The Gallenkamp melting point instrument was used to measure the melting points. Thin-layer chromatography (TLC) was conducted on Polygram SIL G/UV254 TLC plates, and the results were visualized with ultraviolet light at 254 nm and 350 nm. In this study, the CEM Discover LabMate microwave apparatus (300 W, ChemDriver software; Matthews, NC) was used for microwave experiments. In closed vessels under pressure, microwave irradiated Pyrex tubes with caps were used to conduct the reactions. A Bruker DPX 400 superconducting NMR spectrometer was used to record the 1H and 13C nuclear magnetic resonance (NMR) spectra, and the IR spectra were measured with a Jasco Fourier transform/IR-6300 FT-IR spectrometer. The Elementar Vario MICRO Cube was used for the elemental analysis. Electron impact (EI) was used to determine mass analyses on a Thermo double-focusing sector (DFS) mass spectrometer. Varian Cary 5 spectrometer and a Shimadzu UV2600 spectrophotometer were used in UV − vis studies. Utilizing X-ray micro diffraction and single-crystal X-ray diffract meters, Rigaku D/MAX Rapid II and Bruker X8 Prospector were used to determine the X-ray crystal structure.
D max rapid 2
Manufactured by Bruker
The D/MAX Rapid II is a compact and versatile X-ray diffractometer designed for phase identification, phase quantification, and microstructural analysis of a wide range of materials. It features a high-intensity rotating-anode X-ray source and a 2D CMOS detector, enabling rapid data collection and analysis.
Automatically generated - may contain errors
Lab products found in correlation
Fourier transform ir 6300 ft ir spectrometer, by Jasco (3 mentions)
X8 prospector, by Bruker (3 mentions)
Vario micro cube, by Elementar (3 mentions)
Uv 2600 spectrophotometer, by Shimadzu (3 mentions)
Dpx 400, by Bruker (2 mentions)
Double focusing sector mass spectrometer, by Thermo Fisher Scientific (1 mentions)
3 protocols using d max rapid 2
1
Characterization of Organic Compounds
2
Comprehensive Analytical Characterization
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The Gallenkamp melting point instrument was used to measure the melting points. Thin-layer chromatography (TLC) was conducted on Polygram SIL G/UV254 TLC plates, and the results were visualized with ultraviolet light at 254 nm and 350 nm. A Bruker DPX 400 superconducting NMR spectrometer was used to record the 1H and 13C nuclear magnetic resonance (NMR) spectra, and the IR spectra were measured with a Jasco Fourier transform/IR-6300 FT-IR spectrometer. The Elementar Vario MICRO Cube was used for elemental analysis. Electron impact (EI) was used to determine mass analyses on a Thermo double-focusing sector (DFS) mass spectrometer. A Varian Cary 5 spectrometer and a Shimadzu UV2600 spectrophotometer were used in UV-vis studies. Utilizing X-ray microdiffraction and single-crystal X-ray diffractometers, Rigaku D/MAX Rapid II and Bruker X8 Prospector were used to determine the X-ray crystal structure.
3
Analytical Techniques for Chemical Characterization
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The Gallenkamp melting point instrument was used to measure the melting points. Thin-layer chromatography (TLC) was conducted on Polygram SIL G/UV254 TLC plates, and the results were visualized with ultraviolet light at 254 nm and 350 nm. In this study, the CEM Discover LabMate microwave apparatus (300 W, ChemDriver software; Matthews, NC) was used for microwave experiments. In closed vessels under pressure, microwave irradiated Pyrex tubes with PCS caps were used to conduct the reactions. A Bruker DPX 400 superconducting NMR spectrometer was used to record the 1H and 13C nuclear magnetic resonance (NMR) spectra, and the IR spectra were measured with a Jasco Fourier transform/IR-6300 FT-IR spectrometer. The Elementar Vario MICRO Cube was used for the elemental analysis. Electron impact (EI) was used to determine mass analyses on a Thermo double-focusing sector (DFS) mass spectrometer. Varian Cary 5 spectrometer and a Shimadzu UV2600 spectrophotometer were used in UV-vis studies. Utilizing X-ray microdiffraction and single-crystal X-ray diffractometers, Rigaku D/MAX Rapid II and Bruker X8 Prospector were used to determine the X-ray crystal structure.
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