of the composite and carbonized nanofibers was investigated through
a powder X-ray diffractometer (Rigaku Miniflex II X-ray diffractometer,
Ni-filtered Cu Kα radiation, λ = 1.5406 Å). For morphological
and roughness studies of the synthesized nanofibers, the sample was
prepared in the powder form. Subsequently, the samples were coated
with a platinum thin layer via a sputtering technique to make the
surface conductive and to avoid any possible charging effect while
performing SEM analysis. The coated samples were then loaded into
the SEM measurement chamber under high vacuum and were examined at
a high voltage of about 3–10 kV. The morphology was examined
using a scanning electron microscope (JSM-5910 JEOL Japan). IR transmission
spectra were collected in the range of 400–4000 cm–1 using a PerkinElmer Spectrum Two FTIR spectrometer, equipped with
a universal attenuated total reflection accessory. An EDX electron
spectrometer (INCA 200, Oxford Instruments, UK) was used for elemental
analysis and their compositions.