Ttrax 3 diffractometer

Manufactured by Rigaku

The TTRAX-III Rigaku diffractometer is a laboratory equipment designed for X-ray diffraction analysis. Its core function is to determine the crystallographic structure of materials by measuring the diffraction pattern of X-rays interacting with the sample.

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TTRAX III (34 citations) TTRAX III X-ray diffractometer (3 citations) TTRAX Ш). (2 citations)

2 protocols using ttrax 3 diffractometer

Powder X-ray Diffraction Analysis of Fe-LTO

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Phase purity of all Fe-LTO
samples was determined by powder X-ray diffraction measurements on
a TTRAX-III Rigaku diffractometer equipped with a rotating Cu anode
operating at 50 kV and 200 mA. The 2θ scanning range was 10–120
with a scan rate of 2°/min. Phase analysis was performed using
JADE 2010 software.

Harchol A., Reuveni G., Ri V., Thomas B., Carmieli R., Herber R.H., Kim C, & Leskes M. (2020). Endogenous Dynamic Nuclear Polarization for Sensitivity Enhancement in Solid-State NMR of Electrode Materials. The Journal of Physical Chemistry. C, Nanomaterials and Interfaces, 124(13), 7082-7090.

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XRD Analysis of Material Composition

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X-ray diffraction measurements
were performed on a TTRAX-III Rigaku diffractometer equipped with
a rotating Cu anode. The X-ray (Cu Kα radiation) tube voltages
and the current were 50 kV and 200 mA, respectively. The measurement
range of 2θ was from 10° to 120°, with a scan rate
of 2° per minute. Quantification of the phases and analysis of
the crystal structure parameters were performed using the JADE 2010
software. The open angles of the divergence and scattering slits were
both 0.51, and the width of the receiving slit was 0.15 mm.

Thomas B., Jardón-Álvarez D., Carmieli R., van Tol J, & Leskes M. (2023). The Effect of Disorder on Endogenous MAS-DNP: Study of Silicate Glasses and Crystals. The Journal of Physical Chemistry. C, Nanomaterials and Interfaces, 127(9), 4759-4772.

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