Scanning electron microscope (SEM) images were obtained by a high-resolution scanning electron microscope (JEOL, JSM-7401, JEOL Ltd., Akishima-shi, Japan) at 3.0 kV. Transmission electron microscopy (TEM) experiments were performed on a high-resolution transmission electron microscope (JEOL, TEM, exited at 100 kV, JEOL Ltd., Akishima-shi, Japan) equipped with selected area electron diffraction (SAED). X-ray diffraction (XRD) was recorded on a Rigaku D/Max-RB diffractometer (Rigaku Corporation, Tokyo, Japan) with CuKα radiation at 40 kV and 120 mA. Thermogravimetric analysis (TGA) was carried out using a thermogravimetric analyzer (METTLER TOLEDO, TGA/DSC-1, Mettler-Toledo GmbH, Switzerland) from 30°C to 600°C at a heating rate of 10°C min−1 in N2. Raman spectra were characterized by a JY Horiba Raman (Aramis, Horiba, Ltd., Minami-ku Kyoto, Japan) under 514-nm laser for the accumulation intensity of three-time scan.
D max rb
Manufactured by Rigaku
Sourced in Japan
The D/MAX-RB is a general-purpose X-ray diffractometer designed for a wide range of applications, including materials science, pharmaceuticals, geology, and more. It features a rotating-anode X-ray source and a goniometer for precise sample positioning. The D/MAX-RB provides accurate and reliable data collection for phase identification and structural analysis.
Automatically generated - may contain errors
Lab products found in correlation
S 4800, by Hitachi (7 mentions)
Jem 2100f, by JEOL (4 mentions)
Aa 6800, by Shimadzu (3 mentions)
Jem 2100, by JEOL (3 mentions)
Al ka x ray source, by Thermo Fisher Scientific (3 mentions)
Jsm 7401, by JEOL (2 mentions)
Su8010, by Hitachi (2 mentions)
Tecnai g2 20, by Thermo Fisher Scientific (2 mentions)
Asap 2020, by Micromeritics (2 mentions)
Asap 2000, by Micromeritics (2 mentions)
Jem 2010, by JEOL (2 mentions)
K alpha, by Thermo Fisher Scientific (2 mentions)
Supra 55vp, by Zeiss (2 mentions)
Tga dsc1, by Mettler Toledo (1 mentions)
Thermo scientific k alpha, by Thermo Fisher Scientific (1 mentions)
U 3900, by Hitachi (1 mentions)
Keithley 4200, by Tektronix (1 mentions)
D max rc, by Rigaku (1 mentions)
Tecnai f30 s twin, by Thermo Fisher Scientific (1 mentions)
Flash 2000 series, by Thermo Fisher Scientific (1 mentions)
51 protocols using d max rb
1
Comprehensive Characterization of Nanomaterials
2
Comprehensive Thin-Film Characterization Protocol
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The optical transmission was carried out by a double-beam spectrophotometer (U-3900, U-3900, Hitachi, Ltd., Tokyo, Japan). The surface morphology was measured by an atomic force microscope (AFM; nanonaviSPA-400 SPM, SII Nano Technology Inc., Chiba, Japan). The AFM measurement mode used was the tapping mode. The parameters of the AFM tip (Tap150AL-G, Innovative Solutions Bulgaria Ltd., Sofia, Bulgaria) were resonant frequency: 150 KHz and force constant: 5 N/m. The measurement geometry was rectangle and the acquisition time was 4 min. Fourier Transform Infrared Spectroscopy (FTIR) was carried out by the Nicolet 5700. The chemical composition of the thin film was analyzed by X-ray photoelectron spectroscopy (XPS, Thermo Scientific K-Alpha+, Thermo Fisher Scientific Inc., Waltham, MA, USA). The crystal structure of the thin film was investigated by X-ray diffraction (XRD, Rigaku D/max-rB, Rigaku Corporation, Tokyo, Japan). The electrical properties were measured by a semiconductor parameter analyzer (Keithley 4200, Tektronix Inc., Beaverton, OR, USA).
The field-effect mobility (μ) and SS were extracted by using the following equations [13 (link)]
where W and L are the channel width and length, respectively. Ci is the capacitance per unit area of the insulator; Vth is the threshold voltage; and VG is the gate voltage.
The field-effect mobility (μ) and SS were extracted by using the following equations [13 (link)]
where W and L are the channel width and length, respectively. Ci is the capacitance per unit area of the insulator; Vth is the threshold voltage; and VG is the gate voltage.
