Two-dimensional GO and GO–Ag NP images were obtained using TEM (JEM 2000EXII, JEOL, Tokyo, Japan). Sample structures were analyzed using X-ray diffraction (XRD, Siemens D5005, Oslo, Norway) to determine the element structure and phase purity. The 2θ diffractogram was scanned in the range of 5–80° at a scan rate of 4° min−1 with Cu-Kα radiation. FTIR (Horiba FT-730G, Kyoto, Japan) was used to identify the functional groups of the sample in the range of 500–4000 cm−1. A UV-visible spectrophotometer (V-650, Tokyo, Japan) was used to measure the change in the lateral size of GO and GO–Ag NP with various absorption wavelengths. The zeta potential and size distribution of GO and GO–Ag NPs were recorded in triplicate via a light scattering instrument (Zetasizer, 2000 HAS, Malvern, Worcestershire, UK). The Ag content was analyzed using inductively coupled plasma optical emission spectrometry (ICP-OES, Agilent 700 Series ICP Optical Emission Spectrometers, Victoria, Australia).
D5005
Manufactured by Siemens
Sourced in Germany
The Siemens D5005 is a lab equipment product designed for scientific and research applications. It provides core functionalities for data analysis and processing. Further details on its intended use are not available.
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Lab products found in correlation
Nicolet 6700, by Thermo Fisher Scientific (3 mentions)
S 4800, by Hitachi (2 mentions)
Topas 2, by Siemens (2 mentions)
Su8010, by Hitachi (2 mentions)
S8 tiger, by Bruker (2 mentions)
Jsm 7900f, by JEOL (2 mentions)
Agilent 700 series icp optical emission spectrometers, by Agilent Technologies (1 mentions)
Jem 2000exii, by JEOL (1 mentions)
Xplora plus raman system, by Horiba (1 mentions)
Sdt 2960, by TA Instruments (1 mentions)
Belsorp miniii, by Microtrac (1 mentions)
Avance 300 ft nmr spectrometer, by Bruker (1 mentions)
Vario micro cube instrument, by Elementar (1 mentions)
Uv 1800, by Hitachi (1 mentions)
Jem 3010, by JEOL (1 mentions)
F 7000, by Hitachi (1 mentions)
Malvern zetasizer nano, by Malvern Panalytical (1 mentions)
Uv 2401pc spectrometer, by Shimadzu (1 mentions)
Pyris 1, by PerkinElmer (1 mentions)
Asap 2020m, by Micromeritics (1 mentions)
36 protocols using d5005
1
Comprehensive Characterization of GO and GO-Ag NPs
2
Comprehensive Characterization of Prepared Materials
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The morphologies of the as-prepared materials were characterized by field emission scanning electron microscope (FESEM; S-4800, Hitachi) operated at 5.0 kV accelerating voltage. The crystal structures and phase purities were analyzed by X-ray powder diffraction (XRD; D5005, Siemens) with Cu-Kα radiation (k = 1.1506 Å), a 2-theta scanning range of 5–75° at 40 kV, and a current of 30 mA. Fourier transform infrared spectroscopy (FTIR; Nicolet 6700, Thermo Scientific) was used to identify the functional groups on the materials. Elemental analysis was carried out by an energy-dispersive X-ray (EDX) spectroscopy (connected with FESEM; S-4800, Hitachi). Raman spectra were observed with an Xplora Plus Raman system (Horiba, Japan) equipped with a cooled CCD detector (−60 °C) and edge filter.
3
Characterization of Electrocatalyst Composition and Structure
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Metal loading in the electrocatalysts was analyzed using simultaneous DTA-TGA equipment, TA Instruments (New Castle, USA), the model SDT 2960 at a constant heating rate of 10 °C min−1 from 30 to 900 °C under air atmosphere flow (100 mL min−1). Around 5.0 mg of the sample was placed in a Pt-crucible.
The electrocatalyst composition was analyzed by energy dispersive X-ray spectroscopy (EDX) from IXRF System Inc., model 500 Digital Process (Houston, TX, USA) using a scanning electron microscope (SEM), model EVO 50 (Cambridge, UK).
Diffraction patterns were obtained on an X-ray diffractometer (D5005 from Siemens- Munich, German) operating with Cu Kα radiation (λ = 1.5406 Å) generated at 40 kV and 40 mA. The following parameters were kept constant during the analyses: 2θ range = 30°–90°, step = 0.01° s−1, and total analysis time = 100 min. XRD data were corrected by the background and refined by fitting the experimental angular range of interest to the pseudo-Voigt1 function per crystalline peak with a computer refinement program (Profile Plus Executable, Siemens AG, Munich, German). The crystallite size was estimated by using Scherrer’s equation [51 ]. The electrocatalyst morphology was also investigated by Transmission Electron Microscopy (TEM) using an FEI TECNAI G2 F20 HRTEM (200 kV) microscope (Fei Company, Hillsboro, Oregon).
The electrocatalyst composition was analyzed by energy dispersive X-ray spectroscopy (EDX) from IXRF System Inc., model 500 Digital Process (Houston, TX, USA) using a scanning electron microscope (SEM), model EVO 50 (Cambridge, UK).
Diffraction patterns were obtained on an X-ray diffractometer (D5005 from Siemens- Munich, German) operating with Cu Kα radiation (λ = 1.5406 Å) generated at 40 kV and 40 mA. The following parameters were kept constant during the analyses: 2θ range = 30°–90°, step = 0.01° s−1, and total analysis time = 100 min. XRD data were corrected by the background and refined by fitting the experimental angular range of interest to the pseudo-Voigt1 function per crystalline peak with a computer refinement program (Profile Plus Executable, Siemens AG, Munich, German). The crystallite size was estimated by using Scherrer’s equation [51 ]. The electrocatalyst morphology was also investigated by Transmission Electron Microscopy (TEM) using an FEI TECNAI G2 F20 HRTEM (200 kV) microscope (Fei Company, Hillsboro, Oregon).
