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Escalab 250xi electron spectrometer

Manufactured by Thermo Fisher Scientific
Sourced in United States

The ESCALAB 250Xi is an electron spectrometer designed for surface analysis applications. It utilizes X-ray photoelectron spectroscopy (XPS) to provide detailed information about the elemental composition, chemical state, and electronic structure of material surfaces. The instrument features advanced vacuum technology, high-performance electron optics, and a versatile design to enable comprehensive surface analysis across a wide range of sample types and research areas.

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15 protocols using escalab 250xi electron spectrometer

1

Comprehensive Materials Characterization Techniques

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Crystal structures of the samples were characterized by X-ray diffractometer (Maxima-X XRD-7000) and Cu K-alpha radiation (λ = 1.5406 nm) over the 2θ range of 10°–60°. Morphology and microstructures of the as-prepared products were examined by field-emission scanning electron microscopy (FESEM, JSM-7800N) and transmission electron microscopy (TEM, JEM-2100). Raman spectra were obtained using a HORIBA Scientific LabRAM HR Raman spectrometer system equipped with a 532.4 nm laser as the exciting radiation. The weight percent of sulfur was determined by thermogravimetric analyzer (TGA, Q50). X-ray photoelectron spectroscopy (XPS) measurements were performed on a Thermo Scientific ESCALAB 250Xi electron spectrometer. Nitrogen adsorption−desorption isotherms and pore size distribution were characterized by Quadrasorb evo 2QDS-MP-30 (Quantachrome Instruments, USA).
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2

Scanning Electron Microscopy and XPS Analysis

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The morphology of the materials was observed by a Sigma field emission scanning electron microscope (Zeiss, Germany). X-ray photoelectron spectroscopy measurement was performed on an ESCALAB 250Xi electron spectrometer (Thermo Scientific, Waltham, MA, USA) using a radiation source of Al Kα radiation with the energy of 1486.6 eV.
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3

EPDM Aging and Characterization Protocol

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The gas mixture after aging tests were collected and analyzed using
GC–MS (Shimadzu QP2010 Ultra). The column type is CP-Sil5CB
(60 m × 8 μm × 0.32 mm). Both the SCAN and SIM method
were used to detect the gas components. The heating scheme of the
GC is listed as follows: (1) Keep the column at 32 °C for 10
min. (2) Heat the column to150 °C at the rate of 60 °C/min
and retain it for 2 min. The gas component is confirmed based on the
NIST (National Institute of Standards and Technology) standard database
and standard gases.
The morphology of the EPDM was analyzed
using a Zeiss SIGMA field-emission scanning electron microscope manufactured
by Carl Zeiss. Moreover, the components of the EPDM surface were detected
by XPS (ESCALAB250Xi electron spectrometer manufactured by Thermo
Fisher Scientific of United States).
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4

Comprehensive Characterization of Nanomaterials

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All ultraviolet-visible (UV-Vis) absorption spectra were recorded using a UV-7504 UV-Vis spectrophotometer (Shanghai Xinmao). Fluorescence spectra were obtained on a fluorescence spectrophotometer (F97, Shanghai Lingguang). X-ray photoelectron spectroscopy (XPS) was performed on an ESCALAB 250 XI electron spectrometer (Thermo). The fluorescence lifetime was determined on a FL920 time-correlated single-photon-counting fluorescence lifetime spectrometer (Edinburgh Analytical Instruments, Edinburgh, U.K.). Transmission electron microscopy (TEM) images were obtained on a FEI Tecnai G2 F20 microscope. Dynamic light scattering (DLS) and zeta potential measurements were performed with a Malvern Zetasizer. FT-IR spectra were measured using an FT-IR spectrometer equipped with a DGTS detector (Nicolet is5/is10).
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5

Structural Characterization of Materials

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The crystal structures of the products were analyzed using a Rigaku D/max 2500V/PC X-ray diffractometer (XRD, Rigaku Corporation, Tokyo, Japan) using Cu Kα as rediation. The morphologies and nanostructures of the samples were researched using SU8010 field-emission scanning electron microscopy (FESEM, Hitachi, Ltd., Tokyo, Japan) and JEM-2100F transmission electron microscopy (TEM, JEOL Ltd., Tokyo, Japan). The Brunauer–Emmett–Teller (BET) special surface area of the sample was researched using the N2 adsorption–desorption isotherms on a Micromeritics Autosorb-iQ apparatus (Quantachrome Inc., Florida, FL, USA). The X-ray photoelectron spectra (XPS, Thermo Fisher Scientific Inc., Massachusetts, MA, USA) were researched using a Thermo ESCALAB 250XI electron spectrometer.
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6

