The suspensions were firstly visualized by Scanning Electron Microscopy (Leo 1530) before and after the process. The resulting concentration of exfoliated nanosheets was measured by thermal gravimetry analysis (TGA) (DSC-TGA3+, Mettler-Toledo). Then, UV-Vis absorption spectroscopy (Hitachi UH5300) has lead to the determination of the extinction coefficient α obeying the Beer lambert law A = αCGl, where A is the absorbance measured at 660 nm, l the length passed by the light (1 cm) and CG the solid concentration. The profile of the particles isolated by the centrifugation process was furthermore investigated, by using transmission electron microscopy (TEM, Philips-FEI microscope operating at an accelerating voltage of 200 kV and equipped with a TVIPS TemCam F216 camera). In order to determine the number of layers per flakes and the presence of monolayers, measurements by Atomic Force Microscopy (Veeco NS V apparatus) have been realized. Furthermore, Raman spectra were acquired using a WITec alpha 500 Raman microscope, with a 532 nm laser excitation wavelength and a 600 g mm−1 grating.
Alpha 500 raman microscope
Manufactured by WITec
Sourced in Germany
The Alpha 500 Raman microscope is a versatile and powerful instrument designed for advanced material analysis. It combines Raman spectroscopy and high-resolution optical microscopy to provide detailed information about the chemical composition and structural properties of a wide range of samples. The Alpha 500 is capable of performing Raman measurements with high spatial resolution, enabling the analysis of microscopic features and localized areas of interest.
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Lab products found in correlation
2 protocols using alpha 500 raman microscope
1
Characterization of Exfoliated Nanosheets
2
Raman Spectroscopic Analysis of Syloid and CARV
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Spectroscopic analysis of the SD product (Syloid® 244FP product 2:1), crystalline and amorphous CARV, was performed by Raman line mapping using a WITec Alpha 500 Raman microscope (WITec, Germany), using a 532 nm laser with a power of 30 mW and a 20× confocal objective (ZEISS Microscope, Germany). The integration time was set to 0.1 s per spectrum. The surface analyzed was 250 μm × 1,000 μm, with a step size in the x-and y-axes of 1.7 μm. All Raman spectra were acquired in the spectral range of 3,600 to 100 cm -1 . All the data were acquired and manipulated by WITec software (WITecProject 5.2 and WITecControl 5.2).
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