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Fei tecnai g2 f30 s twin

Manufactured by Thermo Fisher Scientific
Sourced in United States

The FEI Tecnai G2 F30 S-Twin is a transmission electron microscope (TEM) designed for high-resolution imaging and advanced analytical capabilities. It features a field emission gun source, a spherical aberration corrector, and a twin-lens system to provide exceptional image quality and resolution. The core function of this product is to enable researchers and scientists to perform detailed structural and compositional analysis of a wide range of materials at the nanoscale level.

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2 protocols using fei tecnai g2 f30 s twin

1

Nanothermite Characterization and Ignition

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The structural and compositional information of the prepared materials were obtained by X-ray diffraction (XRD), (Bruker D8 Advance, Bruker, Karlsruhe, Germany). The morphological features and the element distribution of the obtained samples on Ni substrates were characterized by field emission scanning electron microscopy (SEM) (Quanta 250F, FEI, Hillsboro, OR, USA), equipped with an energy dispersive X-ray spectrometer (EDS), transmission electron microscopy (TEM) (FEI Tecnai G2 20 LaB6, FEI, Hillsboro, OR, USA), and high resolution transmission electron microscopy (HRTEM) (FEI Tecnai G2 F30 S-Twin, FEI, Hillsboro, OR, USA). The element mappings were also performed on the HRTEM. Differential scanning calorimetry (DSC) (TGA/DSC 3+, Mettler Toledo, Zurich, Switzerland), was used to determine the reaction heats of the nanothermites from 300 to 900 °C at a heating rate of 10 °C·min−1 under 30 mL·min−1 N2 flow. In addition, the ignition performances of the nanothermite film were studied by a Nd:YAG laser device and a high-speed camera. The wavelength, the pulse width and the incident laser energy were 1064 nm, 6.5 ns and 30 mJ, respectively.
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2

Nanoparticle characterization techniques

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SEM images were taken using a field-emission scanning electron microscope (FE-SEM, JEOL JSM-7800F) at an operating voltage of 20 kV. High-resolution transmission electron microscopy (HR-TEM) images were obtained on a FEI Tecnai G2 F30 S-Twin (FEI Company) with an accelerating voltage of 300 kV for measuring the Au NP sizes. X-ray photoelectron spectroscopy (XPS) measurements were performed on a VG ESCALAB MK2 spectrometer with monochromatized Al-Kα excitation.
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