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Jsm 7401f field

Manufactured by JEOL
Sourced in Japan

The JSM-7401F is a field emission scanning electron microscope (FE-SEM) manufactured by JEOL. It provides high-resolution imaging capabilities for a wide range of samples. The core function of the JSM-7401F is to produce detailed images of microscopic features and structures using a focused electron beam.

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3 protocols using jsm 7401f field

1

SEM Imaging and Analysis of Embryos

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For SEM, embryos were cut either sagittally or transversely, then fixed in 3% glutaraldehyde in 0.1 M Na-cacodylate buffer at 4°C overnight. They were washed three times for 10 min each with 0.1 M sodium cacodylate buffer, soaked in 1% osmium tetroxide at 4°C for 30 min, and dehydrated serially in 25, 50, 75 and 100% EtOH for 5 min each. Then, samples were dried with a critical point dryer and mounted on an aluminium block. Finally, they were Au/Pd-coated before imaging. The samples were imaged in a Jeol JSM 7401F field emission scanning electron microscope operated at 2 kV acceleration voltage, beam current at 10 µA, under high vacuum collecting the secondary electrons. Image analysis was conducted using Fiji software [77 (link)]. Serial images of the embryo were combined using the pairwise stitching plugin [78 (link)]. Each cell was defined using the region of interest (ROI) manger by drawing the outline of the cell-edge manually. The AR of each cell was measured and this converted to a heat map using the ROI colour coder plugin [79 (link)], with the min-max range set as 1–6. The measured ARs were exported to Excel for further analysis.
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2

Characterization of PECVD and Plasma-Treated Samples

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The untreated samples and those treated with a deposited PECVD layer or by oxygen plasma treatment were characterized using SEM and XPS. A JEOL JSM-7401F field emission scanning electron microscope was used for SEM imaging. The samples were sputter coated with silver prior to imaging. Imaging was carried out in LEI mode with very low accelerating voltage, typically 1–2 kV, and an emission current of 20 μA. Chemical composition analysis was carried out using XPS. The spectra were acquired using PHI Versaprobe II that uses Al Kα radiation. The data for survey spectra were obtained over 0 eV–1100 eV range of binding energy using a pass energy of 117.5 eV and step size of 0.5 eV. The high resolution spectra were acquired over a narrower range of binding energies (typically about 20 eV) using 11.75 eV pass energy and 0.1 eV step size. The IR spectra for fluoropolymer and maleic anhydride coatings on flat surfaces are provided in Figure S4 (SI) and Siffer et al.39 , respectively. The direct IR or Raman analysis of PECVD coatings on the sheds was not possible due to limited surface sensitivity of these two techniques. These measurements probe a depth of microns compared to 10–15 nm using XPS.
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3

Resin Sample Preparation and SEM Imaging

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Resin sample preparation and imaging were performed for fresh and fouled resin sample at the end of 50 th cycle using our previously published protocol [10] . Images were obtained using a Jeol JSM-7401F field emission scanning electron microscope (Jeol Ltd, Tokyo, Japan). Parameters for image acquisition were 2 kV accelerating voltage and 5.0 μA, with a working distance of 5 mm.
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