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Jsm 7401f field emission scanning electron microscope

Manufactured by JEOL
Sourced in Japan

The JSM-7401F is a field emission scanning electron microscope (FE-SEM) manufactured by JEOL. It is designed to produce high-resolution images of samples by scanning them with a focused beam of electrons. The JSM-7401F features a field emission electron gun, which provides a high-brightness, monochromatic electron beam for enhanced imaging capabilities.

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8 protocols using jsm 7401f field emission scanning electron microscope

1

Microscopic Characterization of Cobalt Catalyst

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Example 2

Scanning Electron Microscopy (SEM) images of the synthesized catalyst were taken using a JEOL JSM-7401F Field Emission Scanning Electron Microscope at 10.0-15.0 kV. Sharp features/nanostructures on the surface of the cobalt particles could be observed as shown in FIGS. 1A-1D.

TEM characterization of the synthesized cobalt particles was done using a Philips EM400T transmission electron microscope at 100 kV. According to the TEM images, it could be observed that the bulk of the cobalt particles were irregular in shape and the size was in the micrometer range. The crystalline structure of the particles could be observed from the electron diffraction pattern.

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2

Characterization of Oxidized Carbon Nanotubes with Quaternized Polyethyleneimine

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FTIR spectra were recorded using a Nicolet 6700 spectrometer (Thermo Scientific, Waltham, MA, USA) equipped with an attenuated total reflectance accessory with a diamond crystal (Smart Orbit, Thermo Electron Corporation, Madison, WI, USA). Raman spectra were obtained using a micro-Raman system RM 1000 Renishaw (laser excitation line at 532 nm, Nd-YAG) in the range of 400–2000 cm−1. AFM images were obtained in tapping mode, with a 3D Multimode Nanoscope, using Tap-300G silicon cantilevels with a <10 nm tip radius and a ≈20–75 N/m force constant. Samples were deposited onto silicon wafers (P/Bor, single side polished) by drop casting from ethanol solutions. Scanning electron microscopy (SEM) images were recorded using a Jeol JSM 7401F field emission scanning electron microscope equipped with a gentle beam mode. Transmission electron micrographs were taken using a Philips C20 TEM instrument equipped with a Gatan GIF 200 energy filter for electron energy loss elemental mapping. For the sample preparation, a drop of oxCNTs@QPEIs aqueous solution (0.1 mg/mL) was casted on a PELCO® Formvar grid and was left to evaporate. Thermogravimetric analyses (TGA) were carried out on a Setaram SETSYS Evolution 17 system at a 5 °C/min heating rate under oxygen atmosphere. Elemental analysis (EA) was measured by a Perkin Elmer 240 CHN elemental analyzer.
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3

Scanning and Transmission Electron Microscopy

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SEM images were taken with a JSM 7401-F field emission scanning electron microscope (Jeol, Tokyo, Japan). TEM images were taken with a Titan 80–300 transmission electron microscope (Fei, Eindhoven, Netherlands), and images were collected with a Gatan brand CCD camera of 1024 × 1024 pixels digital resolution.
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4

Characterization of Dam Deposits

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First, the composition of the concrete deposits of the dam was analyzed with an X-ray diffractometer, type D8ADVANCE, manufactured by Bruker in Massachusetts, USA. The diffraction peak data were obtained, including peak height, position, crystal surface spacing, and relative intensity of the deposits. Jade software was used to determine the composition of the deposits by comparing the peaks of the XRD spectrum to those of the standard pattern.
Next, to study the micromorphology of sediments, SEM experiments using a JSM-7401F field emission scanning electron microscope manufactured by JEOL Ltd. in Tokyo, Japan were used. The deposit samples were prepared by soaking in ethanol for 24 h and then drying at 105 °C for 48 h.
Finally, in order to study the chemical elemental species and content of the sediments, XPS was carried out using a 250XI X-ray photoelectron spectrometer from Thermo Scientific in Massachusetts, USA, which had an optimum energy resolution less than or equal to 0.45 eV and a sensitivity of greater than or equal to 400,000 cps. A standard sample of the solid sediment was prepared and placed in the test instrument for detection.
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5

