Smartlab se x ray diffractometer

TEM system (JEOL JEM‐2100F) was used to investigate the morphology and microstructure of the synthesized materials. Zeta potential and hydrodynamic size were determined by Malvern instrument (Zetasizer Nano). The elemental composition was analyzed by TEM mapping. XPS spectra were measured through a VG ESCALAB 250Xi X‐ray photoelectron spectrometer. XRD patterns were obtained using a Smartlab SE X‐ray diffractometer (Rigaku, Japan). ICP‐OES (ICAP‐6300) was used to determine the content of Mo and Cu elements in the synthesized materials. FT‐IR spectra were measured using a Perkin Elmer spectrometer. UV–vis absorption spectra were observed by a TU‐1810DSPC spectrophotometer (Persee, Beijing, China). Fluorescence spectrum was recorded by F98 fluorescence spectrometer (Lengguang Technology, Shanghai, China).

The 7FO NFs and 7FO/PVDF nanocomposite films were measured using a Rigaku SmartLab SE X-ray diffractometer (XRD) for crystal structure with a 2 $\theta$ angle test of 10–80 ${}^{\circ }$ . A field emission scanning electron microscope (SEM, Hitachi S4800, Hitachi, Tokyo, Japan) was used to collect the microscopic morphology information of both, and an Oxford X-Max device was used to test the energy spectrum for compositional analysis and face scanning. The functional groups of the fillers and composites were characterized using a Thermo Scientific Nicolet 6700 FTIR (Fourier Transform Infrared Spectrometer), New York, NY, USA.
The films were coated with metal Ag electrodes on both sides prior to testing the electrical properties. The dielectric properties were measured using a broadband dielectric spectrometer (model Alpha-A, Novocontrol, Montabaur, Germany) at ${10}^2$ Hz to ${10}^7$ Hz. The ferroelectric properties were measured using a Radiant Premier II ferroelectric test system with a D-E hysteresis line at 10 Hz. Finally, the discharge energy density and discharge efficiency were calculated from the hysteresis loop.