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Pxrd 7000

Manufactured by Shimadzu

The PXRD-7000 is a powder X-ray diffractometer designed for materials analysis. It provides high-quality data for identification and characterization of crystalline materials. The instrument features advanced optics and a high-performance detector to deliver precise and reliable results.

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3 protocols using pxrd 7000

1

Characterization of AM-CuNPs Nanomaterials

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The ultraviolet visible spectrum of the samples was scanned in the 250–650 nm range using a Shimadzu UV-2600 spectrophotometer (Shimadzu Corporation, Tokyo, Japan), and the optical density of the NP solution against the AM plant extract was recorded.
The nanostructure of the synthesized copper materials was analyzed by a scanning electron microscope (SEM, Carl Zeiss, Jena, Germany) with energy dispersive X-ray spectroscopy (XPS, ZEISS, Oxford Instruments, Abingdon, UK) to evaluate the elemental composition of the NPs.
A transmission electron microscope with high-resolution (HR-TEM, JEOL 2100, Peabody, MA, USA) was used to analyze the structure of the synthesized AM-CuNPs.
The Fourier transform infrared (FT-IR) spectra (FT-IR PerkinElmer, Yokohama, Japan) were recorded using the attenuated total reflection (ATR, Blagnac, France) method in the 4000–400 cm−1 range at room temperature.
An X-ray diffractometer (XRD-Shimadzu, PXRD-7000) equipped with CuKa (1.54060A) as the incident light was used to measure the crystalline nature of the AM-CuNPs.
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2

Multitechnique Characterization of Samples

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The optical studies of samples were recorded by Ultraviolet-visible spectrophotometer (Perkin Elmer Lamda-35). The structural analysis of samples was carried out using Shimadzu X-ray diffractometer (PXRD-7000) using Cu Ka radiation (k =1.541 Å). The determination of functional groups for the samples using the Perkin Elmer Spectrum BX FT-IR system. The modes of vibrations of samples were analyzed by using HORIBA Lab Ram HR800 spectrometer with recorded at several different spots in backscattering geometry using 514.5 nm Ar + laser. The morphological features of samples were carried out on using Scanning Electron (SEM- Hitachi-3000 model).
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3

Characterization of ZnO Nanoparticles from Capsicum annuum

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All chemicals were purchased from Sigma-aldrich and Merck and used without purification. The pathogenic bacterial strains were procured from National chemical laboratory Pune, India. The Capsicum annuum fruits were collected from local market, Tumakuru district, Karnataka, India. TLC analysis was carried out using pre-coated silica gel F 254 . The phase identity and crystalline size of ZnO NPs were characterized through shimadzu powder X-ray diffractometer (PXRD-7000). IR spectra were re-Lalithamba et al.: Capsicum annuum Fruit Extract: ... corded on Bruker Alpha-T FT-IR spectrometer (KBr windows, 2 cm -1 resolution), SEM analysis on Hitachi-7000 Scanning Electron Microscopy and elemental analysis was obtained from energy dispersive X-ray diffraction (EDX). UV-Vis diffused reflectance spectra were analyzed through Lambda-35 (Parkin Elmer) spectrophotometer. Mass spectra were recorded on a Micromass Q-ToF Micro Mass Spectrometer. Melting points were taken on open capillaries, 1 H NMR, and 13 C NMR spectra of the formamide derivatives were done on a Bruker AMX 400 MHz spectrometer using Me 4 Si (tetramethylsilane) as an internal standard and CDCl 3 (deuterated chloroform) as a solvent.
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