X-ray diffraction (XRD) patterns were collected using a Siemens D-5000 powder X-ray diffractometer operated in Bragg Brentano geometry using Ni-filtered Cu Kα radiation (λ = 0.1541 nm). Data were recorded in the 2θ range 10–80° with an angular step size of 0.026° and a counting time of 1 s per step. The collected data were refined using the Le Bail method by means of the software Rietica [34 (link),35 (link)]. Raman spectra were collected from powder samples onto a glass slide as substrate, with a Renishaw in Via Reflex Raman microscope (Renishaw, Gloucestershire, UK). Experiments were conducted at room temperature using 532 and 633 nm excitation wavelengths. Field emission scanning electron microscopy (FESEM) was conducted on a JEOL JSM-6700 F. Samples for transmission electron microscopy (TEM) studies were prepared by dropping a diluted suspension of the samples onto ultra-thin carbon-coated copper grids. Imaging was performed on a JEOL JEM 1010 instrument operated at 100 kV and equipped with a CCD camera (JEOL, Tokyo, Japan).
Jem 1010 instrument
Manufactured by JEOL
Sourced in Japan
The JEM 1010 is a transmission electron microscope (TEM) designed and manufactured by JEOL. It is a compact and versatile instrument that provides high-resolution imaging capabilities. The JEM 1010 is capable of magnifying and resolving small-scale features with its electron beam technology.
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2 protocols using jem 1010 instrument
1
Structural Characterization of Materials
2
Characterization of Gold Nanoparticles
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TEM images of AuMs were obtained on a JEOL JEM-1010 instrument operated at 80 kV (JEOL Ltd., Japan).
For characterization of the sample surface and nanomechanical mapping before and after surface modification, the peak force AFM technique was used. Surface mapping was performed using Icon (Bruker) set-up on a 3 Â 3 mm 2 sample area.
UV-Vis absorption spectra were measured using a Lambda 25 UV/Vis/NIR spectrometer (PerkinElmer, USA) in the spectral range of 400-900 nm at a scanning rate of 240 nm min À1 and a data collection interval of 1 nm.
Raman scattering was measured on a Nicolet Almega XR spectrometer (Laser power 30 mW) Raman spectrometers with 630 and 785 nm excitation wavelengths. Spectra were measured 10 times, each of them with 30 s accumulation times.
For characterization of the sample surface and nanomechanical mapping before and after surface modification, the peak force AFM technique was used. Surface mapping was performed using Icon (Bruker) set-up on a 3 Â 3 mm 2 sample area.
UV-Vis absorption spectra were measured using a Lambda 25 UV/Vis/NIR spectrometer (PerkinElmer, USA) in the spectral range of 400-900 nm at a scanning rate of 240 nm min À1 and a data collection interval of 1 nm.
Raman scattering was measured on a Nicolet Almega XR spectrometer (Laser power 30 mW) Raman spectrometers with 630 and 785 nm excitation wavelengths. Spectra were measured 10 times, each of them with 30 s accumulation times.
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