Labram hr raman spectrometer system

Crystal structures of the samples were characterized by X-ray diffractometer (Maxima-X XRD-7000) and Cu K-alpha radiation (λ = 1.5406 nm) over the 2θ range of 10°–60°. Morphology and microstructures of the as-prepared products were examined by field-emission scanning electron microscopy (FESEM, JSM-7800N) and transmission electron microscopy (TEM, JEM-2100). Raman spectra were obtained using a HORIBA Scientific LabRAM HR Raman spectrometer system equipped with a 532.4 nm laser as the exciting radiation. The weight percent of sulfur was determined by thermogravimetric analyzer (TGA, Q50). X-ray photoelectron spectroscopy (XPS) measurements were performed on a Thermo Scientific ESCALAB 250Xi electron spectrometer. Nitrogen adsorption−desorption isotherms and pore size distribution were characterized by Quadrasorb evo 2QDS-MP-30 (Quantachrome Instruments, USA).

The phase purity and crystalline structure of the samples were determined by X-ray diffraction (XRD) by means of PANalytical X′Pert PRO diffractometer using a CuKα radiation source (λ = 1.5418 Å). The morphology of the samples was studied by scanning electron microscopy (SEM, FE Quanta 650 F ESEM) and transmission electron microscopy (TEM, Tecnai G2 F20 HRTEM) operated at an acceleration voltage of 200 keV. N₂ adsorption/desorption was determined by Brunauer-Emmett-Teller (BET) measurements using Micromeritics instrument (Data Master V4.00Q, Serial#:2000/2400). Thermal gravimetric analysis (TGA 500Q) was carried out under air atmosphere between room temperature and 850 °C, and the flow rate of the synthetic air was 10 ml/min. Raman spectra were recorded on a HORIBA Scientific LabRAM HR Raman spectrometer system using Ar laser. The X-ray photoelectron spectra (XPS) analyses were obtained by X-ray photoelectron spectroscopy (XPS, SPECS Germany, PHOIBOS 150). Surface morphologies of the self-affine fractal electrodes were obtained with a SPA 400 equipped with a SPI3800N Probe Station (Seiko Instruments Inc.) in the atomic force microscope (AFM) mode using commercial silicon nitride cantilevers.

The morphology of the samples was observed using a Hitachi SU-8000 field-emission SEM. The TEM observation was conducted at 200 kV on a JEOL JEM-2100 equipped with energy-dispersive X-ray spectroscopic analysis. Powder XRD analysis was operated on Rigaku Rint 2000 X-ray 27 diffractometer with monochromated Cu Kα radiation. Raman spectroscopy was carried out on a HORIBA Scientific Lab RAM HR Raman spectrometer system using a 532.4 nm laser. TG analysis was performed on a Hitachi HT-Seiko Instrument Exter 6300 TG/DTA 9 in Air heating from room temperature to 900 °C (5 °C min⁻¹). The nitrogen adsorption–desorption isotherms of the samples were acquired by using a Micromeritics BK122T–B analyzer. The SSA was determined according to Brunauer–Emmett–Teller theory in the relative pressure range of 0.04 to 0.2. Pore size distributions were determined from the adsorption branches of the isotherms, based on the NLDFT. The electrical conductivity was determined by pressing the samples between two plungers into a hollow Nylon cylinder, and applying a pressure of up to 12.5 MPa.