4
X-Ray Diffraction Analysis of Steel Phases
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For self-containing information, X-ray diffraction analysis was made to determine phases in the steel using a Siemens diffractometer (D5005) with Cu Ka radiation.
5
X-ray Powder Diffraction Analysis
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XRPD patterns were recorded at room temperature on a Siemens D5005 diffractometer in Bragg–Brentano geometry. Data were collected with CuKα radiation in the range from 5° to 50° 2θ with a step size of 0.02°. Finely ground samples (crystalline or glassy) were deposited on a glass holder or a single crystal zero background sample holder made of silicon (cut along the (610) plane). For phase identification, structureless profile fits (Pawley method64 (link)) were performed with the TOPAS academic v6 software92 (link).
6
Quantitative Phase Characterization of Cements
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The qualitative and quantitative phase composition of the cement raw powder and of both formulations (MPC_22.5 and MPC_25) after 3 h of setting was determined via X-ray diffraction analysis (XRD). Cuboid samples (12 mm × 6 mm × 6 mm) of set cements were ground with a pestle and mortar and an X-ray diffractometer D5005 (Siemens, Karlsruhe, Germany) with a Cu-K∝ radiation, a 40 kV voltage and 40 mA current were used. A 2 theta range from 20° to 40°, a step size of 0.01° and a scan rate of 1.5 s/step were applied. For the qualitative analysis, the measurement curves were compared with Joint Committee on Powder Diffraction Standards (JCPDS) reference curves. Further quantitative analysis was done by Rietveld refinement analysis with the software Topas 2.0 (Siemens, Karlsruhe, Germany).
7
Comprehensive Material Characterization
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Commercial
chemicals used in reactions were purchased without purification. Elemental
analyses were performed with a PerkinElmer 240C elemental analyzer.
PXRD patterns were gathered by a Siemens D5005 diffractometer with
Cu Kα (λ = 1.5418 Å) radiation ranging from 5°
to 80° at 293 K with a rate of 5 min–1. A JY
LabRam HR 800 was utilized for the Raman spectra. A SU8000 ESEM FEG
microscope was utilized to obtain the interrelated energy dispersive
X-ray detector (EDX) spectra. The N2 sorption tests were
measured on automatic volumetric adsorption equipment (Belsorp mini
II). TEM was accomplished on a JEOL-2100F transmission electron microscope.
chemicals used in reactions were purchased without purification. Elemental
analyses were performed with a PerkinElmer 240C elemental analyzer.
PXRD patterns were gathered by a Siemens D5005 diffractometer with
Cu Kα (λ = 1.5418 Å) radiation ranging from 5°
to 80° at 293 K with a rate of 5 min–1. A JY
LabRam HR 800 was utilized for the Raman spectra. A SU8000 ESEM FEG
microscope was utilized to obtain the interrelated energy dispersive
X-ray detector (EDX) spectra. The N2 sorption tests were
measured on automatic volumetric adsorption equipment (Belsorp mini
II). TEM was accomplished on a JEOL-2100F transmission electron microscope.
8
Characterization of Novel Organic Compounds
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Commercially available reagent-grade chemicals were used as received without any further purification unless mentioned. IR spectra were recorded on a FTS165 Bio-Rad FTIR spectrometer by using KBr pellets in the range 4000–400 cm−1. Elemental analysis (C, H and N) was carried out using an Elementar Vario Micro Cube instrument at the Elemental Analysis Lab, CMMAC, Department of Chemistry, National University of Singapore. Thermogravimetric analysis (TGA) was performed under N2 atmosphere with a heating rate of 5°C min−1 on a SDT 2960 Thermal analyzer. NMR spectra were recorded on a 300 MHz Bruker Avance 300 FT-NMR spectrometer by calibrating the residual solvent as the reference in DMSO-d6 solution. The powder X-ray diffraction (PXRD) patterns were recorded on a Siemens D5005 diffractometer with graphite monochromated Cu Kα radiation (λ = 1.54056 Å) at 298 K.
9
X-Ray Diffraction Analysis of Films
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An X-ray diffractometer (AXS Analytical X-Ray, Siemens D 5005, Germany) was used to recorde X-ray diffractogram (XRD) patterns of films. After locating samples inside a frame, the reflected beam was measured by radiation from a copper anticathode with CuKα = 1.54178 Å wavelength at 40 mA current and voltage of 40 kV in the range of 2θ = 10–100°.
10
Angular Distribution of WAXS Photons
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The angular distribution of photons scattered at WAXS region was measured using a powder diffractometer Siemens D5005 operating in back-reflection mode. The x-ray tube working at 40 kV and 30 mAs was equipped with a Cu anode (Kα = 8.04keV) and Ni added filtration. A compensating divergence slit was used to keep the irradiated area constant at 6 mm × 10 mm. Moreover, a Söller slit was positioned between the compensating divergence slit and the sample, located on the central axis of the goniometer system, in order to minimize incident beam divergence. Between the sample and the detector system, other sets of Söller and compensating divergence slit were used to allow measurements within a small angular range around the desired scattering angle. The detector system consisted of a graphite monochromator and a scintillation detector of NaI. The monochromator was in order to accept scattered photons with the Kα energy of Cu and to exclude others energies (like Compton in large angle and multiple scatter). Scattering angles from 4° up to 72° were scanned in steps of 1/3°, corresponding to q-range between 2.84 nm−1 and 47.90 nm−1. A counting time of 30 s for each angular position was selected in order to provide a statistical uncertainty of less than 3%.
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