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Ram hr800

Manufactured by Horiba
Sourced in United States, France

The RAM HR800 is a high-resolution Raman microscope designed for advanced materials analysis. It features a modular architecture and a range of interchangeable excitation lasers to enable flexibility in various applications.

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6 protocols using ram hr800

1

Structural and Optical Characterization of Nanoparticles

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Structural
analysis of fabricated nanoparticles was done using Bruker d8 (Cu–Kα,
1.54 Å) X-ray diffraction (XRD). The morphology and elemental
composition of nanoparticles were collected by a scanning electron
microscope (SEM), Hitachi SU-70. Optical investigation was carried
out using a ultraviolet–visible (UV–vis) dual beam spectrophotometer,
Lambda 25, PerkinElmer. Fourier transform infrared (FTIR) spectroscopy
was carried out using PerkinElmer spectrum 2. A Horiba RAM-HR800 microscope
fitted with a HE-Cd UV laser (29 mW power, 400 nm) was used to perform
photoluminescence (PL) measurements. Electrical analysis was carried
out using the NANO–CHIP Reliabilty grade Hall effect system;
the nanoparticles were coated on glass substrates of 1 cm2 area and contact was made by indium metal at four corners.
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2

Multifaceted Characterization of Nanomaterials

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The structure characterization condition is similar to our previous work10 (link). XRD was carried out with a Bruker AXS D8 Advance X-ray Powder Diffractometer operated at 1600 W power (40 kV, 40 mA) using Cu Kα radiation. Transmission electron microscopy (TEM) were performed on an HT7700 Exalens operated at 120 kV. High-resolution TEM observation was carried out with a Tecnai G2 F20 S-Twin microscopy operated at 200 kV. Scanning electron microscopy (SEM) was carried out on a Phenom Prox operated at 15 kV. Raman spectrum was performed with a Jobin Yvon Lab RAM HR800 equipped with a 514 nm laser.
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3

Comprehensive Characterization of GaN Nanowires

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The structural
characteristics of GaN NWs were studied using XRD [PAN analytical
X’Pert PRO]. The surface morphologies of the NWs were investigated
using OM [Carl Zeiss Aixoscope], AFM [Park XE-100], and SEM [Zeiss
EVO 18]. The elemental maps were recorded using EDX which revealed
the elemental distributions in the GaN NWs. The surface compositions
of the samples were obtained using XPS [AXIS ULTRA]. The luminescence
properties of the GaN NWs grown on E′ and E″ were analyzed using CL spectroscopy [Ultra 55].
The luminescence properties of the GaN grown on c-plane sapphire substrates by the MOCVD technique was analyzed using
PL spectroscopy with an excitation wavelength of 244 nm using Ar+ laser. The optical property of the samples was investigated
using Raman spectroscopy [HORIBA Jobin Yvon Lab RAM HR 800].
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4

Characterization of CS-PPy Nanocomposites

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The absorption spectrum of CS–PPy NCs and IR-CS–PPy NCs was discovered using UV–Vis spectroscopy (Thermo Biomate 5 Spectrophotometer). The structure of the synthesized CS–PPy NCs was studied through X-ray diffraction (XRD) patterns in the step-scan mode using a Philips X'Pert-MPD PW 3050 diffractometer with Cu Kα (40 kV, 30 mA). Fourier transform infrared spectroscopy (FTIR, Perkin Elmer Inc., USA) and Raman spectroscopy (Horiba Jobin Yvon RAM HR800) with frequencies ranging from 4000 to 400 cm−1, were used to investigate the functional and structural groups. The CS–PPy NCs and IR-CS–PPy NCs' size and composition were characterized using field emission transmission electron microscopy (FE-TEM; JEM-2100F, JEOL, Japan). The working condition for FE-TEM was maintained as follows: TEM lattice resolution at 200 kV was 0.1 nm, with probe current: 2.5 nA at 0.7 nm of probe diameter (pressure 1 × 10−8 Pa).
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5

Characterization of Hierarchical Porous Carbon

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A field-emission scanning electron microscope (FESEM, JEOL6330, Tokyo, Japan) with an acceleration voltage of 80 kV was utilized to examine the microstructures of the as-prepared micropore/mesopore/macropore hierarchical porous carbon materials. The Brunauer–Emmett–Teller (BET) surface area, Barrett–Joyner–Halenda (BJH) mesopore area, t-plot micropore area and N2 adsorption–desorption isotherms were measured with a Micrometrics ASAP 2020 instrument (Micrometrics, Atlanta, Georgia, U.S.). The Raman spectrum was determined using a Jobin–Yvon Lab Ram HR800 (HORIBA Jobin Yvon Inc., Paris, France) Raman spectroscope equipped with a 514.5 nm laser source. X-ray photoelectron spectroscopy (XPS, ULVAC–PHI, PHI 5000, Chigasaki, Japan) patterns were obtained using a monochromatic Al-anode X-ray gun. A binding energy of 284.6 eV for C was used to calibrate the charge-shifted energy scale. The spectra were deconvoluted for chemical identification using 100% Gaussian peaks.
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6

Comprehensive Characterization of N-Doped Carbon Porous Composites

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The microscopic morphologies and crystal structure of the NCPCs samples were characterized through scanning electron microscopy (SEM, JSM-6700), transmission electron microscopy (TEM, JEM-2010) and X-ray powder diffraction (PXRD, Bruker D8) between 10° and 70°, respectively. The structure effect of N-doping on the NCPC samples were characterized by the Raman spectrophotometer (Horiba JobinYvon Lab RAMHR800) at 633 nm. The pore structure of NCPC samples were analyzed by argon adsorption–desorption (BET, Micromeritics ASAP 2460, 87.28 K) experiments and the non-local density functional theory (NLDFT). The surface information for NCPCs samples were carried out by X-ray photoelectron spectroscopy (XPS, PHI 3057). The impurity contents for NCPCs samples were recorded by Thermogravimetric analysis (TGA, NETZSCH STA449F3 analyser).
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