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Merlin field emission scanning electron microscope fe sem

Manufactured by Zeiss
Sourced in Germany

The MERLIN Field Emission Scanning Electron Microscope (FE-SEM) is a versatile instrument designed for high-resolution imaging and analysis of a wide range of materials and samples. It utilizes a field emission electron source to produce a finely focused electron beam, enabling high-resolution imaging at low accelerating voltages. The MERLIN FE-SEM offers advanced capabilities for topographical, compositional, and structural characterization of specimens.

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6 protocols using merlin field emission scanning electron microscope fe sem

1

Zircon Grain Preparation and Imaging

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Zircon grains were mounted in an epoxy mould that was ground down and then polished using a 3-micron pad followed by 1-micron pad to finish and a 1-micron diamond paste on a Struers Rotopol-35 equipment to expose grain interior. The mould was gold coated using an Edwards S150A sputter coater. Cathodoluminescence (CL) and backscatter (BS) images were obtained with a Zeiss MERLIN Field Emission Scanning Electron Microscope (FE-SEM). The CL images were used to identify different internal zoning patterns within the individual zircon grains (core and rim); whereas the BSE images were used to constrain the ablated spots to avoid parts with fractures and holes which could affect the quality of results.
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2

Ultrastructural Protein Morphometry

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Ultrastructural morphometry of
proteins at the nearly native state was assessed with two high-resolution
techniques. Sample drops (5 μL) were deposited on silicon wafers
(Ted Pella Inc.) for 2 min, air-dried, and immediately observed without
coating with a Merlin field emission scanning electron microscope
(FESEM) (Zeiss), operating at 1 kV and equipped with a high-resolution
in-lens secondary electron detector. Representative images of general
fields and nanostructure details were captured at two high magnifications
(150000× and 400000×). Drops (5 μL) of the same samples
were deposited for 2 min on 200 mesh copper grids coated with carbon,
contrasted with 2% uranyl acetate for 2 min, air-dried, and observed
with an H-7000 transmission electron microscope (TEM) (Hitachi) equipped
with a CCD Gatan ES500W Erlangshen camera (Gatan). Representative
images of general fields and nanostructure details were captured at
two high magnifications (70000× and 200000×).
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3

Characterization of Functionalized CNT Materials

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The functionalized CNT materials were characterized using various techniques to confirm the microstructure and crystalline structure of the imidazole derivative functional groups. The chemical functional groups were studied by using a Fourier transform infrared (FTIR) spectrometer (model 65). The crystalline structure of the composite materials was studied using a Bruker 68 X-ray diffractometer (XRD), and the microstructures were studied by using a MERLIN field emission scanning electron microscope (FE-SEM) from Carl Zeiss and operated at 3.1 kV, and using a Techanic 500 G2 transmission electron microscope (TEM) at 200 kV. The carbon disorder was analysed by using a Wintech confocal Raman spectrometer at a laser wavelength of 450 nm.
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4

Structural Characterization of Compounds

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The structures of the compounds were determined using a Fourier-transform infrared spectroscopy Nicolet 6700 spectrometer (Thermo Electron Scientific Instruments Corporation, Madison, WI, USA) equipped with a model 300 photoacoustic cell (FTIR-PAS) (MTEC Photoacoustics, Inc., Oakland, California, USA) and an attenuated total reflection Fourier-transform infrared spectroscopy (ATR-FTIR) instrument (4300 Handheld FTIR, Agilent Technologies, USA). The surface morphologies were obtained using a MERLIN field emission-scanning electron microscope (FE-SEM) (Carl Zeiss Microscopy GmbH, Jena, Germany), and the surface elemental compositions and distribution were analyzed using a Thermo Fisher 250Xi X-ray photoelectron spectrometer (XPS) and an energy-dispersive spectroscopy (EDS) detector attached to the SEM. The powder X-ray diffraction (PXRD) data were collected in the 5–80° range using an ARL X'TRA diffractometer (Thermo Electron Corporation, Switzerland). The elemental compositions were measured by laser-induced breakdown spectroscopy (LIBS) with a MobiLIBS system (IVEA, France), an iCAP 7000 inductively-coupled plasma optical emission spectrometer (ICP-OES, Thermo Fisher Scientific, USA), and a CHN-O-Rapid elemental analyzer (Heraeus, Germany).
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5

Scanning Electron Microscopy of Organogels

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Electron microscopy images were obtained with a Merlin field emission scanning electron microscope (FESEM, resolution = 0.8 mm resolution, Carl Zeiss, Jena, Germany) equipped with a digital camera and operating at 10 kV (accelerating voltage) and 10 mA (emission current). The sample was prepared by freeze-drying the corresponding organogel. Prior to imaging, a 5 nm sized Pt film was sputtered (40 mA, 30 s) on the sample placed on carbon tape.
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6

Morphological Analysis of Lignin Hydrogels

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Scanning electron microscopy (SEM) of selected hydrogel samples was performed to investigate their morphology. Lignin hydrogels were first placed into deionized water to equilibrium at room temperature. Then, the samples were frozen at -40ºC for 24 h and freeze-dried in a Beta 1-8 LDplus freeze drier (Martin Christ, Osterode am Harz, Germany) under vacuum at -42ºC for 48 h. Before SEM observation, specimens of the hydrogels were sputter coated with a thin layer of platinum. SEM analysis was performed with a Zeiss Merlin field emission scanning electron microscope (FE-SEM)
with an on-axis in-lens secondary electron detection mode and a chamber secondary electron detection mode.
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