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Sem stub

Manufactured by Agar Scientific
Sourced in United Kingdom, United States, Germany

The SEM stub is a platform used to mount and hold samples for scanning electron microscopy (SEM) analysis. It provides a secure and stable surface on which samples can be positioned within the SEM instrument. The SEM stub is designed to facilitate the examination of a wide range of materials and specimens under high-resolution electron microscopy.

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5 protocols using sem stub

1

Scanning Electron Microscopy of Micranthemum Capitula

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SEM was performed on M. inodora capitula at different developmental stages. Tissue was fixed in the fixation solution (4% [w/v] PFA, 0.01% [v/v] DMSO, 1× PBS, 0.001% [v/v] TWEEN 20, and 0.001% [v/v] Triton X-100) overnight at 4°C. The next day, tissues were dehydrated in an ethanol series (30% [v/v], 50% [v/v], 70% [v/v], 85% [v/v], 95% [v/v], 100% [v/v]) for 30 min per step. Dehydrated tissues then underwent critical point drying using a Polaron critical point dryer (Quorum Technologies) and were mounted onto SEM stubs (Agar Scientific) using carbon tape (Agar Scientific). Mounted stubs were sputter-coated with gold for 2 min using a Polaron E5100 sputter-coater (Quorum Technologies). Samples were then imaged on a Quanta 250 FEG (FEI UK) using the secondary detector.
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2

Scanning Electron Microscopy of Samples

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Samples were removed from culture, washed with PBS and fixed using 2.5% (w/v) glutaraldehyde for 15 min at room temperature, washed with PBS and submerged in 70% ethanol for 15 min, then 90% ethanol for 15 min followed by two changes of 100% ethanol for 15 min. Samples were dried using a critical point dryer (Prion, UK). Dry samples were fixed to SEM stubs (Agar Scientific, UK) using double-sided carbon sticky tabs (Agar Scientific, UK). The samples were then coated with 20 nm of chromium using a sputter coater (Emtech, UK). The samples were observed under a Leo 1550 FESEM (Zeiss, UK). This was repeated 3 times for each time point. Representative images were used in results section. Where nodule formation was observed, measurements were taken using the annotation function on the LEO SEM software (Zeiss, Germany).
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3

FIB-SEM Imaging of Planktonic Cells

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The block was cut parallelly to its surface in order to be 2–3 mm high, and mounted on an SEM stub (Agar Scientific) using a 1:1 mix of superglue (Loctite precision max, Henkel Corp., Rocky Hill, CT, USA) and silver paint (EM-Tec AG44, Micro to Nano, Haarlem, the Netherlands). Silver paint was further added around the block surface. The sample underwent gold sputtering for 180 s at 30 mA (Q150RS, Quorum, Laughton, UK) before insertion in the FIB-SEM chamber. FIB-SEM imaging was performed using a Zeiss Crossbeam 550, following the Atlas 3D nanotomography workflow. FIB milling was performed at 1.5 nA. SEM imaging was done with an acceleration voltage of 1.5 kV and a current of 750 pA using an energy-selective backscattered (ESB) detector (ESB grid 1100 V). Imaging of the planktonic cell was done using an 8 nm isotropic voxel size with a dwell time of 9 µs. Post-acquisition dataset alignment was performed using the automated Alignment to Median Smoothed Template (AMST) procedure from Hennies et al. (2020) (link).
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4

Nanoscale Imaging of Embedded Photonic Cells

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The photonic chip with minimally embedded cells and landmarks on the surface was mounted on a SEM stub (6 mm length, Agar Scientific) using a conductive carbon sticker (12 mm, Plano GmbH, Germany). To reduce the amount of charging, the samples were surrounded by silver paint and gold coated for 180 s at 30 mA in a sputter coater (Quorum, Q150RS). The samples were introduced into the Crossbeam 540 (Carl Zeiss Microscopy, Germany). Light microscopy images of the landmarks were used to target the correct cell inside the FIB-SEM. The FIB was used at 15 nA to mill a trench and expose a cross-section through the cell. A current of 3 nA was used for polishing the cross-section before imaging. For imaging, the FIB milling was operated with 1.5 nA, the SEM imaging and the FIB milling operating simultaneously41 . The SEM images were acquired at 1.5 kV with the Energy selective Backscattered (EsB) detector with a grid voltage of 1100 V, analytical mode at a 700 pA current, setting the dwell time and line average to add up to 1.5 min per image. The final dataset was acquired with 5 × 5 nm2 pixel size and a slice thickness of 8 nm.
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5

SEM Imaging of Plankton Samples

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Part of the sample collected as described above was fixed with 2% paraformaldehyde (Electron Microscopy Sciences) and 0.5% glutaraldehyde (Electron Microscopy Sciences) in 0.1 M marPHEM (0.1 M PHEM with the addition of 9% sucrose) (Montanaro et al., 2016 (link)) for 6 h at 4°C. The sample was then transferred to 0.1 M PHEM (60 mM PIPES, 25 mM HEPES, 2 mM MgCl2, 10 mM EGTA, pH 6.9) containing 1% paraformaldehyde and preserved at 4°C until further processing. The sample was then rinsed once using 0.1 M PHEM at 4°C. The sample was then dehydrated at 4°C using the following (v/v) acetone/water series: 30%, 50%, 70%, 80%, 90%, followed by two pure acetone steps. Samples were left to sediment for a duration of 3 to 12 h before each exchange to avoid loss of material. The sample was then critically point dried (CPD; CPD300, Leica Microsystems) in small containers (1–1.6 µm pore size, Vitrapore ROBU, Hattert, Germany). In the CPD program, 30 slow exchange steps were used. CPD plankton were then distributed on carbon tape placed on an SEM stub (Agar Scientific) before further gold sputtering (Quorum, Q150RS). SEM imaging was performed using a Zeiss Crossbeam 540 with an acceleration voltage of 1.5 kV and a current of 700 pA and a secondary electron secondary ion (SESI) detector.
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