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Sputter coater model k575x

Manufactured by Quorum Technologies

The Sputter Coater model K575X is a laboratory equipment designed to deposit thin films of conductive materials onto samples. It operates by using a high-voltage electric field to ionize a gas, creating a plasma that sputters atoms from a target material and deposits them onto the sample surface.

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4 protocols using sputter coater model k575x

1

Density-Dependent Color SEM Imaging

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For density-dependent color scanning electron microscopy (DDC-SEM) imaging, histologically sectioned samples, intact collagen hydrogels, or collagenase isolated hydrogel components on a glass slide were secured to an aluminum sample holder with carbon tape, and silver paint was applied to the area immediately surrounding each sample, which was then coated with 5nm carbon (Quorum Technologies Turbo-Pumped Thermal Evaporators model K975X) and 5nm chromium in a sputter coater (Quorum Technologies Sputter Coater model K575X). Following the coating procedure, samples were imaged by an SEM (Gemini 1525 FEGSEM), operated at 10 kV. The instrument was equipped with both an inlens detector that recorded secondary electrons, and a backscatter electron detector. The DDC-SEM images were obtained by imaging a region in inlens mode and subsequently imaging the same region in backscatter mode. Using ImageJ software, both images were stacked and the inlens image was assigned to the green channel whereas the backscatter image was assigned to the red channel.
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2

Density-Dependent Color SEM Imaging

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For density-dependent color scanning electron microscopy (DDC-SEM) imaging, histologically sectioned samples, intact collagen hydrogels, or collagenase isolated hydrogel components on a glass slide were secured to an aluminum sample holder with carbon tape, and silver paint was applied to the area immediately surrounding each sample, which was then coated with 5nm carbon (Quorum Technologies Turbo-Pumped Thermal Evaporators model K975X) and 5nm chromium in a sputter coater (Quorum Technologies Sputter Coater model K575X). Following the coating procedure, samples were imaged by an SEM (Gemini 1525 FEGSEM), operated at 10 kV. The instrument was equipped with both an inlens detector that recorded secondary electrons, and a backscatter electron detector. The DDC-SEM images were obtained by imaging a region in inlens mode and subsequently imaging the same region in backscatter mode. Using ImageJ software, both images were stacked and the inlens image was assigned to the green channel whereas the backscatter image was assigned to the red channel.
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3

SEM Imaging and Focused Ion Beam Milling

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Samples were secured to an aluminium sample holder with carbon tape and carbon paste, which was then coated with 10 nm gold in a sputter coater (Quorum Technologies Sputter Coater model K575X). Following the coating procedure, samples were imaged by SEM (Carl Zeiss - Auriga) operating at 5 kV with a gallium ion beam operated at 30 kV. The samples was sectioned using 4-nA gallium current. The region exposed to milling was polished with 50-pA current and imaged by a backscattering detector with the electron beam operating at 1.5 V.
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4

Multimodal Imaging of Composite Materials

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Samples were dried using increasing concentrations of ethanol in water and finally in hexamethyldisilazane (HMDS) for 15 minutes. These samples were then sputter coated with 10 nm platinum (Leica EM SCD 500) and then imaged at an accelerating voltage of 5 kV (Leo 1550 Gemini, Zeiss, Germany). EDS was carried out using 80mm 2 X-Max Silicon Drift Detector and the AztecEnergy software (Oxford Instruments). The elemental analysis were collected in the form of a map together with the electron microscopy image and spectra, with an accelerating voltage of 20 kV and working distance of 8.5 mm for all samples. Density-dependent color scanning electron microscopy (DDC-SEM) imaging was performed with the composites attached to a sample holder, which was then coated with 10 nm chromium (Quorum Technologies Sputter Coater model K575X). The composites were imaged by SEM (Gemini 1525 FEGSEM), operating at 10 kV. The DDC-SEM images were obtained by imaging a region in backscatter mode and subsequently imaging the same region in the inlens mode. With the ImageJ software, images were stacked and the inlens image was assigned to the green channel whereas the backscatter image was assigned to the red channel.
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