analysis of fabricated nanoparticles was done using Bruker d8 (Cu–Kα,
1.54 Å) X-ray diffraction (XRD). The morphology and elemental
composition of nanoparticles were collected by a scanning electron
microscope (SEM), Hitachi SU-70. Optical investigation was carried
out using a ultraviolet–visible (UV–vis) dual beam spectrophotometer,
Lambda 25, PerkinElmer. Fourier transform infrared (FTIR) spectroscopy
was carried out using PerkinElmer spectrum 2. A Horiba RAM-HR800 microscope
fitted with a HE-Cd UV laser (29 mW power, 400 nm) was used to perform
photoluminescence (PL) measurements. Electrical analysis was carried
out using the NANO–CHIP Reliabilty grade Hall effect system;
the nanoparticles were coated on glass substrates of 1 cm2 area and contact was made by indium metal at four corners.