Ntegra spectra
NTEGRA Spectra is a multi-functional scanning probe microscope (SPM) system designed for advanced materials characterization. The instrument combines atomic force microscopy (AFM), near-field scanning optical microscopy (NSOM), and Raman spectroscopy in a single platform, enabling comprehensive analysis of sample topography, optical properties, and molecular composition.
Lab products found in correlation
46 protocols using ntegra spectra
Duodenoscope Surface Analysis with AFM
Characterization of Nanomedicine Microcapsules
Atomic Force Microscopy (AFM) images were taken by using a NT-MDT Ntegra Spectra instrument operating in the tapping mode with NSG-10 tips from NT-MDT (Russia). TEM imaging was performed using a Zeiss EM 912 Omega (Zeiss, Germany) transmission electron microscope.
The thickness of the microcapsule shell is a half of double the shell thickness. The double shell thickness was measured by AFM method using the flat regions of the microcapsule shell profile by approach described in ref 47 .
MRI was performed using a Philips Achieva 1.5T high field MRI scanner equipped with a phased array coil. T2-and T1-weighted quick "spin-echo" protocols (turbospinecho, TSE) were applied. Measurements were carried out with following parameters: the repetition time (TR) is 450 ms and the echo time (TE) is 15 ms for T1-weighted pulse sequence; the TR is 3000 ms, the TE is 47.7 ms for T2-weighted pulse sequence.
Decreasing of T1 relaxation time leads to increasing of MR signal in T1-weighted images. At the same time decreasing of T2 relaxation time falls to MR signal in T2-weighted images. 48
Microscopic Analysis of Nanomaterials
Raman Spectroscopy and Imaging of Samples
Comprehensive Material Characterization Protocol
Duodenoscope Surface Biofilm Imaging
Fabrication of WSe2/MoS2 Heterojunction
Raman Spectra of Si Nanodisks
Duodenoscope Polymer Structural Changes
The images collected from the surface of duodenoscope samples and controls were recorded in air, in tapping mode, using NTEGRA Spectra (NT-MDT, Moscow, Russia) instrument with 3.1–37.6 N/m force constant cantilever of a silicon nitride cantilever (NSC10; NT-MDT). The roughness average values for the controls and PAW-treated samples were determined from three AFM images (scanned surface 10 × 10 μm) using free data analysis software Gwyddion (version 2.20,
The surface morphology of the controls and treated samples was investigated using a scanning electron microscope (Quanta200; FEI Company, Hillsboro, OR, USA) at 20 kV with low-vacuum secondary electron (LFD) detector. In order to obtain the elemental information, EDX analysis using a silicon drift detector was performed on both controls and samples.
Characterization of Pristine and Modified CNTs
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