Scaffold Characterization by Electron Microscopy

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Electron microscopy was performed at the Schepens Eye Institute core facility supported by National Institutes of Health National Eye Institute Core Grant P30EY003790. Briefly, samples were dehydrated in graded ethanol solutions and critical point-dried using a Samdri 795 Critical Point Dryer (Tousimis, Rockville, MD), then mounted onto aluminum stubs, and chromium coated with a Gatan High-Resolution Ion Beam Coater (Gatan, Inc., Pleasanton, CA). Samples were imaged using a JEOL JSM-7401F Field Emission Scanning Electron Microscope (JEOL, Inc., Peabody, MA) to provide a qualitative assessment of the scaffold architecture after decellularization.
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6

Visualizing Vasculature in Decellularized Flaps

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To visualize the vasculature in native and decellularized flaps, a contrast agent (Visipaque, GE Healthcare, Chicago, IL, USA) mixed with normal saline (1:2) was injected into the arterial pedicle using constant syringe pressure. Image acquisition was performed with a Powermobil C-Arm (Siemens, Munich, Germany). Images were exported in DICOM format and visualized with Osirix software 12.0 (Pixmeo, Bernex, Switzerland). This examination was performed on each flap before and after decellularization.
Scanning electron microscopy was performed for decellularized flaps at the Schepens Eye Institute core facility, supported by the NIH National Eye Institute Core Grant #P30EY003790. Briefly, the samples were dehydrated in graded ethanol solutions and dried at the critical point using a Samdri 795 critical point dryer (Tousimis, Rockville, MD, USA), then mounted on aluminum pedestals and chromed using a Gatan high-resolution ion beam coater (Gatan Inc., Pleasanton, CA, USA). Different surfaces of the samples were imaged using a JEOL JSM-7401F field emission scanning electron microscope (JEOL Inc., Peabody, MA, USA), allowing a qualitative assessment of the scaffold architecture.
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7

SEM Imaging of Fixed Cell Cultures

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Cell cultures were fixed with a buffer containing 0.1 m sodium cacodylate, 2% paraformaldehyde and 1.5% glutaraldehyde (pH 7.3, all from Sigma‐Aldrich) overnight at 4 °C, and postfixed with a buffer containing 0.1 m sodium cacodylate and 1% osmium tetroxide (Sigma‐Aldrich) at 4 °C for 30 min. Then the cells were washed with a sodium cacodylate buffer (0.1 m), rinsed with distilled water, dehydrated in ethanol, and dried using CO2. After that, the specimens were mounted on aluminum stubs using carbon adhesive tabs and coated with a thin layer of gold/palladium or carbon using an ion beam coater (Gatan). For each culture, images were acquired at 700 times magnification with a JEOL JSM‐7401F field emission scanning electron microscope (JEOL Ltd.) at four positions, one in every quadrant.
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8

In vivo Fungal Conidial Germination on Insect Cuticle

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In vivo germination of fungal conidia on the insect cuticle was examined by low-temperature scanning electron microscopy (LT-SEM). BTM larvae were treated by immersing in suspension of I. fumosorosea conidia (concentration 5 × 107 spores mL−1) and incubated for 0, 24, and 48 h at the temperature of 25 °C. The larvae were mounted on an aluminum stub using Tissue-Tek (C.C.T.D. Compound, The Netherlands). The samples were extremely fast (<10−3 K/s) frozen in vapor of liquid nitrogen. After freezing, the samples were transfered into a GATAN ALTO-2500 high vacuum cryo-preparation chamber (Gatan Inc., Abingdon, UK). The surface of the sample was sublimated (freeze-etched) for 5 min at the temperature of −95 °C and at −130 °C. After sublimation, the samples were sputter-coated with gold at the temperature of −130 °C. Coated samples were inserted into the chamber of a JEOL JSM-7401F Field Emission Scanning Electron Microscope (JEOL Ltd., Tokyo, Japan). Images were obtained by the secondary electron signal at an accelerating voltage of 4 kV and current 10 µA using an Everhart–Thornley Detector (ETD).
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