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Spectrum two pe

Manufactured by PerkinElmer
Sourced in United States

The Spectrum Two PE is a Fourier transform infrared (FTIR) spectrometer designed for routine analysis in laboratories. It provides reliable and reproducible IR data for identification and characterization of a wide range of samples.

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8 protocols using spectrum two pe

1

Infrared and XPS Analysis of CH/BGP Hydrogels

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For the infrared spectroscopy CH and BGP raw powders and CH/BGP freeze-dried hydrogels (before and after water uptake) were analysed with a Spectrum Two PE instrument equipped with a horizontal attenuated total reflectance (ATR) crystal (ZnSe) (PerkinElmer Inc., US). Each spectrum was collected in absorbance mode as result of the average of 16 scans with 4 cm−1 resolution. Measurements were recorded in the wavelength range of 4000–550 cm−1.
Furthermore freeze dried hydrogels were examined by a scanning microprobe Kratos Axis Ultra-DLD XPS spectrometer (EPSRC service Cardiff, UK), equipped with a monochromatised AlKα X-ray radiation source. For each specimen, survey scans (Fixed Analyser Transmission mode, binding energy (BE) range 0–1200 eV, pass energy 117.4 eV) and high-resolution spectra were acquired of carbon (C1s), nitrogen (N1s), sodium (Na1s), oxygen (O1s), phosphorous (P2p). Atomic concentration (At.%) on the survey scan was performed using the built-in CasaXPS software package and in order to detect the BE representing the chemical binding states of the each elements within the films, the XPS spectra for the chemical elements detected from the films were subjected to peak deconvolution using the same software.
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2

ATR-FTIR Analysis of Dried Samples

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ATR-FTIR analysis was performed on a Spectrum Two PE instrument using the Universal ATR accessory (Single Reflection Diamond) (PerkinElmer Inc., Waltham, MA, USA) in a range of 4000 to 600 cm−1 (resolution 4 cm−1). Dried samples were analysed without any preliminary preparative step.
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3

Infrared Spectroscopy of Solid Samples

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The infrared spectra were obtained with a Spectrum Two PE instrument equipped with a horizontal attenuated total reflectance (ATR) crystal (ZnSe) (PerkinElmer Inc., US). The analyzed samples were placed directly on the ATR crystal, and the spectra were collected in absorbance mode and recorded in the wavelength range of 4000–550 cm−1. Each spectrum was the result of averaging 32 scans with a resolution of 4 cm−1.
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4

FT-IR/ATR and XPS Characterization

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FT-IR/ATR analyses were conducted using a Spectrum Two-PE instrument endowed with a universal ATR accessory (UATR, Single Reflection Diamond/ZnSe) supplied by PerkinElmer. For each of the relevant samples, FT-IR/ATR spectra were recorded from 400 to 4000 cm−1 with a 4 cm−1 resolution.
XPS analyses were performed using a scanning microprobe, PHI 5000 VersaProbe II, purchased from Physical Electronics (Chanhassen, MN, USA). The instrument was equipped with a micro-focused monochromatized AlKα X-ray radiation source. The samples were examined in HP mode with an X-ray take-off angle of 45° (instrument base pressure ~10−9 mbar). The size of the scanned area was approximately 1400 μm × 200 μm. Wide scans and high-resolution spectra were recorded in FAT mode for each sample, setting pass-energy values equal to 117.4 eV and 29.35 eV, respectively. To fit the high-resolution spectra, the commercial MultiPak software version 9.9.0.8 was used. Adventitious carbon C1s were set as the reference charge (284.8 eV).
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5

FT-IR/ATR and XPS Characterization

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FT-IR/ATR analyses using a Spectrum Two-PE instrument endowed with a universal ATR accessory (UATR, Single Reflection Diamond/ZnSe) supplied by PerkinElmer. For each of the relevant samples, FT-IR/ATR spectra were recorded from 400 to 4000 cm−1 with a 4 cm−1 resolution.
XPS analyses were performed using a scanning microprobe PHI 5000 VersaProbe II purchased from Physical Electronics (Chanhassen, MN). The instrument is equipped with a micro-focused monochromatized AlKα X-ray radiation source. The samples were examined in HP mode with an X-ray take-off angle of 45° (instrument base pressure ~10−9 mbar). The size of the scanned area was about 1400 × 200 μm. Wide scans and high-resolution spectra were recorded in FAT mode for each sample, setting pass-energy values equal to 117.4 eV and 29.35 eV, respectively. In order to fit the high-resolution spectra, the commercial MultiPak software version 9.9.0.8 was used. Adventitious carbon C1s were set as the reference charge (284.8 eV).
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6

Characterization of Plastic Polymers by FTIR-ATR

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The characterization of plastic polymers was performed using FTIR-ATR. The FTIR spectra of the samples were obtained with Spectrum Two PE instrument (PerkinElmer) equipped with the universal attenuated total reflectance accessory (ATR) (UATR, Single Reflection Diamond/ZnSe) accessory, and spectra were acquired in the range 400 to 4000 cm-1. The measurement resolution was set at 4 cm−1 with 16 scans. ATR crystal was rinsed with ethanol and a background scan was performed before each sample analysis. Several areas of the filter were considered until a consistent result was obtained between the points examined. The particles were identified by comparing the FT-IR absorbance spectra of the analyzed MPs to those in a polymers reference library. An index of at least 70% match was considered acceptable (Joint Research Centre, 2014 ).
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7

FT-IR/ATR Spectroscopic Analysis

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FT-IR/ATR analysis was performed through a Spectrum Two PE instrument supplied by PerkinElmer, endowed with a universal ATR accessory (UATR, Single Reflection Diamond/ZnSe). For each sample, FT-IR/ATR spectra were recorded from 400 to 4000 cm-1 with a 4 cm-1 resolution.
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8

FTIR Analysis of Molecular Structure

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FTIR spectra were obtained using a Spectrum Two PE instrument equipped with a horizontal attenuated total reflectance (ATR) crystal (ZnSe) (PerkinElmer Inc., USA).
The samples were placed directly onto the ATR crystal and spectra were collected in transmittance mode. Each spectrum was the result of the average of 32 scans at 4 cm -1 resolution. Measurements were recorded in the wavelength range of 1800-800 cm -1 . All spectra were smoothed using the Savitzky-Golay function. Second-derivative spectra of the amide region were used at bands position guides for the curve fitting procedure, using OriginPro 9.1 software.
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