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S 3400n sem

Manufactured by Hitachi
Sourced in Japan, United States

The S-3400N SEM is a Scanning Electron Microscope (SEM) manufactured by Hitachi. It is a versatile tool used for high-resolution imaging and analysis of a wide range of samples. The S-3400N SEM utilizes an electron beam to scan the surface of a sample, generating detailed images that reveal the sample's topography and composition. This product is designed to provide researchers and engineers with a reliable and efficient tool for their scientific and industrial applications.

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93 protocols using s 3400n sem

1

Microscopic Analysis of Plant Reproductive Structures

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Fresh young spikelet hulls and pistils were firstly fixed in FAA and dehydrated through a graded series of ethanol, then were embedded in epoxy resin (Pon812 Epoxy Embedding Kit; Sigma‐Aldrich, Saint Louis, MO, USA) and polymerized. 3‐μm‐thick sections for pistils and 8‐μm‐thick sections for spikelet hulls were stained with filtered 1% toluidine blue and examined under a light microscope (Nikon, Y‐TV55). The cell number and cell area were measured using ImageJ. To analyse the surface cells of pistils, scanning electron microscopy (SEM) examination was performed as described by Juarez et al. (2004 (link)) with some modifications. Fresh pistils were fixed in a glutaraldehyde fixative solution (2.5% glutaraldehyde in 0.08 M phosphoric acid buffer) for 24 h at 4°C and then dehydrated through a graded ethanol series (30%, 50%, 70%, 95% and 100%). Dehydrated samples were then dried by a critical point dryer with liquid CO2. Finally, the samples were coated with gold palladium using a Desk II sputter coater (Denton Vacuum, Moorestown, NJ) for 45 s before observation under a Hitachi S‐3400N SEM (Hitachi, Kyoto, Japan). To analyse the surface cells of the glumes, mature spikelet glumes were dried and coated with gold palladium, then were observed with a Hitachi S‐3400N SEM with an accelerating voltage of 5 kV.
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2

Scanning Electron Microscopy of Cured Adhesives

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Fractured cross-sections of the cured adhesives were analyzed using an S-3400N SEM produced by Hitachi (Tokyo, Japan) at the acceleration voltage of 12.5 kV. The section was observed after metal spraying.
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3

Flag Leaf Cuticle Imaging Technique

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For stoma counting and aperture observations, both sides of flag leaf sheaths were coated with 10% cellulose acetate dissolved in acetone using a paint brush. Air-dried for 5 min, the cellulose film was carefully peeled and the imprinted slides were observed under a light microscope at a magnification of 10x20. The fresh cuticle samples of flag leaf sheaths were sputtered with gold powder using the CrC-150 Sputtering System and inspected using a Hitachi S-3400N SEM (Hitachi, Tokyo, Japan).
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4

Microscopic Evaluation of GO-Treated F98 Cells

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F98 cells were seeded on coverslips in 12-well plates (5 × 104 cells/well) and cocultured with or without GO (60 μg/mL) for 24 h. Thereafter, the cells were fasted overnight with 2.5% glutaraldehyde at 4 °C and washed with PBS. Subsequently, 1% osmium tetroxide was added to treat the cells at 4 °C for 1 h. Finally, the cell coverslips were dehydrated with graded ethanol and gold sputtered. The cells were observed and photographed with a Hitachi S-3400N SEM.
For TEM observations, F98 cells were seeded in 6-well plates (105 cells/well) and then cocultured with or without GO (60 μg/mL) for 24 h. The cells were washed with PBS, harvested with trypsin, centrifuged at 800 rpm for 5 min, and then fasted with 2.5% glutaraldehyde for 50 min at room temperature and for 3 h at 4 ℃. After dehydration with a graded series of ethanol, the cells were embedded with epoxy resin at 90 °C for 3 days. Finally, ultrathin sections  (70 nm) were dyed with uranyl acetate-lead citrate and then observed and photographed by TEM.
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5

Microscopic Observation of Fusarium Infection

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For the observation of mycelium and conidia of F. graminearum on the surface of Arabidopsis buds, the buds were frozen in liquid nitrogen, transferred into the cryostorage of a preparation chamber for platinum coating, and then imaged using an S-3400N SEM (Hitachi) at an accelerating voltage of 2 kV.
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6

