Silicon nitride afm probe

Atomic force microscopy (AFM) contact‐mode measurements were performed on a Catalyst NanoScope IV instrument (Bruker, Billerica, MA, USA) with NanoScope Analysis (Bruker Billerica, MA, USA) as analysis software. Cantilever “D” from DNP‐10 Bruker's robust Silicon Nitride AFM probe was used. AFM was performed for on duplicates of three independent made PDMS gradient samples. Each sample was analyzed on three different points on each of the sections on gradient surface.

Contact-mode atomic force microscopy (AFM) was done on a Catalyst NanoScope IV instrument (Bruker, Billerica, MA, USA) and NanoScope Analysis Software (Bruker Billerica, MA, USA) was used to process the data. Cantilever “D” (resonant frequency 18 kHz and spring constant 0.006 N/m) from DNP-10 Bruker’s robust Silicon Nitride AFM probe was used for topographical analysis on both the PDMS and the myotubes cultured on tissue culture polystyrene.
Tapping peak force ScanAsyst™ was performed by the BioScope Catalyst AFM (Bruker, Billerica, MA, USA) with the cantilever ScanAsyst fluid (resonant frequency of 120–180 kHz and spring constant of 0.7 N/m) to measure the topography of aligned myotubes on structured surfaces in culture medium at room temperature.