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46 protocols using ntegra spectra

1

Duodenoscope Surface Analysis with AFM

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The samples collected from surface of the duodenoscope and the samples exposed to the hydrogel and microbial strains were analysed using an NTEGRA Spectra (NT-MDT, Zelenograd, Russia) instrument with the 3.1–37.6 N/m force constant cantilever of a silicon nitride cantilever (NSC10; NT-MDT, Russia) in tapping mode.
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2

Characterization of Nanomedicine Microcapsules

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The measurements of ζ -potential and size distribution of nanoparticles were performed using a Zetasizer Nano ZS instrument (Malvern Instruments Ltd., UK).
Atomic Force Microscopy (AFM) images were taken by using a NT-MDT Ntegra Spectra instrument operating in the tapping mode with NSG-10 tips from NT-MDT (Russia). TEM imaging was performed using a Zeiss EM 912 Omega (Zeiss, Germany) transmission electron microscope.
The thickness of the microcapsule shell is a half of double the shell thickness. The double shell thickness was measured by AFM method using the flat regions of the microcapsule shell profile by approach described in ref 47 .
MRI was performed using a Philips Achieva 1.5T high field MRI scanner equipped with a phased array coil. T2-and T1-weighted quick "spin-echo" protocols (turbospinecho, TSE) were applied. Measurements were carried out with following parameters: the repetition time (TR) is 450 ms and the echo time (TE) is 15 ms for T1-weighted pulse sequence; the TR is 3000 ms, the TE is 47.7 ms for T2-weighted pulse sequence.
Decreasing of T1 relaxation time leads to increasing of MR signal in T1-weighted images. At the same time decreasing of T2 relaxation time falls to MR signal in T2-weighted images. 48
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Microscopic Analysis of Nanomaterials

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A Hitachi SU6600 scanning electron microscope (SEM) equipped with a field emission gun (FEG) and transmission electron microscope JEOL JEM 2100 operating at 200 kV (TEM) were used for morphology investigation. High-resolution TEM images including STEM-HAADF (high-angle annular dark-field imaging) analyses for elemental mapping of the products were performed with an FEI Titan HRTEM (high-resolution TEM) microscope operating at 200 kV. For these analyses, a droplet of the dispersion of the material in DMF at a concentration of ∼0.1 mg mL -1 was deposited onto a carbon-coated copper grid and dried. AFM images were obtained using the NTegra Spectra instrument (NT-MDT, Russia) in the tapping mode using NSG30 probes. In total, 5 µL of the ethanolic dispersion (c = 1 mg L -1 ) of the analyzed nanomaterial was deposited on a SiO 2 wafer and left to dry for 30 minutes. The sample was measured immediately after that.
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4

Raman Spectroscopy and Imaging of Samples

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The Raman spectrum and image were measured by NTEGRA Spectra (NT-MDT) equipped with a liquid nitrogen–cooled CCD (charge-coupled device) detector and an inverted optical microscope (Olympus IX71). The xyz scanning range was 50 μm, 50 μm, and 6 mm3, and the resolution of the spectrometer in the xy plane was 200 to 500 nm along the z axis. The signals were obtained by a near-infrared laser that emitted light at a 785-nm wavelength, with an irradiation laser power of 3 mW on the sample plane controlled by a neutral density filter. Spots (32 × 32) per 50 × 50–μm2 scan area were exposed for 1 s for each spot, and the signal between 400 and 1600 cm−1 was measured as the Raman spectrum and imaging. A blank spectrum was acquired before each step, which allowed the absorbance to be subsequently measured.
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5

Comprehensive Material Characterization Protocol

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Scanning electron microscopic (SEM) images were acquired using a Lyra3 GMU FIB SEM (Tescan, Brno, Czech Republic). The Mel and as-prepared PPG were fixed on aluminum stubs with double-sided carbon adhesive tape followed by gold/palladium coating.
Fourier transform infrared (FT-IR) spectra were recorded with attenuated total reflection (ATR) using a Nicolet iS10 FTIR Spectrometer (Thermo Fisher Scientific, Waltham, MA, USA). Spectra were recorded in a wavenumber range of 400–4000 cm−1 with a resolution of 4 cm−1 and 30 scans.
UV-vis absorption spectra were recorded using a SHIMADZU UV-1800 UV spectrophotometer. Spectra were recorded in the wavelength range of 340–900 nm.
Raman spectra were recorded using an AFM-Raman microscope (NTEGRA Spectra, NT-MDT Spectrum Instruments, Moscow, Russia) with a 10 × objective and a 500 nm wavelength laser over a Raman shift range of 200–2000 cm−1. Data from ten separate scans using 1 mW of laser power and 1 min exposure time were averaged to maximizing the signal-to-noise ratio.
X-ray photoelectron spectroscopy was performed using a Kratos Axis Supra XPS. Survey and high-resolution spectra of 1s orbitals of oxygen (O) were obtained using an Al source. The XPS analysis was conducted using the Casa XPS software.
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6

