Jem 2100 tem instrument
The JEM-2100 is a Transmission Electron Microscope (TEM) instrument manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of materials at the nanoscale level. The JEM-2100 TEM can be used to observe the internal structure and composition of a wide range of samples, including biological specimens, materials, and nanostructures.
Lab products found in correlation
6 protocols using jem 2100 tem instrument
Porous Structure Analysis of CMSNs
Characterization of Nanoparticle Morphology
Photoelectrochemical Characterization of Modified ITO
Characterization of GNP-ZnO Hybrids
The I-V characteristics of the GNP-ZnO/ER composites were measured using a semiconductor parameter analyzer (Keithley 2600-PCT-4B, Keithley Instruments, Cleveland, USA), and a thin layer of silver conductive resin was pasted on both surfaces of the samples to ensure good contact with the test tools.
Multifaceted Characterization of Nanomaterials
Characterization of MSN-TanIIA-PEG Nanoparticles
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