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Spectrum two ft ir spectrometer

Manufactured by PerkinElmer
Sourced in United States, United Kingdom, Germany, Singapore

The Spectrum Two FT-IR spectrometer is a compact and versatile infrared spectroscopy instrument designed for analytical laboratories. It provides accurate and reliable measurement of the infrared absorption spectrum of solid, liquid, and gaseous samples. The spectrometer operates on the Fourier Transform Infrared (FT-IR) principle to generate high-quality infrared data for identification, characterization, and quantification of various materials and compounds.

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234 protocols using spectrum two ft ir spectrometer

1

Characterization of Composite Nanofibers

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The crystallinity
of the composite and carbonized nanofibers was investigated through
a powder X-ray diffractometer (Rigaku Miniflex II X-ray diffractometer,
Ni-filtered Cu Kα radiation, λ = 1.5406 Å). For morphological
and roughness studies of the synthesized nanofibers, the sample was
prepared in the powder form. Subsequently, the samples were coated
with a platinum thin layer via a sputtering technique to make the
surface conductive and to avoid any possible charging effect while
performing SEM analysis. The coated samples were then loaded into
the SEM measurement chamber under high vacuum and were examined at
a high voltage of about 3–10 kV. The morphology was examined
using a scanning electron microscope (JSM-5910 JEOL Japan). IR transmission
spectra were collected in the range of 400–4000 cm–1 using a PerkinElmer Spectrum Two FTIR spectrometer, equipped with
a universal attenuated total reflection accessory. An EDX electron
spectrometer (INCA 200, Oxford Instruments, UK) was used for elemental
analysis and their compositions.
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2

Fourier Transform Infrared Spectroscopy of Starch

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The chemical structure of TBS and OS-TBS was analyzed qualitatively using a Spectrum Two FT-IR spectrometer (PerkinElmer, Boston, MA, USA). Samples were prepared by grinding the finely powdered starch with KBr (1:100, w/w) and spectra were obtained from 400 to 4000 cm−1 at a resolution of 4 cm−1 [33 (link)].
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3

Comprehensive Characterization of CDHA Nanocarriers

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The nanocarriers were characterized for phase purity and structural analysis by X-ray powder diffraction method (XRD, Bruker D8 DISCOVER, USA) using Cu Kα radiation (λ = 1.54 Å). The diffraction patterns were recorded with step size of 0.1°/step and at a scanning rate of 1 step/s. The functional groups present in pure CDHA and ion substituted CDHA nanocarriers were analyzed in the spectral range of 4000–510 cm−1 by Fourier transform infrared spectroscopy (Spectrum Two FT-IR spectrometer, Perkin-Elmer, USA) in the attenuated internal reflection (ATR) mode. Transmission electron microscopy was used to identify the morphology of the CDHA samples. The samples were dispersed in acetone and sonicated for 15 min using an ultrasonic bath (Citizen, India) at frequency of 45 kHz. The dispersions were dropped on carbon-coated copper grids, dried, and examined with a transmission electron microscope (Philips CM20 TEM, Netherlands) operated at 120 kV. The particle size analysis and zeta potential measurements of the pure and ion substituted CDHAs were carried out by dynamic light scattering (DLS) technique (Malvern Zetasizer Nano ZS-90, UK). One milligram of the samples were dispersed in 10 ml distilled water and sonicated for 15 min. One milliliter of the supernatant was then removed and used for DLS measurements.
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4

FTIR Analysis of Washed AgNPs

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The AgNPs were analysed by FTIR spectroscopy (Spectrum Two FTIR spectrometer, PerkinElmer, Uberlingen, Germany) after being washed. The samples were dried just before analysis until no water peaks were detectable. 32 scans were run for each sample between 500 and 4000 cm−1, with a resolution of 4 cm−1. The ATR (attenuated total reflectance) technique was used in all the measurements. The spectra were normalised for better comparison between samples.
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5

