The nanostructure of the synthesized copper materials was analyzed by a scanning electron microscope (SEM, Carl Zeiss, Jena, Germany) with energy dispersive X-ray spectroscopy (XPS, ZEISS, Oxford Instruments, Abingdon, UK) to evaluate the elemental composition of the NPs.
A transmission electron microscope with high-resolution (HR-TEM, JEOL 2100, Peabody, MA, USA) was used to analyze the structure of the synthesized AM-CuNPs.
The Fourier transform infrared (FT-IR) spectra (FT-IR PerkinElmer, Yokohama, Japan) were recorded using the attenuated total reflection (ATR, Blagnac, France) method in the 4000–400 cm−1 range at room temperature.
An X-ray diffractometer (XRD-Shimadzu, PXRD-7000) equipped with CuKa (1.54060A) as the incident light was used to measure the crystalline nature of the AM-CuNPs.