All chemicals were purchased from commercial sources and used as received. Solvents were purified following standard protocols [35 ]. All reactions were performed in oven-dried Schlenk glassware using standard inert atmosphere techniques. All reactions were carried out under N2 atmosphere by using standard Schlenk techniques. [Ag7(H){Se2P(OiPr)2}6] and [CuxAg7-x(H){Se2P(OiPr)2}6] (x = 1–6) were prepared by the procedure reported earlier in literature [26 (link)]. 1H, 31P and 77Se NMR spectra were recorded on a Bruker Avance DPX-300 BBO probe spectrometer (Bruker BioSpin, MA, USA), operating at 300.13 MHz for 1H, 121.49 MHz for 31P and 57.239 MHz for 77Se, respectively. The chemical shift (δ) and coupling constant (J) are reported in ppm and Hz, respectively. ESI mass spectrum recorded on a Fison Quattro Bio-Q (Fisons Instruments, VG Biotech, Glasgow, UK). UV-visible absorption spectra were measured on a PerkinElmer Lambda 750 PerkinElmer, Inc., MA, USA) spectrophotometer using quartz cells with path length of 1 cm. Luminescence spectra and lifetime were recorded on an Edinburgh FLS920 fluorescence spectrometer (Edinburgh Instruments Ltd., Livingston, UK). The elemental analysis (C, H and N content) of the new compounds was determined by Elementar UNICUBE elemental analyzer (Elementar Analysensysteme GmbH, Langenselbold, Germany).
Edinburgh fls920 fluorescence spectrometer
Manufactured by Edinburgh Instruments
Sourced in United Kingdom
The Edinburgh FLS920 is a high-performance fluorescence spectrometer designed for accurate and sensitive measurement of fluorescence and phosphorescence properties. It features a monochromated xenon lamp excitation source and a comprehensive range of detectors to provide a versatile, state-of-the-art spectroscopic analysis platform.
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3 protocols using edinburgh fls920 fluorescence spectrometer
1
Synthesis and Characterization of Silver-Copper Chalcogenolate Complexes
2
Opto-Electrochemical Characterization Protocol
3
Characterization of Crystalline Phases and Optical Properties
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The crystallographic phases of samples were characterized by X-ray diffraction (XRD) using a Bruker D8 Advance X-ray powder diffractometer (Bruker Corp., Billerica, MA, USA) with Cu-Kα radiation (λ = 1.5418 Å). Morphological observations were performed by a Hitachi S-4800 field emission scanning electron microscope (SEM, Tokyo, Japan). The diffuse reflectance spectra (DRS) were recorded by a Shimadzu UV-2600 spectrophotometer equipped with an integrating sphere, using BaSO4 as the reflectance standard. Photoluminescence (PL) spectra were obtained by an Edinburgh FLS920 fluorescence spectrometer (Edinburgh Instruments Ltd., Livingston, England) under an excitation wavelength of 325 nm.
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