Omincpicta 8

Relevant compositional information on the MAPLE processed materials was pro-vided by IRM analysis, which was made using a Nicolet iN10 MX FT-IR microscope (Thermo Fischer Scientific Company, Waltham, MA, USA). Measurements were recorded between 4000 and 700 cm⁻¹ at 4 cm⁻¹ resolution, in the reflection mode. Thirty-two scans were collected for each sample, then co-added and converted to absorbance using the OmincPicta 8.0 software (Thermo Fischer Scientific).

Relevant compositional, structural, and morphological aspects of the MAPLE-processed samples were provided by complementary infrared microscopy (IRM) and scanning electron microscopy (SEM) investigations.
A Nicolet iN10 MX FT-IR microscope from Thermo Fischer Scientific (Waltham, MA, USA) was used for IRM analysis to collect IR spectra and IR maps. The scans (32 measurements per sample) were recorded in the transmission mode in the 4000–750 cm⁻¹ wavenumber range (with 4 cm⁻¹ resolution), and then processed with the OmincPicta 8.0 software (Thermo Fischer Scientific).
For SEM investigation, Inspect S equipment from FEI Company (Thermo Fischer Scientific, Hillsboro, OR, USA) was used. Micrographs were collected using the secondary electron beam with 30 keV after capping all samples with a thin conductive layer.

IRM analysis, which included the collection of complementary Fourier-transform infrared spectroscopy (FT-IR) spectra and infrared maps, was performed to investigate the stoichiometry and composition, as well as to evaluate the laser transfer efficiency of all nanostructured coatings obtained by MAPLE, respectively. A Nicolet iN10 MX FT-IR microscope (Thermo Fischer Scientific Company, Waltham, MA, USA), operated in the transmission mode in the 5000–500 cm⁻¹ wavenumber range, was used in this respect. The scans (40 individual measurements/each sample) were collected at 4 cm⁻¹ resolution, and they were further processed using the OmincPicta 8.0 software (Thermo Fischer Scientific Company).