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Nicolet nexus 670 ft ir

Manufactured by Bruker

The Nicolet Nexus 670 FT-IR is a Fourier Transform Infrared Spectrometer designed for high-performance infrared analysis. It uses infrared light to detect and identify chemical compounds through their characteristic absorption spectra. The instrument is capable of measuring and analyzing a wide range of sample types, including solids, liquids, and gases.

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3 protocols using nicolet nexus 670 ft ir

1

Synthesis and Characterization of Nanocatalyst

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All materials were purchased from the Merck and Aldrich Chemical Companies with the best quality and they were used without further purification. IR and 1H/13C NMR spectra were recorded on Thermo Nicolet Nexus 670 FT-IR and 500 MHz Bruker Avance spectrometers, respectively. Melting points were measured on an Electrothermal IA9100 microscopic digital melting point apparatus. The synthesized nanocatalyst was characterized by XRD on a Bruker D8-Advanced diffractometer with graphite-monochromatized Cu Kα radiation (λ = 1.54056 Å) at room temperature. TEM image was recorded using an EM10C-100 kV series microscope from the Zeiss Company, Germany. FESEM images were determined using FESEM-TESCAN. The energy dispersive X-ray spectrometer (EDS) analysis was taken on a MIRA3 FE-SEM microscope (TESCAN, Czech Republic) equipped with an EDS detector (Oxford Instruments, UK). Magnetic property of synthesized nanocatalyst was measured using a VSM (Meghnatis Daghigh Kavir Co., Kashan Kavir, Iran) at room temperature. HRMS analyses were also carried out in the electron impact mode (EI) at 70 eV. The Cu content on the catalyst was determined by Perkin Elmer Optima 7300DV ICP-OES analyzer.
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2

Synthesis and Characterization of Nanocatalyst

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All materials were purchased from the Merck and Aldrich Chemical Companies with the best quality and they were used without further purification. The synthesized nanocatalyst was characterized by XRD on a Bruker D8-Advanced diffractometer with graphite-monochromatized Cu Kα radiation (λ = 1.54056 A°) at room temperature. Magnetic property of synthesized nanocatalyst was measured using a VSM (Meghnatis Daghigh Kavir Co., Kashan Kavir, Iran) at room temperature. TEM image was recorded using an EM10C-100 kV series microscope from the Zeiss Company, Germany. FESEM images were determined using FESEM-TESCAN. The energy dispersive X-ray spectrometer (EDS) analysis was taken on a MIRA3 FE-SEM microscope (TESCAN, Czech Republic) equipped with an EDS detector (Oxford Instruments, UK). IR and 1H/13C NMR spectra were recorded on Thermo Nicolet Nexus 670 FT-IR and 400 MHz Bruker Avance spectrometers, respectively. The products were characterized by their spectra data and comparison with the reported data in literature. All yields refer to isolated pure products.
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3

Characterization of Chemical Compounds

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The melting points of all compounds were recorded on a Philip Harris C4954718 apparatus without calibration. IR and 1 H-and 13 C-NMR spectra were recorded on Thermo Nicolet Nexus 670 FT-IR and Bruker Avance 300 MHz spectrometers, respectively. ESI-MS measurements were recorded on a Finnigan MAT 95 double-focusing sector-field mass spectrometer. Thin layer chromatography (TLC) analyses were carried out on silica gel pla- tes. All chemicals were purchased from Merck (Tehran, Iran) and used as received by standard procedures. All of the instruments, chemicals and solvents were dried according to standard methods. Freshly distilled solvents were used throughout, and anhydrous solvents were dried according to the method reported by Perrin and Armarego. 49 Microanalyses were performed on a Leco Analyzer 932.
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