3
Characterization of SnO2-TiO2 Hybrid Microstructures
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The morphological features of SnO2–TiO2 MCs were observed via high-resolution scanning electron microscopy (HR-SEM, SU8010, Hitachi) and field-emission transmission electron microscopy (FE-TEM, JEM-2100F, JEOL). The crystallographic nature of the electrodes was determined by X-ray diffraction (XRD, Rigaku D/max-RB, Cu K-alpha radiation), with detailed analysis using selected area electron diffraction (SAED) patterns from the FE-TEM. The spatial distribution of electrode elements was determined by in situ energy dispersive X-ray spectroscopy (EDS) mapping analysis. X-ray photoelectron spectroscopy (XPS, VGESCLALB 220i-XL, Fisons) with an Al K-alpha source was adapted to clarify the oxidation state of Sn situated on the surface and in the pore structure.
4
Characterization of TiO2 Nanostructures with rGO
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The anatase structure of TiO2 was investigated by X-ray diffraction (XRD, D/MAX-RB (12KW) and D/MAX-RC (12 kW), Rigaku). The morphologies of the TiO2 NFs and rGO@TiO2 NFs were observed by a scanning electron microscope (SEM, Philips). The lattice fringe and selected-area electron diffraction (SAED) patterns were obtained by a transmission electron microscope (TEM, Tecnai F30 S-Twin, FEI). Raman spectroscopy was carried out using a LabRAM HR UV/Vis/NIR PL device by Horiba Jobin Yvon, France. The Fourier-transform infrared spectroscopy (FT-IR) analysis was performed using the attenuated total reflection (ATR) method for the GO solution and the KBr-pellet method for the TiO2 NFs and the rGO@TiO2 NFs in transmission mode on an IFS66V/S & Hyperion 3000, Bruker Optiks, Germany. Carbon contents were measured by an element analysis (EA, Flash 2000 series, Thermo Scientific).
5
Characterization of Swine Wastewater Components
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The components of the screened swine wastewater were analyzed according to the standard methods38 . After the required pretreatment of the samples, the concentrations of NH4-N and PT were determined by the Nessler’s reagent spectrophotometric method and Mo–Sb anti-spectrophotometric method (752 N-spectrophotometer; China), respectively. The concentrations of the cations like Ca2+, K+, Mg2+, Fe2+/Fe3+, Zn2+ and Cu2+ were measured by an atomic adsorption photometer (AA-6800; Shimadzu, Japan). The solution pH was measured by a pH meter (pHS-3C; China). The struvite precipitates collected during the experiments were washed thrice with pure water, and then oven dried at 35 °C for 48 h. The morphology of the dried struvite solids was observed using a scanning electron microscope-energy dispersive spectrometer (SEM-EDS; SUPRA 55 SAPPHIRE; Germany), and the composition was analyzed using an X-ray diffraction analyzer (XRD; DMAX-RB; Rigaku, Japan).
6
Characterization of Modified Cellulose Nanocrystals
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Optical, SPF,
and photocatalytic measurements were monitored using an ultraviolet–visible
(UV–vis) spectrophotometer (Cary Bio 100). TGA was performed
using a TGA Q600 from TA Instruments (New Castle, Delaware). The experiments
were conducted at a heating rate of 20 °C/min in the presence
of air, from 25 to 800 °C. The morphology of the uranyl-stained
CNCs was obtained with a JEM-2100 high resolution transmission electron
microscope. MFCNC, ZnO@MFCNC, and unmodified ZnO particles were characterized
using a Philips CM10 transmission electron microscope. The XRD patterns
of the samples were performed with a Rigaku D/MAX-RB diffractometer
using filtered Cu Kα radiation. FTIR spectra were recorded using
a PerkinElmer 1720 spectrophotometer of freeze-dried samples mixed
with KBr, at a resolution of 4 cm–1, and analyzed
using OPUS software. The zeta potentials of the solutions were measured
as a function of pH from 3.0 to 5.0 every 0.5 units. This range was
tested to check the stability of the system by measuring the surface
charge of the NPs using Zetasizer Malvern Nano ZS90.
and photocatalytic measurements were monitored using an ultraviolet–visible
(UV–vis) spectrophotometer (Cary Bio 100). TGA was performed
using a TGA Q600 from TA Instruments (New Castle, Delaware). The experiments
were conducted at a heating rate of 20 °C/min in the presence
of air, from 25 to 800 °C. The morphology of the uranyl-stained
CNCs was obtained with a JEM-2100 high resolution transmission electron
microscope. MFCNC, ZnO@MFCNC, and unmodified ZnO particles were characterized
using a Philips CM10 transmission electron microscope. The XRD patterns
of the samples were performed with a Rigaku D/MAX-RB diffractometer
using filtered Cu Kα radiation. FTIR spectra were recorded using
a PerkinElmer 1720 spectrophotometer of freeze-dried samples mixed
with KBr, at a resolution of 4 cm–1, and analyzed
using OPUS software. The zeta potentials of the solutions were measured
as a function of pH from 3.0 to 5.0 every 0.5 units. This range was
tested to check the stability of the system by measuring the surface
charge of the NPs using Zetasizer Malvern Nano ZS90.