Comprehensive Analysis of Electrolyte and Cathode

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A scanning electron microscope (Hitachi S-4800) equipped with an EDS detector (Oxford Instruments X-Max 80) was used to examine the microstructure and elemental mapping of the MgCl2-PEO electrolyte. Raman spectroscopy (Micro-Raman inVia, Renishaw) was used to characterize the composition of MgCl2-WIS and MgCl2-PEO with a 632.8-nm laser. FTIR was performed using the PerkinElmer Spectrum Two FT-IR Spectrometer. The 1H NMR spectra were acquired on a Bruker Avance III 600-MHz NMR spectrometer using deuterium oxide as the field frequency lock. The ionic conductivities of the electrolytes were measured using a conductivity bench meter (FiveEasy FE30). A high-resolution transmission electron microscope (FEI Tecnai G2) equipped with an EDS detector (Oxford Instruments X-Max 80T) was used to chemically probe the CuHCF cathode for elemental mapping.
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6

FTIR Spectroscopy of Microsamples

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The FTIR spectra were obtained using a Spectrum Two FT-IR spectrometer equipped with a Universal ATR with a diamond crystal (PerkinElmer, Waltham, MA, USA). The data were collected over the 4000–500 cm−1 spectral range. Typically, a few microliters were used on the diamond, and the measurements were repeated three times for each sample.
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7

Spectroscopic Characterization of Compounds

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The specific optical rotation of compounds ([α]) was measured using an Optical Activity Limited AA65 Automatic Polarimeter, analytical version (589 nm), with a path length of 1.0 dm, with concentrations (c) quoted in g 100 ml-1. IR spectra were collected using UATR Two, PerkinElmer Spectrum Two FT-IR spectrometer over the range 4000–400 cm-1. Low resolution ESI mass spectrometry (LRMS) was performed using a Bruker amaZon SL ion trap mass spectrometer. High resolution ESI mass spectra (HRMS) were collected on a Bruker FTICR mass spectrometer. 1H and 13C NMR spectra were obtained at 300 K on a Bruker 400 MHz or 500 MHz spectrometer.
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8

Inert Atmosphere Synthesis and Characterization

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All manipulations were performed under an inert atmosphere of argon by using Schlenk techniques or in an MBraun inert-gas glovebox. The solvents were purified according to standard procedures. The deuterated solvents were purchased from Aldrich and dried over 4 Å molecular sieves. 1H, 13C{1H}, and 31P{1H} NMR spectra were recorded on a Bruker AVANCE-400 spectrometer. 1H and 13C{1H} NMR spectra were referenced internally to residual protio-solvent and solvent resonances, respectively, and are reported relative to tetramethylsilane (δ = 0 ppm). The ligand S(C-Br)SCH2-Et was prepared according to the literature [17 (link)]. Infrared spectra were recorded in attenuated total reflection (ATR) mode on a PerkinElmer Spectrum Two FT-IR spectrometer. High resolution accurate mass spectra were recorded on an Agilent 6545 QTOF equipped with a dual electrospray ionization source (Agilent Technologies, Santa Clara, CA, USA). The mass calibration was performed with a commercial mixture of perfluorinated trialkyl-triazines. Elemental analysis was performed on an elementar vario MACRO (Elementar Analysensysteme GmbH, Germany) CHNS analyzer.
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9

FTIR Analysis of P18 and SLN

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The FTIR study for P18 and the main ingredients of SLN was performed by an FTIR-ATR spectrometer (Spectrum Two FT-IR Spectrometer, PerkinElmer, Norwalk, CT, USA) equipped with a ZnSe crystal at the wavenumber range of 4000–800 cm−1.
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10

Chemical Characterization of Coated Samples

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Coated samples that had been subjected to 5 sanitization cycles with each of the two solutions, as well as non-sanitized samples, were also analyzed by FTIR-ATR to ascertain if the chemical characteristics of the coating AP10 + AA6 were affected by the use of an acidic (peracetic acid) or alkaline (sodium hypochlorite) solutions. FTIR-ATR spectra with 4 cm−1 resolution were acquired in 32 scans by a Spectrum Two FT-IR spectrometer (PerkinElmer Inc., Waltham, MA, USA). Baseline correction of the FTIR-ATR spectra was performed with the software Spectrum 10.4.3.339 (PerkinElmer Inc., Waltham, MA, USA).
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