Solver pro microscope
The NT-MDT Solver PRO is a scanning probe microscope designed for high-resolution imaging and analysis of surface topography. It utilizes advanced scanning probe techniques to capture detailed information about the nanoscale features of a sample.
Lab products found in correlation
2 protocols using solver pro microscope
Atomic Force Microscopy of Peptide Samples
Microparticle Characterization via AFM
were analyzed and characterized using the atomic force microscope
(NT-MDT Solver Pro microscope, NT-MDT Spectrum Instruments, Zelenograd,
Moscow, RU), with a single-crystal silicon–antimony-doped probe
and a gold-coated base (NSG-01 from NT-MDT). To reduce nonlinearity
and hysteresis in the measurements, prior to the AFM analyses the
microscope was calibrated by a calibration grid (TGQ1 from NT-MDT).
The analyses were performed using the tapping mode where the cantilever
is driven to oscillate vertically near its resonance frequency. The
lyophilized sample was resuspended in Milli-Q water, deposited on
a mica substrate, and dried under a flux of argon. All the data were
collected using the software Nova (NT-MDT). The resolution of the
images acquired was 15 nm.
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