7
X-ray Diffraction Analysis of Crystalline Structures
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The crystal structures were analyzed by the X-ray diffraction method (D/MAX-RB, Rigaku, Japan) with Cu Kα radiation ( λ = 1.54056 nm). The data were collected at 25°C with a step scan procedure in the range of 20° to 60°. The step interval was 0.01° and the scan speed was 1°/min.
8
Comprehensive Characterization of Materials
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Powder X-ray diffraction (XRD) spectra were acquired with a Rigaku D/Max-rB diffractometer with Cu Kα radiation. The 2θ scanning angle ranged from 15° to 70°. Scanning electron microscopy (SEM) images were acquired with a JSM-7800F JEOL emission scanning electron microscope. Energy dispersive X-ray (EDX) images were acquired with an EDX-100A-4. Raman spectra were recorded on an HR Evolution instrument with an Ar+ laser source of 488 nm. The Brunauer-Emmett-Teller (BET) specific surface areas and porosity of the samples were evaluated on the basis of nitrogen adsorption isotherms measured at 400 °C using a gas adsorption apparatus (Gemini VII 2390, Micromeritics Instrument Corp, Norcross, GA, USA). The samples were degassed at 400 °C before nitrogen adsorption measurements. The BET surface area was determined using adsorption data in the relative pressure (p/p0) range of 0.05–1. X-ray photoelectron spectroscopy (XPS) characterization was performed (K-Alpha, UA, Thermo Fischer Scientific, Waltham, MA, USA) with an Al Ka X-ray source. All binding energy values were corrected by calibration to the C 1s peak at 284.6 eV. UV-visible diffuse-reflectance spectroscopy (UV-vis DRS) was performed with a Hitachi U-3010 UV-vis spectrometer.
9
Advanced Material Characterization
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Scanning electron microscopy (SEM) and energy-dispersive X-ray (EDX) analysis were obtained by using a Hitachi S-4800 field-emission SEM. X-ray diffraction pattern (XRD) was obtained by using a Rigaku D/Max-RB diffractometer at a voltage of 40 kV and a current of 20 mA with Cu-Kα radiation.
10
Characterization of Magnetic Nanocrystals
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The morphology and
crystallographic alignment of the NCs were observed with a scanning
electron microscope (Cold Type FE-sem, S-4800, Hitachi High Technology,
Japan) and a field-emission transmission electron microscope (FE-TEM,
Tecnai G2 F30 S-Twin, FEI, Netherlands). X-ray powder diffraction
(XRD) studies were conducted using a Rigaku D/MAX-RB diffractometer
equipped with a graphite-monochromatized Cu Kα radiation source
(40 kV, 120 mA). X-ray photoelectron spectrometry (XPS) was obtained
using Kα+ XPS (ThermoFisher Scientific). The hydrodynamic
size and ζ-potential of the NCs were measured using dynamic
light scattering (Zetasizer Nano ZS, Malvern). The magnetism of the
NCs was measured using a vibrating sample magnetometer (VSM, 7400-S,
Lake Shore Cryotronics).
crystallographic alignment of the NCs were observed with a scanning
electron microscope (Cold Type FE-sem, S-4800, Hitachi High Technology,
Japan) and a field-emission transmission electron microscope (FE-TEM,
Tecnai G2 F30 S-Twin, FEI, Netherlands). X-ray powder diffraction
(XRD) studies were conducted using a Rigaku D/MAX-RB diffractometer
equipped with a graphite-monochromatized Cu Kα radiation source
(40 kV, 120 mA). X-ray photoelectron spectrometry (XPS) was obtained
using Kα+ XPS (ThermoFisher Scientific). The hydrodynamic
size and ζ-potential of the NCs were measured using dynamic
light scattering (Zetasizer Nano ZS, Malvern). The magnetism of the
NCs was measured using a vibrating sample magnetometer (VSM, 7400-S,
Lake Shore Cryotronics).
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