Jsm it300 scanning electron microscope
The JSM-IT300 is a scanning electron microscope (SEM) manufactured by JEOL. It is designed to produce high-resolution images of small-scale surface features and structures. The JSM-IT300 utilizes an electron beam to scan the surface of a sample, generating detailed information about its topography and composition.
Lab products found in correlation
21 protocols using jsm it300 scanning electron microscope
Scanning Electron Microscopy of Treated Cassava
SEM Analysis of Biofilm Plastics
Comprehensive Characterization of Samples
SEM Sample Preparation of Orchid Pollinia
Scanning Electron Microscopy of Mouse Sperm
SEM Preparation of Biological Samples
Characterization of Superhydrophobic Surface Topography
The surface wetting properties were characterized by measuring the static contact angle of water droplets. The surface static contact angle was measured by SDC-80 optical contact angle measuring instrument (Shengding Precision Instrument Co., Ltd., Dongguan, China). The reliability of the measurement data was ensured by measuring the contact angle of the five regions of the sample. The contact angle was obtained by taking pictures of water droplets and analyzing them through software ImageJ-v1.8.0 (National Institutes of Health, Bethesda, MD, USA).
Scanning Electron Microscopy of Grafted Copolymer
Characterizing CMCh Film Morphology
Ultrastructural Analysis of Spermatozoa and Brain Tissue
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