Fei tecnai g2 f30 s twin
The FEI Tecnai G2 F30 S-Twin is a transmission electron microscope (TEM) designed for high-resolution imaging and advanced analytical capabilities. It features a field emission gun source, a spherical aberration corrector, and a twin-lens system to provide exceptional image quality and resolution. The core function of this product is to enable researchers and scientists to perform detailed structural and compositional analysis of a wide range of materials at the nanoscale level.
Lab products found in correlation
2 protocols using fei tecnai g2 f30 s twin
Nanothermite Characterization and Ignition
Nanoparticle characterization techniques
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