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Jem 2100 tem instrument

Manufactured by JEOL
Sourced in Japan

The JEM-2100 is a Transmission Electron Microscope (TEM) instrument manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of materials at the nanoscale level. The JEM-2100 TEM can be used to observe the internal structure and composition of a wide range of samples, including biological specimens, materials, and nanostructures.

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6 protocols using jem 2100 tem instrument

1

Porous Structure Analysis of CMSNs

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The porous structure of CMSNs and E-CMSN was tested using JEM2100 TEM instrument (JEOL. Japan). Sample ethanol solution was withdrawn and then displayed onto porous carbon films.
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2

Characterization of Nanoparticle Morphology

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The generated nanoformulations were examined with a Jeol Jem-2100 TEM instrument (Tokyo, Japan) to confirm the obtained size and analyze the particle morphology. The formulations where then significantly diluted with deionized water to the proper intensity, enabling clear visualization of the created NLCs. One drop of the formed NLCs suspension was put into a carbon-coated grid, and the particles were allowed to stick to the grid by leaving them for one minute. A filter-paper sheet was applied to remove the extra suspension. After applying a drop of 1% phosphotungstic acid staining solution, the leftover stain was removed using the filter paper sheet again. Then, the samples were allowed to dry and subsequently inspected under an electron microscope [49 (link)].
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3

Photoelectrochemical Characterization of Modified ITO

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The SEMs were acquired using a Hitachi S-4800 scanning electron microscope (Japan) while TEMs were recorded using a JEM-2100 TEM instrument (JEOL, Japan). The UV-vis absorption spectra were obtained using a UV-3600 UV-vis-NIR spectrophotometer (Shimadzu Co., Kyoto, Japan). Photoelectrochemical measurements were performed with a home-built photoelectrochemical system. A 500 W Xe lamp equipped with a monochromator was used as the irradiation source. The photocurrent was measured on a CHI 630D electrochemical workstation (CH Instruments, Austin, TX). A grating spectrometer Omni-λ1509 (Beijing Zolix Instruments CO., LTD) was used to obtain a continuous wavelength spectrum. All modified processes were performed at 37 °C, and all PEC experiments were carried out at room temperature using a conventional three-electrode system, with a modified ITO electrode as the working electrode, a platinum wire as the counter electrode and a saturated Ag/AgCl electrode as the reference electrode.
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4

Characterization of GNP-ZnO Hybrids

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Scanning electron microscopy (SEM, GeminiSEM 300 SEM instrument, Jena, Germany) and transmission electron microscopy (TEM, JEOL JEM-2100 TEM instrument, Tokyo, Japan) were used to analyze the microstructure and morphology of the GNP-ZnO hybrids and the fracture surface of the GNP-ZnO/ER composites. The crystal phase structure of the GNP-ZnO hybrids was characterized by X-ray diffraction (XRD, Beijing PuXi XD-6, Beijing, China). Fourier Transform IR (FTIR, Tianjin GangDong FTIR-650, Tianjin, China) was used to analyze the oxygen-containing groups and the reduction degree of the GNPs and GNP-ZnO hybrids. The Raman scattering characteristics of GNP-ZnO hybrids were detected by Raman spectroscopy (Raman, Horiba Scientific LabRAM HR Evolution, Tokyo, Japan). X-ray photoelectron spectroscopy (XPS, Thermo Scientific K-Alpha+, Massachusetts USA) was used to determine the atomic composition in the GNP-ZnO hybrids and the functional groups of carbon, oxygen, and zinc.
The I-V characteristics of the GNP-ZnO/ER composites were measured using a semiconductor parameter analyzer (Keithley 2600-PCT-4B, Keithley Instruments, Cleveland, USA), and a thin layer of silver conductive resin was pasted on both surfaces of the samples to ensure good contact with the test tools.
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5

Multifaceted Characterization of Nanomaterials

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Fourier Transform Infrared Spectroscopy (FT-IR) spectra were collected on a Nicolet 6700 FT-IR spectrometer (Thermo Scientific, Harrogate, UK). The Proton Nuclear Magnetic Resonance Spectroscopy (1H NMR) spectra were recorded on a Bruker (AVANCE) AV-300 spectrometer (MA, USA). Ultraviolet–visible (UV–Vis) spectra were recorded on a UV-2401 PC UV–Vis spectrophotometer (Shimadzu, Kyoto, Japan). Transmission electron microscope (TEM) images were performed using a JEM-2100 TEM instrument with an acceleration voltage of 200 kV (JEOL JEM, Japan). The fluorescence emission spectra were measured using an RF-5301 PC spectrofluorophotometer (Shimadzu, Kyoto, Japan). The hydrodynamic diameters and zeta potentials were obtained using a zeta potential analyzer (ZetaPlus, Brukehaven Instruments Coorporation, New York, USA). Analytical reverse-phase high performance liquid chromatography (RP-HPLC) was performed using a Shimadzu-20AT series with a Thermo BDS HYPERSIL C18 reversed-phase chromatography column (150 mm × 4.6 mm, 5 μm) and a UV detector set at 227 nm. All HPLC runs were performed in triplicate.
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6

Characterization of MSN-TanIIA-PEG Nanoparticles

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The physical and chemical properties of MSN-TanIIA-PEG were characterized by transmission electron microscopy (TEM), zeta potential, and dynamic light scattering (DLS). The particle size (nm) and zeta potential (mV) of nanoparticles were evaluated by dynamic light scattering (DLS) at 25°C using the Zeta Plus Zetasizer (Brookhaven Instruments, USA). All the samples were dispersed in deionized water and sonicated before the analysis. The morphology of the uncoated and coated nanoparticles was observed by a JEM-2100 TEM instrument (JEOL, Japan).
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