S 3400n sem
The S-3400N SEM is a Scanning Electron Microscope (SEM) manufactured by Hitachi. It is a versatile tool used for high-resolution imaging and analysis of a wide range of samples. The S-3400N SEM utilizes an electron beam to scan the surface of a sample, generating detailed images that reveal the sample's topography and composition. This product is designed to provide researchers and engineers with a reliable and efficient tool for their scientific and industrial applications.
Lab products found in correlation
93 protocols using s 3400n sem
Microscopic Analysis of Plant Reproductive Structures
Scanning Electron Microscopy of Cured Adhesives
Flag Leaf Cuticle Imaging Technique
Microscopic Evaluation of GO-Treated F98 Cells
For TEM observations, F98 cells were seeded in 6-well plates (105 cells/well) and then cocultured with or without GO (60 μg/mL) for 24 h. The cells were washed with PBS, harvested with trypsin, centrifuged at 800 rpm for 5 min, and then fasted with 2.5% glutaraldehyde for 50 min at room temperature and for 3 h at 4 ℃. After dehydration with a graded series of ethanol, the cells were embedded with epoxy resin at 90 °C for 3 days. Finally, ultrathin sections (70 nm) were dyed with uranyl acetate-lead citrate and then observed and photographed by TEM.
Microscopic Observation of Fusarium Infection
Microscopic Analysis of Ballast Tank Cysts
Cell Membrane Pore Characterization
Characterization of Wood-Based Materials
Characterizing RSF Nanoparticle Morphology
Electron Microscopy Sample Imaging
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