Merlin field emission scanning electron microscope fe sem
The MERLIN Field Emission Scanning Electron Microscope (FE-SEM) is a versatile instrument designed for high-resolution imaging and analysis of a wide range of materials and samples. It utilizes a field emission electron source to produce a finely focused electron beam, enabling high-resolution imaging at low accelerating voltages. The MERLIN FE-SEM offers advanced capabilities for topographical, compositional, and structural characterization of specimens.
Lab products found in correlation
6 protocols using merlin field emission scanning electron microscope fe sem
Zircon Grain Preparation and Imaging
Ultrastructural Protein Morphometry
proteins at the nearly native state was assessed with two high-resolution
techniques. Sample drops (5 μL) were deposited on silicon wafers
(Ted Pella Inc.) for 2 min, air-dried, and immediately observed without
coating with a Merlin field emission scanning electron microscope
(FESEM) (Zeiss), operating at 1 kV and equipped with a high-resolution
in-lens secondary electron detector. Representative images of general
fields and nanostructure details were captured at two high magnifications
(150000× and 400000×). Drops (5 μL) of the same samples
were deposited for 2 min on 200 mesh copper grids coated with carbon,
contrasted with 2% uranyl acetate for 2 min, air-dried, and observed
with an H-7000 transmission electron microscope (TEM) (Hitachi) equipped
with a CCD Gatan ES500W Erlangshen camera (Gatan). Representative
images of general fields and nanostructure details were captured at
two high magnifications (70000× and 200000×).
Characterization of Functionalized CNT Materials
Structural Characterization of Compounds
Scanning Electron Microscopy of Organogels
Morphological Analysis of Lignin Hydrogels
with an on-axis in-lens secondary electron detection mode and a chamber secondary electron detection mode.
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