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Tst350

Manufactured by Linkam
Sourced in United Kingdom

The Linkam TST350 is a temperature-controlled stage that allows for the precise control of sample temperature. It can be used to heat or cool samples across a wide temperature range. The TST350 is designed for use with optical microscopes and other analytical instruments that require precise temperature control of samples.

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15 protocols using tst350

1

X-ray Characterization of Structural Transitions

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The structural characterization was performed
in the 1W2A beamline
of the Beijing Synchrotron radiation Facility (BSRF). Selected samples
were previously fractionated in a Linkam THMS600 hot stage connected
to a liquid nitrogen station. The final heating was performed from
25 to 140 °C at 5 °C/min in a Linkam TST350 hot stage, and
the WAXS patterns were taken simultaneously. An exposure time of 25
s was used, and the patterns were taken every 30 s (i.e., every 2.5
°C). A Pilatus 1M detector collected the scattering patterns
with a resolution of 981 × 1043 pixels (pixel size = 79 ×
79 μm2). The sample-to-detector distance was 121.8
mm, and the wavelength was 1.54 Å.
WAXS experiments, on
selected samples, were performed with transmission geometry at RT.
These experiments were performed on a Xeuss 2.0 system (Xenocs SA),
equipped with a microfocus Cu Kα X-ray source (GeniX3D, 50 kV,
0.6 mA), generating X-ray radiation of a wavelength of 1.54 Å.
The detector used was a Pilatus 300K (DECTRIS, Swiss) with a resolution
of 487 × 619 pixels (pixel size = 172 × 172 μm2). The sample-to-detector distance was 138.61 mm, and exposure
time of 1800 s. The 1D intensity profiles were integrated from background-corrected
2D WAXS patterns with an azimuthal angle range of 0–90°.
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2

Characterization of B-PDMS Elastomer

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The ultimate strain
and the elastic modulus of the B-PDMS elastomer were measured at the
speed of 0.2 mm/s using the Linkam TST350 tensile test bench. The
lap shear test and the adhesion test were conducted using the tensile
testing machine, the lap shear strength of the sample was measured
by placing a B-PDMS film between two glass sheets, and the adhesion
was measured by connecting the upper and lower surfaces of the elastomer
to the skin and the dynamometer, respectively. FT-IR spectroscopy
was used to characterize B-PDMS before and after cross-linking. PDMS
before and after modification was characterized by DSC. The content
of oxygen-containing functional groups in GO and rGO was measured
by X-ray photoelectron spectroscopy (XPS). The structure and morphology
of the conductive layer were observed by scanning electron microscopy
(SEM). The electrical conductivity of rGO was measured using the four-probe
method (Keithley 2420I-V) at room temperature.
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3

Stretching Behavior of PA66/RGO Nanocomposites

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In situ 2D WAXD and 2D SAXS experiments, carried
out on the BL16B1 beamline in the Shanghai Synchrotron Radiation Facility
(SSRF), were employed to follow the stretching process of PA66/RGO
nanocomposites at room temperature. The uniaxial stretching of PA66/RGO
nanocomposites, along the horizontal direction, was performed with
a tensile testing device (TST350, Linkam, U.K.) with the tensile rate
of 1.2 mm/min. The X-ray wavelength was 1.239 Å. The calibrated
distance from the sample to detector was 128.0 mm. Moreover, the calibrated
distance from the sample to detector of 2D-SAXS experiments was 5210
mm. The data of the WAXD and SAXS experiments were reduced by the
program FIT2D. The 1D-WAXD curves and SAXS curves were obtained from
the azimuthal integral of 2D X-ray patterns. The SAXS curves were
Lorentz corrected.
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4

Tensile Strength Testing of Degraded Samples

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The mechanical
property test was performed using the Linkam TST350 tensile machine
with a stretching rate of 10 mm/min. The tensile strength and strain
of the samples in different degradation days were obtained from the
tensile test, and at least five samples were used for each data point,
and their average values were taken.
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5

Electrical Characterization of Peeled Silicon Chip

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The sample
chip with size of 30 mm by 15 mm is peeled from the silicon carrier
and mounted on a commercial tensile testing stage (TST350, Linkam
Scientific) with an in-built controller to actuate one of the two
clamps moving along the horizontal plane. The electrical resistance
is measured using a two-point probe method (2400 source-meter, Keithley)
controlled by a LabVIEW program. The resistances are measured with
an applied current of 1 mA. The capacitance is measured using a LCR
meter (4285A, HP) with an applied voltage of 500 mV and a frequency
of 500 kHz.
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6

