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Paragon 500

Manufactured by PerkinElmer
Sourced in United States

The Paragon 500 is a high-performance liquid chromatography (HPLC) system designed for analytical and preparative applications. It features a robust and reliable design to deliver consistent and accurate results. The Paragon 500 is capable of handling a wide range of sample types and provides precise control over various parameters such as flow rate, temperature, and gradient.

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12 protocols using paragon 500

1

Structural Analysis of Novel Compounds

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Fourier-transformed infrared spectroscopy (FT-IR; PerkinElmer Paragon 500, Waltham, MA, USA) was utilized to ascertain the functional groups’ presence in the tested samples (IPS-1 and IPS-2) at the wavelength range of 500–4000 cm−1. In addition, the structure and linkages of the sample were examined using 1H and 13C Fourier-transformed nuclear magnetic resonance spectroscopy (FT-NMR; Bruker, 600 MHz, Fallanden, Switzerland). The samples (20 mg) were dissolved in D2O (0.5 mL) for FT-NMR analysis.
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2

Physicochemical Characterization of Polymer

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FTIR analysis was performed with a Perkin-Elmer spectrometer (Paragon 500, Norwalk, CT, USA) equipped with a ZnSe attenuated total reflectance (ATR) crystal accessory. 1H NMR spectra were recorded with a Bruker Avance DPX400 apparatus (Billerica, MA, USA) operating at 400 MHz at 25 °C and 128 NS. GPC analysis was performed using a Malvern-Viscotek GPC-MAX/TDA 305 quadruple detector array (Malvern, UK) equipped with a precolumn and two Phenogel columns (Phenomenex, Torrance, CA, USA) with exclusion limits of 106 and 103, respectively. THF solutions (100 μL) were filtered (PTFE 0.22 μm) and analyzed at a flow rate of 0.8 mL/min and a temperature of 35 °C. Calibration was based on a standard of polystyrene (Mw 104,959 Da).
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3

Physicochemical Characterization of Polydatin-Loaded PLGA Nanoparticles

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After the successful synthesis of Polydatin-encapsulated PLGA nanoparticles were processed for physicochemical characterization techniques. Particle size, polydispersity index and zeta potential of PLGA-NPS/POL-PLGA-NPs was investigated by dynamic light scattering (DLS) using Horiba Scientific-SZ-100 (Horiba, Kyoto, Japan). X-ray diffraction pattern (XRD) of the crystalline phase was recorded using an Ultima IV X-ray diffractometer (X’pert-pro MPD-PANalytical, Netherland) at the angle range of 2θ (10–80°). Surface chemistry of the nanoparticles and functional group analysis was done by Fourier transfer infrared spectroscopy (FTIR) (FTIR PerkinElmer Paragon 500, USA). Particle size and topological features of the nanoparticles were recorded by Transmission electron microscope using Philips CM120 M (80 kV; Philips, Eindhoven, Netherlands) and the three-dimensional features of the individual and the groups of particles are investigated by atomic force microscope (AFM) using AFM-Solver Next (NT-MDT, Moscow, Russia).
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4

FTIR Analysis of Powdered Samples

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Fourier transform infrared (FTIR) was employed to analyze samples in the powdered state in order to identify functional groups and host–guest complexes formation. Spectra were obtained using a PerkinElmer spectrometer (Paragon 500, Milan, Italy), equipped with a ZnSe attenuated total reflectance (ATR) crystal accessory. Spectra were acquired in the 4000–650 cm−1 range, at a resolution of 4 cm−1 (16 scans).
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5

Multi-Technique Characterization of Prepared Samples

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The prepared samples were characterized using XRD, FETEM, FESEM, FTIR, XPS, and PL techniques. Phase-purity and crystallinity were examined by X-ray diffraction (XRD) (PanAnalytic X’Pert Pro, Malvern Instruments, Malvern, UK) with Cu-Kα radiation (λ = 0.15405 nm, at 45 kV and 40 mA) and an angle range from 30° to 80°. Morphological and elemental mapping were identified using field emission transmission electron microscopy (FETEM, JEM-2100F, JEOL, Inc., Tokyo, Japan) and field emission scanning electron microscopy (FESEM, JSM-7600F, JEOL, Inc. Tokyo, Japan). Energy-dispersive X-ray spectrometry (EDS) was employed to determine the elemental composition. The chemical states of elements were investigated by X-ray photoelectron spectroscopy (XPS) (PHI-5300 ESCA PerkinElmer, Boston, MA, USA). Photoluminescence (PL) spectra were measured by a fluorescent spectrometer (Hitachi F-4600). Fourier transform infrared spectroscopy (FTIR) (PerkinElmer Paragon 500, Woonsocket, RI, USA) was used to identify the functional group of the prepared samples.
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6

