Mini x device
The Mini x device is a compact particle size analyzer that measures the size distribution of particles in various materials. It utilizes laser diffraction technology to provide accurate and reliable particle size measurements. The device is designed for easy operation and can be used in a wide range of industries and applications.
Lab products found in correlation
3 protocols using mini x device
Synthesis and Characterization of Cerium-Vanadium Catalysts
Characterization of Cerium-Vanadium Oxide Catalyst
The crystal structure of the material was determined by XRD (X-ray diffraction) (D8-Advance, Bruker, Germany) using Cu Kα radiation (λ = 1.5406 Å) in the 2θ range from 10 to 70°. Fourier transform infrared (FTIR, Magna-IR, spectrophotometer 550 Nicolet in KBr pellets ranging from 400 to 4000 cm -1 ) spectroscopy has been used to study the structure and chemical bonds of the molecule. FESEM (field-emission scanning electron microscope) images was recorded by MIRA3 FE-SEM. Nitrogen adsorption/desorption was done using Belsorp mini x device. BJH analysis was used to record the pore size distribution. The bandgap of the samples was determined using UV-visible diffuse reflection spectra (DRS) equipment (Shimadzu/UV3600Iplus).
Comprehensive Material Characterization Protocol
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