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Quanta inspect feg scanning electron microscope

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Quanta Inspect FEG scanning electron microscope is a high-performance instrument designed for advanced imaging and analysis applications. It features a field emission gun (FEG) source, providing high-resolution capabilities and enhanced imaging quality. The core function of the Quanta Inspect FEG is to enable detailed, high-magnification visualization and characterization of samples at the micro- and nanoscale level.

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2 protocols using quanta inspect feg scanning electron microscope

1

Assessing Peptide Effects on E. coli Biofilm

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SEM was used to assess the morphological effects of peptides on the biofilm formed by E. coli in modM9. We used peptides at concentrations of 2 and 1 µM for Esc(1-21) and concentrations of 16 and 8 µM for Esc(1-18) for the EDL933 and K12 strains. Both untreated and treated biofilms formed on glass coverslips were obtained as described in our previous work [49 (link)]. Briefly, biofilms formed on coverslips of 12 mm diameter were fixed with 2.5% glutaraldehyde in sodium cacodylate buffer for 30 min and postfixed with 1% osmium tetroxide. These samples were dehydrated using a graded alcohol series and were critical-point dried in CO2 (CPD 030 Blazers device, Bal-Tec, Los Angeles, CA, USA). After being coated with gold by sputtering (SCD 040 Blazers device, Bal-Tec), the same samples were observed with an FEI Quanta Inspect FEG scanning electron microscope (FEI, Hillsboro, OR, USA).
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2

SEM Imaging of Sputtered Films

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The films morphology was investigated using an FEI Quanta Inspect FEG Scanning Electron Microscope (FEI, Hillsboro, OR, USA) with 30 kV accelerating voltage. The obtained films were previously sputtered with gold for 30 s.
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