Comprehensive Structural and Compositional Analysis

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A field emission scanning electron microscope (FEI Magellan 400L XHR) was used for obtaining the scanning electron microscopy (SEM) images. A Titan G2 60–300 Cs-corrected transmission electron microscopy (TEM) was used for TEM, high-resolution TEM (HRTEM), high angle annular dark-field scanning TEM (HADDF-STEM), and energy-dispersive X-ray spectroscopy (EDS) mapping. X-ray diffraction (XRD) measurements were performed on a Bruker D8 ADVANCE X-ray diffraction diffractometer. A Thermo ESCALAB250xi electron spectrometer with an Al Kα source (1486.6 eV) as radiation source was used for X-ray photoelectron spectroscopy (XPS) measurements. A Bruker A300 spectrometer was used for acquiring the Electron Paramagnetic Resonance (EPR) spectra.
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7

Nanomaterial Characterization Techniques

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Transmission electron microscopy (TEM) image was taken on a JEM-2100 microscope (JEOL, Japan). Fourier transform infrared (FTIR) spectrum was recorded on an AVATAR 360 spectrometer (Thermo, USA). X-ray photoelectron spectroscopy (XPS) spectra were obtained on an ESCALAB 250Xi electron spectrometer (Thermo, USA). Ultraviolet-visible (UV-vis) absorption spectra and fluorescence (FL) spectra were recorded on a Lambda 365 UV-vis spectrophotometer (PerkinElmer, USA) and an F-4600 fluorescence spectrophotometer (Hitachi, Japan), respectively.
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8

Morphological and Physicochemical Analysis of Biofilm Anodes

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The morphologies were observed with a field emission scanning electron microscope (FESEM, JEOL 7800F, Tokyo, Japan) and a transmission electron microscopy (TEM, JEOL JEM-2100F, Tokyo, Japan). Before morphology observation, the biofilm adhered anodes were immersed in 4% polyoxymethylene for 12 h and then sequentially dehydrated with ethanol (30%, 40%, 50%, 60%, 70%, 80%, 90%, 100%) and dried in vacuum at room temperature overnight. The Brunauer-Emmett-Teller (BET) surfaces areas and porosity of the samples were evaluated by nitrogen sorption isotherms that measured using an automatic adsorption instrument ASAP 2020 (Micromeritics Instrument, Norcross, Georgia, United States). The thermal stability of CPC precursors was studied using Q50 TGA (TA Instruments NewCastle, DE, USA). The samples were run at the rate of 10 °C/min under nitrogen atmosphere in the range of 30–800 °C. X-ray photoelectron spectroscopy (XPS) measurements were performed on a Thermo Scientific ESCALAB 250Xi electron spectrometer (Waltham, MA, USA).
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9

Characterization of Catalytic Nanostructures

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The overall particle size and distribution of the catalysts’ morphologies were characterized by scanning electron microscopy on JSM-7800 F microscope at a working voltage of 20 kV. The crystal phases in catalyst samples were analyzed by using powder XRD on a Philips 1730 diffractometer with Cu Kα radiation (λ = 1.5406 Å). XPS was conducted using a Thermo ESCALAB 250 spectrophotometer equipped with an Al Kα line source. Atomic-resolution HAADF images of atomically dispersed Pt sites in the ternary alloy nanocubes were captured in a FEI Theims Z STEM operated at 300 kV. TEM and HR-TEM images were performed on Tecnai G2-F30 equipped with an EDS. The ICP-MS was tested on NexION 300X Spectrometer to determine the metal content in the catalyst. Ultraviolet photoemission spectroscopy (UPS) were performed on an ESCALAB 250Xi electron spectrometer (Thermo Fisher Scientific) using a monochromatic Al Kα source (300 W).
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10

Characterization of Cys-Au Nanocrystals

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Transmission electron microscope (TEM) images of Cys-Au NCs were performed by transmission electron microscope (Talos f200s, FEI, USA). The size distribution was determined by size analyzer (ZEN3690, Malvern Instruments Ltd, UK). Fluorescence spectra were recorded with an F-7000 spectrophotometer (Hi-Tech Co., Ltd, Japan). The UV-vis absorption spectra were obtained with a UV-2600 spectrophotometer (Shimadzu Co., Japan). X-ray photoelectron spectra (XPS) were measured with an ESCALAB 250Xi electron spectrometer (Thermo Fisher Scientific, Inc., USA).
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