Characterization of CS-LO-PEG-HER Nanoparticles

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A series of analytical methods were used to confirm the successful formation of CS-LO-PEG-HER NPs. The loading of LO and, functionalization of mAb (Anti-HER) were analyzed by FTIR (Fourier-transform infrared spectroscopy; PerkinElmer Paragon 500, Waltham, MA, USA) and NMR (Nuclear Magnetic Resonance; FT-NMR, Bruker, 600 MHz, MA, USA). For the FTIR analysis, the nanoparticle samples, including CS, PEG6000, LO, HER, CS-LO NPs, CS-LO-PEG NPs, and CS-LO-PEG-HER NPs, were prepared as KBr pellets using the standard sample preparation method, and the IR scanning was performed from the 400–4000 cm−1. To determine the size and zeta potential of nanoparticles, DLS (Dynamic light scattering; zeta potential particle size analyzer Malvern, Eindhoven, The Netherland) and ELS (Electrophoretic light scattering) analysis were used. For the DLS/ELS analysis, 10 µg of each NPs was dissolved in 3 mL of DI water, sonicated for 2 min, and filtered using a 2 µm syringe filter. The filtered nanoparticle suspension was used for DLS analysis. Transmission electron microscopic (JEOL-JSM 1200EX, Tokyo, Japan) analysis was used to observe the morphology of nanoparticles. For TEM analysis, 10 µg of each NPs was dissolved in 1 mL of ethanol, sonicated for 2 min, and negative stained with 2% uranyl acetate then loaded into a copper grid for TEM observation [27 (link)].
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7

Characterization of Starch-Coated Silver Nanoparticles

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The micromorphology and elemental content of S-AgNP NPs were analyzed by transmission electron microscopy (FE-TEM) and energy-dispersive X-ray spectroscopy (EDS) (JEOL-JSM, Akishima, Japan). The particle size distributions and potentials of the nanoparticles were determined by a zeta potential particle size analyzer (Malvern PANalytical, Worcestershire, UK). The crystallinity of the starch, S-AgNP NPs, and AgNP NPs were determined using X-ray powder diffraction (XRD, X’pert-pro MPD-PANalytical, Worcestershire, UK). The functional characteristics of the nanoparticles were detected by Fourier-transform infrared spectroscopy (FTIR, PerkinElmer Paragon 500, Waltham, MA, USA). For the XRD and FTIR analysis, the starch, S-AgNP NPs, and AgNP NPs were analyzed after sufficient drying and grinding into powder. The silver content of S-AgNP NPs was analyzed using ICP-MS (PerkinElmer (NextION 300D), Waltham, MA, USA); in brief, 10 mg of sample was dissolved in 150 μL of HNO3 and 350 μL of HCl, and after 3 h of full acid digestion, 20 μL was diluted in 10 mL of 0.2% HNO3 solution. The silver and iron contents of AgNP NPs were determined according to standard calibration curves for silver and iron (1, 2.5, 5, 10, 25, 50, 100 μg/L) [16 (link)].
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8

Structural Analysis of Polysaccharides

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The presence of the functional group in the polysaccharides (EPS1, EPS2, and IPS1-4) was determined by Fourier transform infrared (FT-IR) spectroscopy (PerkinElmer Paragon 500, Waltham, MA, USA) analysis using the KBr pellets of polysaccharides. Then, the linkage of the polysaccharides was determined by 1H, 13C and 2D NMR analysis. A total of 20 mg of each polysaccharide (EPS1, EPS2, and IPS1-4) was dissolved in 0.5 mL of D2O at ambient temperature. The NMR was recorded using an FT-NMR spectrometer (Bruker, 600 MHz, Fällanden, Switzerland).
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9

Photopolymerization Characterization by FTIR-ATR

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The FTIR-ATR spectra of the obtained films were recorded using a Perkin-Elmer FTIR spectrometer (model Paragon 500 equipment) with the aim to assess the completeness of the photopolymerization process. The spectra (32 scans) were recorded in a 4000–400 cm−1 wavelength range at 4 cm−1 resolution.
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10

Comprehensive Characterization of Prepared Samples

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The crystal structure
and crystalline phase of prepared samples were investigated by recording
XRD patterns (PanAnalytic X’Pert Pro, Malvern Instruments,
UK) with Cu Kα radiation (=0.15405 nm, at 45 kV and 40 mA).
Scanning electron microscopy (SEM) was employed to study the morphologies
of the synthesized samples. The chemical elements and states of the
prepared samples were examined by EDX and XPS, respectively. Raman
spectra were recorded using the WITec alpha 300RA Raman Confocal Microscope.
A Fourier transform infrared (FTIR) spectrometer (PerkinElmer Paragon
500) recorded the group function of the obtained samples at the wavenumber
range of 500–4000 cm–1. A UV–visible
spectrophotometer (Hitachi U-2600) and a fluorescence spectrometer
(Hitachi F-4600) were used to analyze the optical properties of the
prepared samples.
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