-Elmer Spectrum 65 FT-IR spectrophotometer (Waltham, MA, USA) equipped with the universal ATR sampling accessory (Diamond/ZnSE crystal). Samples of HdeB prepared under various conditions in their respective buffers were lyophilized for approximately 48 h to remove water. Measured samples were first placed directly onto the instrument, followed by application of 2 µL 99.9% deuterium oxide (D2O, Cambridge Isotope Laboratories, Tewksbury, MA, USA). Samples were measured after a 5 min incubation. Second derivative spectra were obtained by using the software package (Spectrum ver.10.03.09) provided with the instrument (Waltham, MA, USA).
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3

FT-IR Analysis of EPS HE29

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A Perkin Elmer Spectrum 65 FT-IR spectrophotometer was used for the FT-IR analysis. FT-IR spectra of EPS HE29 were scanned in the area of the 4000–400 cm−1 region at transmission mode, and 4 cm−1 of spectral resolution was applied during the scanning process [29 (link)].
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4

Infrared Analysis of Freeze-Dried Samples

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Infra-red analyses About 0.1 mg of the purified and freeze-dried samples were added to 1 mg of potassium bromide and crushed until obtaining a homogeneous mixture. Next, pellets were prepared applying a force of 15 tons using a hydraulic press, which were then submitted to infrared analyses. Infrared spectra were recorded employing a Perkin Elmer Spectrum 65 FT-IR spectrophotometer between 400 and 4000 cm -1 . Measurements were performed under a 4 cm -1 scanning resolution and normal environmental conditions (Chopin & Whalen 1993) .
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