X-ray powder diffraction (XRD) studies of the various materials were conducted at low and high angle using a PW 150 (Philips) with Ni filtered Cu Kα radiation (λ = 1.540 Å), operated at 40 kV and 30 mA. The scanning was completed for 2θ angles from 1 to 80, with a step time of 2 s and a step size of 0.02.
Pw 150
Manufactured by Philips
The PW 150 is a laboratory equipment product manufactured by Philips. It is designed to perform fundamental tasks required in laboratory settings. The core function of the PW 150 is to provide reliable and accurate measurements for research and analytical purposes.
Automatically generated - may contain errors
5 protocols using pw 150
1
XRD Analysis of Material Composition
2
Comprehensive Characterization of MOF Materials
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The FTIR spectra were measured using Thermo SCIENTIFIC (NICOLET iS10) FTIR spectrometer from Thermo Electron Corporation in the range 400–4000 cm−1 for a sample of 2 mg diluted with 200 mg KBr. Powder X-ray diffraction was performed using PW150 (Philips) using Cu Kα radiation source and Ni filter. The instrument was operated at a voltage of 40 kV and a current of 45 mA. TEM (transmission electron microscopy) images were obtained using a JEOL-JEM-2100 transition-electron-microscope. SEM (scanning electron microscopy) and EDS (energy dispersive X-ray spectroscopy) images for surface morphological evaluation and composition were obtained using JEOL-JSM-6510LV scanning-electron-microscope, Japan. The porosity of the MOF materials and BET surface area are examined by N2 adsorption/desorption analysis at −196 °C.
3
Characterization of Modified Photocatalysts
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The chemical
structure and the crystal composition of pure and modified photocatalysts
were confirmed using a FTIR (Nicolet Magna-IR 550) spectrometer with
a resolution of 4 cm–1 and 128 scans in the region
of 400–4000 cm–1. XRD patterns for all the x wt % Ag QDs/CTS–PEO samples were recorded using
a PW150 (Philips) with a Cu (Kα)-XR-radiation source (λ
= 0.1541 nm) at 40 kV and 45 mA. The purity, morphology, and particle
size of the as-prepared CTS–PEO blend and x wt % Ag QDs/CTS–PEO samples were measured by TEM (JEOL-JEM-2100).
The optical properties and the band gap of the as-prepared composites
were obtained using UV/visible diffuse reflectance spectroscopy (ATi
Unicam-UV/visible vision software V3.20). The actual contents of Ag
NPs supported on CTS–PEO were measured by the inductively coupled
plasma-atomic absorption spectroscopy (ICP-AES; Labtam, 8440 Plasmalab)
technique.
structure and the crystal composition of pure and modified photocatalysts
were confirmed using a FTIR (Nicolet Magna-IR 550) spectrometer with
a resolution of 4 cm–1 and 128 scans in the region
of 400–4000 cm–1. XRD patterns for all the x wt % Ag QDs/CTS–PEO samples were recorded using
a PW150 (Philips) with a Cu (Kα)-XR-radiation source (λ
= 0.1541 nm) at 40 kV and 45 mA. The purity, morphology, and particle
size of the as-prepared CTS–PEO blend and x wt % Ag QDs/CTS–PEO samples were measured by TEM (JEOL-JEM-2100).
The optical properties and the band gap of the as-prepared composites
were obtained using UV/visible diffuse reflectance spectroscopy (ATi
Unicam-UV/visible vision software V3.20). The actual contents of Ag
NPs supported on CTS–PEO were measured by the inductively coupled
plasma-atomic absorption spectroscopy (ICP-AES; Labtam, 8440 Plasmalab)
technique.
4
Comprehensive Characterization of Prepared Samples
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
FT-IR spectra were measured on the Thermo SCIENTIFIC (NICOLET iS10). The samples were mixed with dry KBr to be analyzed and then scanned from 400 to 4000 cm−1. XRD patterns were collected on a PW 150 (Philips) using Ni-filtered Cu Kα radiation (λ = 1.540 Å) from 2θ of 4 to 80° at 40 kV. The morphology and the elements of the prepared samples were examined via SEM (Scanning Electron Microscopy) and EDX (Energy-Dispersive X-ray Spectroscopy) analysis with the JEOL (Model JSM-6510LV SEM) scanning electron microscope. Before the analysis the samples were coated with gold. To study the binding energies, X-ray photoelectron spectroscopic (XPS) was collected on K-alpha (Thermo Fisher Scientific, USA) with monochromatic X-ray Al K-alpha radiation (−10 to 1350 eV). The surface area of the prepared catalysts was determined by nitrogen adsorption measurement apparatus at −196 °C after degassing at 250 °C for 4 h under a pressure of 10−5 torr.
5
Comprehensive Characterization of Photocatalysts
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The
X-ray diffraction (XRD) pattern of the prepared samples was examined
using a PW 150 (Philips) instrument with Cu Kα radiation. The
crystallite size was calculated from the Debye–Scherrer formula.15 (link) Transmission electron microscopy (TEM) (JEOL
JEM-2100) and scanning electron microscopy (SEM) (JEOL JSM-6510LV)
were used to examine the surface morphology of the prepared photocatalysts.
Fourier transform infrared (FTIR) spectra were conducted on a PerkinElmer
system 2000 with the KBr-disc technique, and the spectra were recorded
in the region of 400–4000 cm–1. N2 adsorption–desorption was studied at 77 K using a BELSORP-mini
II instrument and used to estimate pore size distribution and surface
area (SBET) of the prepared photocatalysts.
A Thermo ESCALAB 250Xi spectrometer with a monochromatic Al Kα
(1486.6 eV) radiation was used to measure the sample contents with
its oxidation state. Photoluminescence (PL) spectra of the sample
were examined over an FP-6500 fluorescence spectrophotometer with
an excitation wavelength of 315 nm. A PerkinElmer LAMBDA 950 spectrophotometer
was used to study UV–vis diffuse reflectance spectra.
X-ray diffraction (XRD) pattern of the prepared samples was examined
using a PW 150 (Philips) instrument with Cu Kα radiation. The
crystallite size was calculated from the Debye–Scherrer formula.15 (link) Transmission electron microscopy (TEM) (JEOL
JEM-2100) and scanning electron microscopy (SEM) (JEOL JSM-6510LV)
were used to examine the surface morphology of the prepared photocatalysts.
Fourier transform infrared (FTIR) spectra were conducted on a PerkinElmer
system 2000 with the KBr-disc technique, and the spectra were recorded
in the region of 400–4000 cm–1. N2 adsorption–desorption was studied at 77 K using a BELSORP-mini
II instrument and used to estimate pore size distribution and surface
area (SBET) of the prepared photocatalysts.
A Thermo ESCALAB 250Xi spectrometer with a monochromatic Al Kα
(1486.6 eV) radiation was used to measure the sample contents with
its oxidation state. Photoluminescence (PL) spectra of the sample
were examined over an FP-6500 fluorescence spectrophotometer with
an excitation wavelength of 315 nm. A PerkinElmer LAMBDA 950 spectrophotometer
was used to study UV–vis diffuse reflectance spectra.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!