Microscopic Analysis of Ballast Tank Cysts

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Four ballast tank sediment samples (9055, 9059, 9067, and 9071), identified by molecular metrics as having high species diversity and abundance of cysts were selected for microscopic observations. For SEM observation, the cysts in 2 g wet sediment samples were concentrated with a density gradient centrifugation using sodium polytungstate (SPT) [44 (link)]. Cysts were fixed with osmium tetroxide (OsO4, 2% final concentration) for 40–50 min, gently filtered onto a 5 μm Millipore nylon membrane, dehydrated in an acetone series (10%, 30%, 50%, 70%, 90%, and 3 times in 100%), critical point-dried (automated critical point dryer, EM CPD 300, LEICA, Austria), sputter-coated with gold (Sputter/Carbon Thread, EM ACE200, LEICA, Austria), and observed with a S-3400N SEM (HiTACHI, Japan). For LM observation, 0.23 g of ballast sediment subsamples were suspended and well dispersed in filtered seawater in a 6-well culturing plate. The cysts were photographed using a digital camera (DP80, Olympus, Japan) coupled to an inverted microscope (IX73, Olympus, Japan).
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7

Cell Membrane Pore Characterization

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Cells were processed for electron microscopy as previously described [16 (link)]. Scanning electron microscopy (SEM) specimens were imaged with a S-3400N SEM (HITACHI, Tokyo, Japan). Transmission electron microscopy (TEM) specimens were imaged with a JEM-1220 TEM (JEOL Ltd, Tokyo, Japan). Pores on cell membrane were calculated and measured with Image-Pro Plus 6.0 for each image.
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8

Characterization of Wood-Based Materials

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The wood, cellulose network, and CPP samples were characterized with a scanning electron microscope (SEM) using a Hitachi S-3400N SEM (Tokyo, Japan) with an acceleration voltage of 5 kV. The Fourier transform infrared (FTIR) spectra of the wood, cellulose network, PANI, and CPP samples were measured with a Nicolet iS 50 FTIR instrument (Thermo Fisher Scientific Corp., Waltham, MA, USA). The spectra of each sample were recorded from 400 to 4000 cm−1 with 32 scans at a resolution of 4 cm−1. The ultraviolet–visible (UV−vis) spectra of electrode materials and devices were measured via a PerkinElmer Lambda 950 UV−vis spectroscopy (Waltham, MA, USA) with the wavelength of 250–800 nm. A three-electrode system was employed to investigate the electrochemical properties of the samples electrodes in 1 M H2SO4 electrolyte at room temperature. A silver-silver chloride (Ag/AgCl) electrode and Pt electrode were used as the reference and counter electrodes, respectively. The electrochemical properties of electrodes were tested by cyclic voltammetry (CV), galvanostatic charge–discharge (GCD) and electrochemical impedance spectroscopy (EIS) measurements on a Corrtest CS 310H electrochemical workstation (Wuhan, China).
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9

Characterizing RSF Nanoparticle Morphology

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The lyophilized powder was directly added on top of conductive tapes mounted on scanning electron microscopy (SEM) sample stubs. The morphologies of RSF nanoparticles were obtained with Hitachi S-3400N SEM at 15 kV. The as-prepared emulsion was diluted with de-ionized water before transmission electron microscopy (TEM) observation. TEM images were obtained with JEM-1400 at 200 kV.
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10

Electron Microscopy Sample Imaging

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The optical images were acquired using an Olympus BX53 upright microscope. Scanning Electron Microscopy (SEM) images were collected on a Hitachi S-3400N-II SEM microscope at Northwestern University's EPIC/NUANCE facility and on a Hitachi S-3400N SEM at the Laboratory of Electron Microscopy at University of Wroclaw (Poland). Accelerating voltage of 4–8 kV, and a secondary or backscattered electrons detector (SE or BSE) were used. Samples were coated with Au/Pd to ∼5 nm thickness using a Denton Desk IV Sputter Coater or a Cressington 108A Gold Evaporator before imaging.
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