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Jsm 6010la intouchscope microscope

Manufactured by JEOL

The JSM-6010LA InTouchScope is a scanning electron microscope (SEM) designed for high-quality imaging and analysis of a wide range of samples. It features a compact and user-friendly design, making it suitable for both laboratory and industrial settings. The JSM-6010LA InTouchScope provides high-resolution imaging capabilities, enabling detailed examination of surface topography and microstructural features.

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2 protocols using jsm 6010la intouchscope microscope

1

Comprehensive Material Characterization Protocol

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Powder X-Ray diffraction patterns were recorded using Bruker-AXS D5005 with Co- radiation.
N2-physisorption experiments were carried out at 77 K in a TriStar II unit gas adsorption analyser (Micromeritics). Prior to the measurements the samples were degassed at 423 K under vacuum for 16 h. The BET areas were calculated using intervals allowing positive BET constants38 . The total pore volumes were calculated at 0.9 relative pressure.
Scanning electron microscopy (SEM) was carried out using a JEOL JSM-6010LA InTouchScope microscope.
Thermogravimetric analysis was performed by means of Mettler Toledo TGA/SDTA851e, under an air flow of 60 ml min−1 at a heating rate of 10 K min−1 up to 1073 K.
Diffuse reflectance UV/Vis spectra were collected using a Perkin–Elmer Lambda 900 spectrophotometer equipped with an integrating sphere (“Labsphere”) in the 200–800 nm range. BaSO4 was used as a white standard.
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2

SEM Imaging of BILP-101x Films

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SEM micrographs of the freestanding film were acquired using a JEOL JSM-6010LA InTouchScope microscope. The images of the supported membranes were obtained using a DualBeam Strata 235 microscope (FEI) and an AURIGA Compact (Zeiss) microscope. Before the analyses, BILP-101x films and supported membranes were sputter-coated with gold.
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