Correlating Optical and Mechanical Properties

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Tensile Testing was carried out on a Linkam TST-350 without closing the stress-strain chamber and by using a displacement ramp of 5 mm min−1. The shown values of stress were calculated by considering the constant cross-section area of the specimen’s mid-point at 0% strain. Absorption spectra were measured in transmission with a Flame-S UV-vis spectrometer from Ocean Optics. The spectra were smoothed via Savitzky-Golay filter considering 51 pts (6a) and 21 pts (6b). Excitation for photoluminescence (PL) spectra was carried out using a UV LED (Nichia NVSU233A UV SMD-LED, 365 nm, max. 1030 mW, operated with 900 mA) at a distance of 10 cm. The angle between exciting and detected light was 60 degrees. PL spectra were measured on the same spectrometer used for UV-vis spectroscopy and smoothed via Savitzky-Golay filter considering 21 pts. The data of optical properties and mechanical analysis was correlated via measuring time and include a maximum error in the strain of ±2%.
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7

Tensile, Optical, and Photoluminescence Analysis

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Tensile Testing was carried out on a Linkam TST-350 without closing the stress-strain chamber and by using a displacement ramp of 5 mm min -1 . The shown values of stress were calculated by considering the constant cross-section area of the specimen's mid-point at 0% strain.
Absorption spectra were measured in transmission with a Flame-S UV-vis spectrometer from Ocean Optics. The spectra were smoothed via Savitzky-Golay filter considering 51 pts (4-6a) and 21 pts (4-6b). Excitation for photoluminescence (PL) spectra was carried out using a UV LED (Nichia NVSU233A UV SMD-LED, 365 nm, max. 1030 mW, operated with 900 mA) at a distance of 10 cm. The angle between exciting and detected light was 60 degrees. PL spectra were measured on the same spectrometer used for UV-vis spectroscopy and smoothed via Savitzky-Golay filter considering 21 pts. The data of optical properties and mechanical analysis was correlated via measuring time and include a maximum error in strain of ± 2%.
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8

Tensile Characterization of Carbon Nanotube Yarns

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The tensile performance of the CNTYs was tested on a tensile tester (TST350, Linkam) at a gauge length of 10 mm and strain rate of 3 mm min−1. The linear density of the given CNTY was determined by measuring the weight of 15 m of CNT yarn. In situ Raman analysis was carried out while the CNTY was strained with a gauge length of 30 mm on a tensile stage set on the sample stage of the Raman spectroscope. The CNT nanostructure was examined by field‐emission transmission electron microscopy (FETEM, JEM‐3000F, JEOL, Japan) and Raman spectroscopy (RAMANplus, Nanophoton) with a 532 nm laser. The purity of the CNTs was determined by thermogravimetric analysis (TGA; SDT‐Q600, TA Instruments) in air. The cross‐ and longitudinal sections of the CNTYs were characterized by field‐emission scanning electron microscopy (FESEM, SUPRA 55VP, Carl Zeiss, Germany) after cutting with a focused ion beam (FIB; Helios 650, FEI).
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9

In Situ X-Ray Diffraction of Polymer Films

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In situ X-ray diffraction measurements were performed at the Shanghai Synchrotron Radiation Facility (SSRF) with a radiation wavelength of 0.124 nm. A MAR CCD detector in the beamline BL14B1 with a resolution of 2048 × 2048 pixels was used to collect diffraction patterns. The distances of 187.2 and 1893.5 mm were used in the sample to detect space for wide-angle X-ray diffraction (WAXD) and small angle X-ray scatting (SAXS), respectively. All of the X-ray images were corrected for background scattering. Fit2D software was used to convert the two-dimensional (2D) X-ray patterns into one-dimensional (1D) curves.
Two procedures were used in X-ray diffractions measurements. The procedure under the stretching field: The stretching field was chosen to detect in situ microstructure evolution. Using the stretching speed of 20 μm/s in the Linkam TST350 (Houston, TX, USA) stretch stage, each exposure time was 20 s for both WAXD and SAXS measurements. The procedure under the temperature field: the film (thickness of about 1 mm) was wrapped with aluminum foil and isothermal for 5 min at 300 °C to eliminate thermal history; then, the film was cooled down to room temperature. The WAXD data were collected during the second heating process from room temperature to 300 °C in steps of 2 °C.
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10

DNA Film Fabrication and Characterization

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DNA (Deoxyribonucleic acid sodium salt from salmon testes, Sigma Aldrich) was dissolved in deionised water at 25 mg/ml without further purification. Pristine silicon, micropost-patterned silicon, or glass substrates were rinsed with acetone, ethanol and deionised water and then treated with O2 plasma for 5 min to eliminate any organic/inorganic impurities.
For the doctor blade experiment, micropost-patterned silicon and glass substrates were sandwiched with a gap using an aluminium foil of 40 μm thickness. The DNA solution was injected into the sandwich cell by capillary forces, and then the upper glass piece of the sandwich cell was pulled in the heating stage (Linkam TST350). The temperature range and pulling speeds were 25 °C and 3 μm/s, respectively.
The optical textures of the fabricated DNA film were directly observed by POM (Nikon LV100POL) using a first-order retardation plate (λ = 530 nm). Fluorescent confocal polarising microscopy (C2 plus, Nikon) with a linearly polarised laser source (λ = 488 nm) was used to observe the meniscus line of the DNA microstructures. For this experiment, the DNA solution was mixed with a fluorescent dye molecule, Acridine orange (Aldrich).
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