Escalab 250xi electron spectrometer
The ESCALAB 250Xi is an electron spectrometer designed for surface analysis applications. It utilizes X-ray photoelectron spectroscopy (XPS) to provide detailed information about the elemental composition, chemical state, and electronic structure of material surfaces. The instrument features advanced vacuum technology, high-performance electron optics, and a versatile design to enable comprehensive surface analysis across a wide range of sample types and research areas.
Lab products found in correlation
15 protocols using escalab 250xi electron spectrometer
Comprehensive Materials Characterization Techniques
Scanning Electron Microscopy and XPS Analysis
EPDM Aging and Characterization Protocol
GC–MS (Shimadzu QP2010 Ultra). The column type is CP-Sil5CB
(60 m × 8 μm × 0.32 mm). Both the SCAN and SIM method
were used to detect the gas components. The heating scheme of the
GC is listed as follows: (1) Keep the column at 32 °C for 10
min. (2) Heat the column to150 °C at the rate of 60 °C/min
and retain it for 2 min. The gas component is confirmed based on the
NIST (National Institute of Standards and Technology) standard database
and standard gases.
The morphology of the EPDM was analyzed
using a Zeiss SIGMA field-emission scanning electron microscope manufactured
by Carl Zeiss. Moreover, the components of the EPDM surface were detected
by XPS (ESCALAB250Xi electron spectrometer manufactured by Thermo
Fisher Scientific of United States).
Comprehensive Characterization of Nanomaterials
Structural Characterization of Materials
Comprehensive Structural and Compositional Analysis
Nanomaterial Characterization Techniques
Morphological and Physicochemical Analysis of Biofilm Anodes
Characterization of Catalytic Nanostructures
Characterization of Cys-Au Nanocrystals
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