Duodenoscope Surface Biofilm Imaging

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Images from the study samples collected from the surface of the duodenoscope were recorded in air, in tapping mode using a NTEGRA Spectra (NT-MDT, Zelenograd, Russia) instrument with a 3.1–37.6 N/m force constant cantilever of silicon nitride cantilevers (NSC10, NT-MDT, Russia). To record the biofilms, the measurements were performed in a similar fashion.
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7

Fabrication of WSe2/MoS2 Heterojunction

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Monolayer WSe2 and MoS2 were firstly synthesized on respective sapphire and SiO2/Si substrate using chemical vapor deposition. The WSe2 and MoS2 sheets were then transferred to the PEC Au cathode on a silicon substrate to form the heterojunction. Specifically, polystyrene (PS) was first spin-coated onto the sapphire substrate and the substrate was then immersed in deionized water. The PS film with the WSe2 sheet was peeled off from the substrate due to its hydrophobicity and then pasted on a bulk polydimethylsiloxane (PDMS). Using a microscope platform, the WSe2 sheet on PDMS could be located and shifted to the top of the target Au electrode. WSe2 with the PS layer was heated for exfoliation from PDMS and transferred to the Au electrode. Finally, the PS was removed using methylbenzene, leaving the exfoliated WSe2 sheet on the target electrode. The material characteristics were confirmed from the Raman and photoluminescence (PL) spectra (RENISHAW, 532 nm laser, 70 μW incident power) and atomic force microscopy (AFM) (NT-MDT NTEGRA Spectra). The light absorption spectra of monolayer MoS2, WSe2 and MoS2/WSe2 heterojunction were measured by HITACHI U-4100 spectrophotometer.
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8

Raman Spectra of Si Nanodisks

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Raman spectra were taken under a microspectroscopic system based on an inverted optical microscope (NTEGRA Spectra, NT-MDT)56 (link). Briefly, Si nanodisks were excited using linearly polarized 532-nm laser beams using an oil immersion objective (1.4 NA, ×60, Olympus). The resulting Raman signal with both Stokes and anti-Stokes lines was collected using the same objective, passed through a notch filter, and focused into the spectrometer with a cooled CCD (iDdus, Andor). Raman spectra were recorded with an acquisition time of 1 s.
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9

Duodenoscope Polymer Structural Changes

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To assess the impact of repeated PAW treatment on duodenoscope polymer structure, a challenge test was performed. The samples were immersed in PAW for 30 minutes daily, for a 45-day period. The controls were treated similarly, but distilled water was used instead of PAW. All the samples (treated with PAW and untreated) were analyzed by scanning electron microscopy (SEM), atomic force microscopy (AFM), and energy-dispersive X-ray spectroscopy (EDX).
The images collected from the surface of duodenoscope samples and controls were recorded in air, in tapping mode, using NTEGRA Spectra (NT-MDT, Moscow, Russia) instrument with 3.1–37.6 N/m force constant cantilever of a silicon nitride cantilever (NSC10; NT-MDT). The roughness average values for the controls and PAW-treated samples were determined from three AFM images (scanned surface 10 × 10 μm) using free data analysis software Gwyddion (version 2.20, http://gwyddion.net/).
The surface morphology of the controls and treated samples was investigated using a scanning electron microscope (Quanta200; FEI Company, Hillsboro, OR, USA) at 20 kV with low-vacuum secondary electron (LFD) detector. In order to obtain the elemental information, EDX analysis using a silicon drift detector was performed on both controls and samples.
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10

Characterization of Pristine and Modified CNTs

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The surface morphology of all the pristine and modified CNTs was characterized by using a field emission scanning electron microscopy system (FESEM, JEOL JSM-7500F, Tokyo, Japan). The quality of the CNTs was evaluated by Raman spectroscopy (NT-MDT NTEGRA Spectra, Moscow, Russia). For the analysis, a 473 nm air-cooled laser was focused on a diffraction limited resolution of 250 nm and the samples were run for an acquisition time of 5 min.
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