of crystalline materials was investigated using the XRD technique
(Panalytical). SEM (JEOL JSM-IT800) was used to characterize the morphology
and microstructure change of materials. The WDS analyses of the samples
were performed to investigate element composition using a JEOL JSM-IT300
scanning electron microscope with an automatic Oxford Instruments
Wave detector system using a PET crystal (Si, Sn, Ti) and LSM60 crystal
(O). STEM measurements were taken with a JEOL JSM-IT800 scanning electron
microscope equipped with an EDS detector to observe the distribution.
A transmission electron microscope for obtaining SAED, and a high-resolution
view (TEM–SAED and HR-TEM, JEOL JEM-2010) was used to study
the morphology and phase formation of as-prepared nanocomposite materials.