Raman Spectroscopy was performed on a Raman microscope alpha300R (WITec, Ulm, Germany) using a laser excitation wavelength of 532 nm, laser power of 1 mW, a spectral resolution of 6 cm−1, and integration time of 0.5 s. Two hundred scans were accumulated to record each spectrum. For this purpose, GO, PDA-GO, and RGO aqueous suspensions were prepared and sprayed on a glass slide positioned on a heating plate for fast water evaporation and deposition of the graphene products to be analyzed. The ID/IG or ID+PDA/IG+PDA ratios were calculated considering the area under curve of the bands, which were estimated with a mean error of about 10%.
Raman microscope alpha300r
Manufactured by WITec
Sourced in Germany
The Raman microscope alpha300R is a versatile and high-performance instrument designed for advanced materials analysis. It features a confocal optical design, allowing for diffraction-limited spatial resolution and high-sensitivity detection of Raman signals. The alpha300R is capable of performing Raman spectroscopy and imaging measurements on a wide range of samples, providing detailed information about their chemical composition and molecular structure.
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Lab products found in correlation
Supra 60 vp microscope, by Zeiss (1 mentions)
Phi 5500, by PerkinElmer (1 mentions)
Cary 5000 spectrophotometer, by Agilent Technologies (1 mentions)
Iraffinity 1s spectrometer, by Shimadzu (1 mentions)
Project five software, by WITec (1 mentions)
Nicolet is50 ft ir, by Thermo Fisher Scientific (1 mentions)
5 protocols using raman microscope alpha300r
1
Raman Spectroscopy of Graphene Derivatives
2
Raman Spectroscopy of Mineral Phases
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The Raman spectrum was collected using a confocal Raman microscope alpha 300R made by WITec GmbH (Ulm, Germany) at the IGGCAS. This system is equipped with a solid-state continuous-wave laser emitting at 532 nm, which is fiber coupled to the instrument. A laser power of about ~7 mW was focused on the sample surface (57 ). A piece of single-crystal silicon was used to calibrate the wavenumbers of the shifts. The Raman spectra from 200 to 1,600 cm−1 were taken, and the integrating time was ~4 min. Different mineralogy phases were identified by their diagnostic spectra (SI Appendix, Fig. S1 ).
3
Characterization of TiO2-Coated α-Fe2O3 Samples
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The chemical phase of the prepared samples was determined by using a confocal Raman microscope (alpha300 R; WITec) with a 488 nm laser pulse as an excitation source. The surface morphology of the bare and TiO2 coated α-Fe2O3 samples was examined by field emission scanning electron microscope (FE-SEM) using a Zeiss Supra 60 VP microscope operated at an acceleration voltage of 10 kV. The optical absorption of all the samples was measured with the help of a Cary 5000 spectrophotometer (Varian). X-ray photoelectron spectroscopy (XPS) spectra were acquired in a PerkinElmer Phi 5500 setup (base pressure < 10−10 mbar) using AlKα radiation of 1.4866 keV. The XPS spectra were shifted using the Fe(2p3/2) peak corresponding to 710.9 eV as a reference.
4
Spectroscopic Characterization of Samples
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An attenuated total reflection (ATR)-FTIR spectroscopy study was performed using the IRAffinity-1S spectrometer (Shimadzu, Kyoto, Japan) with 100 scans at resolution 2 cm−1 from 3900 to 600 cm−1. The GS10800-B (Specac, Orpington, UK) ATR compartment that allows the user to provide a constant clamping force was used. ATR correction was applied to the spectrum using the LabSolutions v.1.50 software (Shimadzu, Kyoto, Japan).
Raman spectra were obtained with the confocal Raman microscope alpha300R (WITec GmbH, Ulm, Germany). The microscope objective lens of 50× and the excitation line 633 nm of a He-Ne laser give a spatial resolution of ~1.0 μm. Raman maps of some characteristic bands were obtained for an area of 30 × 30 μm2, considering 30 points per line and 30 lines, and 5.0 s of exposition time at each point. Data processing was carried out using the WITec Project FIVE software (version 5.1, WITec GmbH, Ulm, Germany).
Raman spectra were obtained with the confocal Raman microscope alpha300R (WITec GmbH, Ulm, Germany). The microscope objective lens of 50× and the excitation line 633 nm of a He-Ne laser give a spatial resolution of ~1.0 μm. Raman maps of some characteristic bands were obtained for an area of 30 × 30 μm2, considering 30 points per line and 30 lines, and 5.0 s of exposition time at each point. Data processing was carried out using the WITec Project FIVE software (version 5.1, WITec GmbH, Ulm, Germany).
5
Spectroscopic Analysis of o14PEGMA Amidation
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FT-IR and confocal Raman spectroscopy were applied to visualize the amidation of o14PEGMA with azido-TEG-amine. FT-IR analysis of samples was performed on a Nicolet iS™ 50-FT-IR with a Smart Performer Sample Unit (Thermo Scientific) equipped with the Omnic Spectra Software 2.2.4.3 provided with the instrument.
Samples of the dry polymer were also investigated using the confocal Raman microscope alpha-300 R (WITec, Ulm, Germany). A single mode laser with a wavelength of 532 nm was applied for excitation. Using a Zeiss EC Epiplan-Neofluar Dic 50x/0.8 microscope objective, the laser power on the samples was set to 20 mW. The Raman microscope was equipped with a WITec UHTS 300 spectrometer and an Andor iDus Deep Depletion CCD camera, which was cooled down to −60 °C. By using a reflection grating with 600 lines/mm, an average spectral resolution of 3.8 cm−1/pixel was achieved. Raman spectra were recorded using an exposure time of 20 s by accumulating 10 × 2 s. For the data interpretation, WITec FIVE 5.3.18.110 software was used. Samples were randomly measured at three positions, spectra were merged, baseline-corrected and -normalized.
Samples of the dry polymer were also investigated using the confocal Raman microscope alpha-300 R (WITec, Ulm, Germany). A single mode laser with a wavelength of 532 nm was applied for excitation. Using a Zeiss EC Epiplan-Neofluar Dic 50x/0.8 microscope objective, the laser power on the samples was set to 20 mW. The Raman microscope was equipped with a WITec UHTS 300 spectrometer and an Andor iDus Deep Depletion CCD camera, which was cooled down to −60 °C. By using a reflection grating with 600 lines/mm, an average spectral resolution of 3.8 cm−1/pixel was achieved. Raman spectra were recorded using an exposure time of 20 s by accumulating 10 × 2 s. For the data interpretation, WITec FIVE 5.3.18.110 software was used. Samples were randomly measured at three positions, spectra were merged, baseline-corrected and -normalized.
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