Jsm 7401f field
The JSM-7401F is a field emission scanning electron microscope (FE-SEM) manufactured by JEOL. It provides high-resolution imaging capabilities for a wide range of samples. The core function of the JSM-7401F is to produce detailed images of microscopic features and structures using a focused electron beam.
Lab products found in correlation
3 protocols using jsm 7401f field
SEM Imaging and Analysis of Embryos
Characterization of PECVD and Plasma-Treated Samples
Resin Sample Preparation and SEM Imaging
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