The Raman spectroscopic measurements were performed using a 532 nm excitation laser source with a fixed power (30 mW) and fixed acquisition time (60 s) at room temperature. Scattered light from the samples was analyzed using a single-grating monochromator with a focal length of 50 cm, and was detected by a liquid-nitrogen-cooled charge-coupled-device detector (LabRAM HR Evolution, HORIBA). AFM was performed to investigate the surface morphology under atmospheric conditions after the deposition (XE-100, Park system), and the samples were scanned in the non-contact mode using an NSC18/Pt tip. The XPS measurements were carried out to examine the stoichiometry of the films (NEXSA, Thermo Fisher Scientific). For the STEM analysis, cross-sectional specimens were fabricated using the focused ion beam technique (Helios Nanolab 450, ThermoFisher Scientific). The HAADF STEM images were obtained using a double Cs-corrected FEI Titan G2 60–300 microscope with an accelerating voltage of 200 kV.
Titan g2 60 300 microscope
Manufactured by Thermo Fisher Scientific
Sourced in United States
The Titan G2 60-300 microscope is an advanced electron microscope designed for high-resolution imaging and analysis. It features a 60-300 kV accelerating voltage range, providing versatility in imaging and analytical capabilities. The microscope is equipped with a high-brightness electron source and advanced optics to deliver exceptional performance and image quality.
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Lab products found in correlation
Nexsa, by Thermo Fisher Scientific (1 mentions)
Helios nanolab 450, by Thermo Fisher Scientific (1 mentions)
Labram hr evolution, by Horiba (1 mentions)
Supra 40vp, by Zeiss (1 mentions)
Tga 6 thermogravimetric analyzer, by PerkinElmer (1 mentions)
Tecnai spirit microscope, by Thermo Fisher Scientific (1 mentions)
Iraffinity 1s spectrophotometer, by Shimadzu (1 mentions)
Ni u upright microscope, by Nikon (1 mentions)
Nano zs 90, by Thermo Fisher Scientific (1 mentions)
Uv 2700 spectrometer, by Shimadzu (1 mentions)
Spectrum gx, by PerkinElmer (1 mentions)
Uv 2700i spectrophotometer, by Shimadzu (1 mentions)
Fluoromax 4p spectrometer, by Horiba (1 mentions)
Scientific k alpha, by Thermo Fisher Scientific (1 mentions)
Zetasizer nano zs90, by Malvern Panalytical (1 mentions)
Icp ms, by PerkinElmer (1 mentions)
Smartlab se, by Rigaku (1 mentions)
Superx detector, by Bruker (1 mentions)
Tem grid, by Agar Scientific (1 mentions)
6 protocols using titan g2 60 300 microscope
1
Multimodal Characterization of Thin Films
2
Comprehensive Characterization of Prepared Samples
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The surface areas and porosity of the prepared samples were characterized by N2-gas adsorption at −196 °C (Quadrasorb, Boynton Beach, FL, USA). The samples’ morphology was evaluated with scanning electron microscopy (SEM), Zeiss SUPRA40VP, (Carl Zeiss AG, Oberkochen, Germany). The samples’ particle size was determined by high-resolution transmission electron microscopy (HRTEM), FEI Titan G2 60–300 microscope (FEI, Eindhoven, The Netherlands). Samples’ crystallinity was characterized by X-ray diffraction (XRD) BRUKER D8 ADVANCE diffractometer (BRUKER, Rivas-Vaciamadrid, Spain). X-ray photoelectron spectroscopy (XPS) measurements were carried out with a Kratos Axis Ultra-DLD X-ray photoelectron spectrometer (Kratos Analytical Ltd., Kyoto, Japan).
3
Characterization of NBP@TiO2 Nanostructures
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The transmission electron microscopy (TEM) images of the NBP@TiO2 nanostructures were captured on an FEI Tecnai Spirit microscope operated at 120 kV. High-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) characterization and elemental mapping were performed on an FEI Titan G2 60-300 microscope. The extinction spectra were measured on a Lambda 950 ultraviolet/visible/NIR spectrophotometer. The Au mass concentrations in the solution samples were measured on an Agilent 7500a inductively coupled plasma atomic emission spectrometry (ICP-AES) system. Fourier transform infrared spectroscopy (FTIR) analysis was performed on a Shimadzu IRAffinity-1S spectrophotometer. Thermogravimetric analysis (TGA) was carried out on a Perkin Elmer TGA 6 thermogravimetric analyzer, using a heating rate of 1 °C min−1. The hydrodynamic size of the CA4P-loaded NBP@TiO2 nanostructures was measured by a Malvern Zetasizer Nano ZS90 size analyzer.
4
Characterization of Gold Nanostructures
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The UV–VIS absorption spectra of the GNSs were obtained using a UV-2700 spectrometer (Shimadzu, Kyoto, Japan). The morphologies of the GNSs were observed using a Titan G2 60-300 microscope (FEI, Thermo Fisher Scientific, Hillsboro, OR, USA). XPS was conducted on a K-alpha multichine surface analyzer from Thermo Scientific (Waltham, MA, USA) with Al Kα radiation as the X-ray source and a pass energy of 100 eV. Zeta potentials were measured using a zeta potential analyzer (Nano-ZS90, Malvern, UK). For DFM imaging, a Nikon Ni-U upright microscope equipped with a 100 W tungsten halogen lamp, an oil immersion dark-field condenser (numerical aperture (NA) = 1.20–1.43), and a 40× Plan Fluor objective lens was used. A DP73 single-chip true-color charge-coupled device (CCD) camera (Olympus, Japan) was mounted on the top of the microscope to capture images. Red (638 nm, 100 mW) and green lasers (534 nm, 100 mW) from Laserland (Wuhan, China) were used to replace the 100 W tungsten halogen lamp for illumination to improve the image quality of the individual GNSs.
5
Comprehensive Characterization of Nanoparticles
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Transmission electron microscopy (TEM) images were performed on a FEI Titan G260-300 microscope equipped with Super-X EDX detector system. Ultraviolet–visible spectroscopy (UV–Vis) was recorded using a UV-2700i spectrophotometer (Shimadzu, Japan). Dynamic light scattering (DLS) and Zeta potential were determined through Malvern Zetasizer Nano ZS90. X-ray photoelectron spectroscopy (XPS) was collected by Scientific K-Alpha (Thermo Scientific). X-ray diffraction (XRD) spectrum was collected by SmartLab SE (Rigaku, Japan). The content of gadolinium was detected by Inductively coupled plasma mass spectrometry (ICP-MS, PerkinElmer). Fourier transform infrared spectroscopy (FTIR) was acquired by Spectrum GX (Perkin-Elmer). Fluorescent spectrum was obtained by a Fluo-romax-4P spectrometer (Horiba).
6
Nanoparticle Characterization in Wastewater
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Scanning transmission electron microscopy (STEM) coupled with energy-dispersive X-ray spectroscopy (EDS) was used to (i) identify Ti and Ag potentially present as nano-particulates in the total samples and size fractions of wastewater influent, (ii) to characterise Ti and Ag particles (size and shape) and (iii) to study their association with other particulate matter. A detailed summary of the sample preparation procedures is presented in the SI. Briefly, unfiltered and filtered samples (~10 µL) were applied onto TEM grids (copper grids with a lacey carbon film, mesh size 200; Agar Scientific, UK). STEM imaging was performed using an FEI Titan G2 60-300 microscope equipped with a DCOR probe Cs-aberration corrector operating at 300 kV. EDS was conducted with a Bruker SUPERX detector coupled to the same instrument.
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