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Inca200

Manufactured by Oxford Instruments
Sourced in United Kingdom

The INCA200 is an energy-dispersive X-ray microanalysis system designed for use in electron microscopy. It provides elemental analysis and chemical characterization capabilities. The system features high-resolution X-ray detection and advanced software for data acquisition and processing.

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8 protocols using inca200

1

Characterization of Composite Nanofibers

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The crystallinity
of the composite and carbonized nanofibers was investigated through
a powder X-ray diffractometer (Rigaku Miniflex II X-ray diffractometer,
Ni-filtered Cu Kα radiation, λ = 1.5406 Å). For morphological
and roughness studies of the synthesized nanofibers, the sample was
prepared in the powder form. Subsequently, the samples were coated
with a platinum thin layer via a sputtering technique to make the
surface conductive and to avoid any possible charging effect while
performing SEM analysis. The coated samples were then loaded into
the SEM measurement chamber under high vacuum and were examined at
a high voltage of about 3–10 kV. The morphology was examined
using a scanning electron microscope (JSM-5910 JEOL Japan). IR transmission
spectra were collected in the range of 400–4000 cm–1 using a PerkinElmer Spectrum Two FTIR spectrometer, equipped with
a universal attenuated total reflection accessory. An EDX electron
spectrometer (INCA 200, Oxford Instruments, UK) was used for elemental
analysis and their compositions.
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2

High-Resolution HAADF-STEM Imaging

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HAADF-STEM measurements were performed using a 200 kV JEOL JEM-2100F-UHR operated at 200 kV and equipped with a field emission gun as well as an Oxford Instruments INCA 200 for energy-dispersive X-ray spectroscopy (EDXS) enabling elemental mapping. The samples were prepared on carbon-coated copper grids (Quantifoil) via drop-casting of the ethanolic microbead dispersion.
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3

SEM-EDX Elemental Analysis Protocol

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This analytical method was used to identify the desired elements. The spectra of peaks showed the true composition of sample by EDX with SEM (JSM-5910, INCA200 Oxford instruments, UK) [31 (link)].
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4

Comprehensive Material Characterization

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The GeminiVII2390i instrument was run to perform the N2 adsorption-desorption experiment and the data obtained were manipulated by BET and BJH methods to deduced texture parameters (surface area and pore size). The Panalytical X-pert Pro was operated in the 2θ range of 20°–80° to determine the crystallographic parameters, whereas the full width and half maxima (FHWM) values were considered to calculate crystallite size. The surface morphology was studied via SEM model 5910, JEOL, Tokyo, Japan and TEM (HRTEM, JEM-2010) provided by Field Electron and Ion Company (FEI), Cleveland, TN, USA. The EDX coupled with SEM (model: INCA 200, Oxford Instruments, Oxfordshire, UK) was used to analyze the elemental composition, whereas the surface chemical moieties were identified via FTIR analysis (Nicolet 6700, Thermo Fisher Scientific, Waltham, MA, USA).
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5

Surface Characterization of MEF

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Scanning electron microscopy (ZEISS EVO18, Carl Zeiss Group, Oberkochen, Germany) coupled with energy-dispersive X-ray spectrum (INCA200, Oxford instruments, Oxford, UK) was used to characterize the morphology of the MEF. Kelvin probe force microscopy (Bruker Multimode 8, Santa Barbara, CA, USA) was used to construct the surface potential map of different parts of the MEF. The zeta potential of control 2 and control 3 was measured using a Zetameter (SurPASS, Anton Paar, Graz, Austria) by measuring the streaming potential in a KCl electrolyte (10−3 M). Mott–Schottky plots of the NT and IT samples were investigated in a conventional three-electrode cell using an electrochemical workstation (Zahner, Zennium, Kronach, Germany). The NT and IT with an electrode area of 2 cm2 were used as a working electrode. An Ag/AgCl electrode and a platinum electrode were used as the reference and counter electrode, respectively. Mott–Schottky plots were measured at a frequency of 1000 Hz in a phosphate buffer solution (Gibco, Carlsbad, CA, USA, 1 ×) at room temperature.
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6

Surface Characterization of MEF

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Scanning electron microscopy (ZEISS EVO18, Carl Zeiss Group, Oberkochen, Germany) coupled with energy-dispersive X-ray spectrum (INCA200, Oxford instruments, Oxford, UK) was used to characterize the morphology of the MEF. Kelvin probe force microscopy (Bruker Multimode 8, Santa Barbara, CA, USA) was used to construct the surface potential map of different parts of the MEF. The zeta potential of control 2 and control 3 was measured using a Zetameter (SurPASS, Anton Paar, Graz, Austria) by measuring the streaming potential in a KCl electrolyte (10−3 M). Mott–Schottky plots of the NT and IT samples were investigated in a conventional three-electrode cell using an electrochemical workstation (Zahner, Zennium, Kronach, Germany). The NT and IT with an electrode area of 2 cm2 were used as a working electrode. An Ag/AgCl electrode and a platinum electrode were used as the reference and counter electrode, respectively. Mott–Schottky plots were measured at a frequency of 1000 Hz in a phosphate buffer solution (Gibco, Carlsbad, CA, USA, 1 ×) at room temperature.
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7

Characterizing CMSP Microstructure by SEM-EDX

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The microstructure of the CMSP was studied by scanning electron microscopy (SEM) (JEOL 5410LV, JEOL, Peabody, MA, USA) at low voltage (20 kV). A SEM image was obtained in the secondary electron imaging (SEI) mode. The chemical composition was performed using energy-dispersive X-ray spectroscopy (EDX) (INCA-200 Oxford Instruments, Abingdon, Oxfordshire, England).
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8

Characterization of Nanocomposite Materials

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The morphology of the prepared
nanocomposites
was obtained by scanning electron microscopy (SEM) (JSM 5910, Jeol,
Japan) at various magnifications of 500×, 1000×, 5000×,
and 10,000×. A Fourier transform infrared (FTIR) spectroscope
Vertex 70 (Bruker, Billerica, MA, USA) with a DLaTGS detector and
a He Ne laser in the 4000–500 cm–1 range
was used to examine the nanocomposite structure. On an automated pore
size and surface area analyzer, the Brunauer–Emmett–Teller
(BET) surface area and pore size distribution were calculated using
N2 adsorption–desorption (JW-BK122W, Beijing JWGB),
an energy-dispersive X-ray (EDX) system (INCA200/Oxford Instruments)
was used for elemental composition, and a UV–visible double
beam spectrophotometer (Model SP-3000DB, Optima, Japan) was used for
absorbance measurement using quartz cuvettes. The spectral bandwidth
and wavelength range for this instrument is 1 nm and 190 to 1100 nm.
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