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Edax detector

Manufactured by Ametek
Sourced in United States

The EDAX detector is a piece of lab equipment designed for energy-dispersive X-ray spectroscopy (EDS) analysis. It is used to detect and analyze the elemental composition of a sample by measuring the energy of the X-rays emitted from the sample when it is exposed to an electron beam.

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4 protocols using edax detector

1

Characterization of ZnONFs and CHCZnO NPs

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With the “Zetasizer nano ZS” Malvern Instruments, Malvern, UK, the mean particle size and its distribution (polydispersity index) of synthesized ZnONFs and hydroxychloroquine/zinc oxide nanoparticles loaded chitosan composites (CHCZnO NPs) were measured at 250 °C using “dynamic light scattering”. The laser light scattering method was used to investigate the zeta potentials of the identical samples. It can also predict colloid dispersion stability.
The morphology/shape of the ZnONFs and CHCZnO NPs was observed through a scanning electron microscope (Hitachi S-3400N’) at 13 kV and 80 KV and by a transmissible electron microscopy. The samples for SEM were placed onto metal stubs with adhesive tapes. EDAX detector (AMETEK, Berwyn, PA, USA) was utilized for element detection in samples in the current investigation.
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2

Characterizing Lunar Mineral Deposits via FESEM and XRD

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Samples for Field Emission Scanning Electron Microscopy (FESEM) were previously fixed with 2.5% glutaraldehyde in 0.1 M cacodylate-buffer (pH 7.4) at 4°C for 2 h and washed in cacodylate-buffer. Subsequently, they were postfixed in 1% osmium tetroxide for 1 h at 4°C and dehydrated by subsequent dilution series in ethanol and acetone finishing with 100% acetone before drying. The samples were then dried in a critical point drying device (Leica EM 300) at 34.5°C. Finally, the fixed samples were examined using a FEI TENEO microscope equipped with an Ametek EDAX detector for Energy Dispersive X-ray spectroscopy (EDX).
The mineralogical composition of moonmilk deposits and vermiculations was determined by using a Philips PW3710 diffractometer (current 20mA, voltage 40 kV, range 2θ 5–80°, step size 0.002° 2θ, time per step 2 sec) equipped with a Co-anode and interfaced with a Philips High Score software package for data acquisition and processing.
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3

Detailed Surface Characterization of Metal Coupons

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For the purposes of characterisation, an extra polishing step was performed. After being ground to P2500 grit, a finer 3 μm diamond paper was used with the final polishing step being performed using an MD-Chem polishing cloth using an OP-S suspension (Struers, Denmark). Once completed, the samples were acid treated as described above in order to remove MnO from within the porous component of the coupons and examined using scanning electron microscopy (SEM, Carl Zeiss FE-SEM, Merlin Gemini II column, Germany) and EDS (AMETEK EDAX detector, USA). Although weight percent for carbon, nitrogen and oxygen were included in the measurement, one must note that the EDS technique is not appropriate for accurate measurement of light elements therefore such results must only be considered as a qualitative indication. Phase analysis of the fully prepared samples was performed using an XRD Bruker D8 Advance (USA) with a copper source (Cu-Kα, λ = 0.141 nm), equipped with a graphite monochromator. The analysis was conducted at 2θ between 30° and 100° at a rate of 0.02°/step while the sample was angularly rotating at 15°/min.
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4

SEM and EDX Characterization of Sputtered Gold

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Two samples from each group were selected randomly: Gold sputtered (Sputter Coater 108 Auto, Cressington Scientific Instruments, Watford, UK) and examined using SEM (AIS2100C, Seron Technologies, ASI2100, Gyeonggi-Do, Korea) at ×1000 to 3000× magnification and 20 kV. Energy-dispersive X-ray (EDX) was also performed (AMETEK with EDAX Detector).
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