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Jobin yvon fluorolog3 spectrometer

Manufactured by Horiba

The Jobin Yvon FluoroLog3 spectrometer is a high-performance fluorescence spectroscopy instrument designed for accurate and sensitive measurements. It features a monochromator-based optical system that allows for the analysis of fluorescence emission and excitation spectra. The FluoroLog3 is capable of measuring fluorescence intensity, lifetime, and polarization data.

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5 protocols using jobin yvon fluorolog3 spectrometer

1

Multimodal Characterization of Nanomaterials

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Transmission electron microscopy (TEM) images were taken with a JEM-2100F transmission electron microscope (JEOL) operating at 200 kV. Energy dispersive X-ray (EDX) mapping images were obtained on a JEM-2100F equipped with an energy dispersive X-ray analyzer. Inductively coupled plasma optical emission spectrometry (ICP-OES) were performed on a Thermo Scientific ICAP 6300 Duo View Spectrometer. Dynamic light scattering (DLS) and zeta potential measurements were performed on a Malvern Zetasizer Nano ZS90. X-ray diffraction (XRD) patterns were recorded on a Philips XPert PRO MPD X-ray diffractometer operated at 35 kV and 45 mA with Cu-Kα radiation. The upconversion luminescent properties were studied using a Horiba Jobin Yvon FluoroLog3 spectrometer equipped with a 980 nm diode laser as excitation. The downconversion luminescent properties were studied using an Acton SP2300i spectrometer equipped with an InGaAs linear array detector (Princetion OMA-V) and using a 980 nm diode laser as excitation. NIR fluorescence images of the downconversion emission were obtained using 2D InGaAs array (Ninox 640, Raptor Photonics) with 640 × 512 pixel using a 980 nm diode laser as excitation. Raman spectra were obtained with polarized incident laser light (λ = 532 nm) on Jobin Yvon T64000.
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2

Absolute Photoluminescence Quantum Yield

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Steady-state emission and QY PL measurements were recorded by a Horiba Jobin Yvon Fluorolog-3 spectrometer equipped with a PMT detector. All PL spectra were collected at an excitation wavelength of 370 nm. Absolute QY measurements were performed in a Spectralon-coated integrating sphere. For each sample, four measurements were performed: (i) sample emission (Sem), (ii) blank glass emission (Bem), (iii) sample excitation (Sexc), and (iv) blank glass excitation (Bexc). The absolute QY was then calculated as follows QY=SemBemBexcSexc The reported QY values are the average of three measurements.
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3

Fluorescence Spectroscopy of Dispersed Samples

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Excitation and emission spectra were recorded by using a Horiba Jobin Yvon Fluorolog 3 spectrometer with a 450 W Xe lamp and a FL‐1073 photomultiplier tube detector. Emission and excitation wavelengths were monochromatized through Czerny–Turner double gratings (1200 grooves mm−1). An edge filter (400 nm) was used to block the first‐ and second‐harmonic oscillations of the light source. Excitation spectra were recorded from 250 to 580 nm and corrected for the spectral distribution of the lamp by using a photodiode reference detector. Emission spectra were recorded from 380 nm to 800 nm and corrected for the spherical response of the monochromator and the detector using correction spectra provided by the manufacturer. All samples were investigated as dispersions in spectroscopically pure quartz glass cuvettes in front face mode at room temperature.
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4

Photophysical Characterization of Pd3O3 in PMMA

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The photoluminescent spectra were measured on a Horiba Jobin Yvon FluoroLog-3 spectrometer. The absorption spectrum was measured on an Agilent 8453 UV-visible spectrometer. Doped thin films for photoluminescent quantum yield (PLQY) measurements were fabricated by the drop-cast process of Pd3O3 in a PMMA host. The PLQY measurements were carried out on a Hamamatsu absolute PL quantum yield spectrometer model C11347. It should be noted that the error bar may be large for the PLQY measurement with emissive materials which have long lifetimes (>100 μs) due to quenching by residual oxygen in the integration sphere. Cyclic voltammetry and differential pulsed voltammetry were performed on a CHI610B electrochemical analyzer in a solution of anhydrous DMF using 0.1 M tetra(nbutyl) ammonium hexafluorophosphate as the supporting electrolyte. A ferrocene/ferrocenium (Fc/Fc+) redox couple used as an internal reference. The HOMO and LUMO values were determined following literature reported fits relating the electrochemical potentials to the values determined via ultraviolet photoemission spectroscopy and inverse photoelectron spectroscopy, respectively.42 ,43 Mass spectra were recorded on JEOL GCmate gas chromatograph/mass spectrometer. Elemental analysis was carried out with a Perkin-Elmer 2400 CHN Elemental Analyzer.
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5

Multimodal Characterization of Nanomaterials

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Transmission electron microscopy (TEM) images were taken with a JEM-2100F transmission electron microscope (JEOL) operating at 200 kV. Energy dispersive X-ray (EDX) mapping images were obtained on a JEM-2100F equipped with an energy dispersive X-ray analyzer. Inductively coupled plasma optical emission spectrometry (ICP-OES) were performed on a Thermo Scientific ICAP 6300 Duo View Spectrometer. Dynamic light scattering (DLS) and zeta potential measurements were performed on a Malvern Zetasizer Nano ZS90. X-ray diffraction (XRD) patterns were recorded on a Philips XPert PRO MPD X-ray diffractometer operated at 35 kV and 45 mA with Cu-Kα radiation. The upconversion luminescent properties were studied using a Horiba Jobin Yvon FluoroLog3 spectrometer equipped with a 980 nm diode laser as excitation. The downconversion luminescent properties were studied using an Acton SP2300i spectrometer equipped with an InGaAs linear array detector (Princetion OMA-V) and using a 980 nm diode laser as excitation. NIR fluorescence images of the downconversion emission were obtained using 2D InGaAs array (Ninox 640, Raptor Photonics) with 640 × 512 pixel using a 980 nm diode laser as excitation. Raman spectra were obtained with polarized incident laser light (λ = 532 nm) on Jobin Yvon T64000.
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