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Gemini sigma 300 feg sem

Manufactured by Zeiss
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The Gemini Sigma 300 FEG SEM is a field emission scanning electron microscope (FEG SEM) developed by Zeiss. It features a high-resolution imaging capability and is designed for advanced materials analysis and characterization. The Gemini Sigma 300 FEG SEM provides precise and detailed images of a wide range of samples at the nanoscale level.

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Lab products found in correlation

D3200, by Nikon (3 mentions) X act x ray detector, by Oxford Instruments (2 mentions)

Close spelling variants of this product

Sigma 300 (401 citations) Gemini 300 (212 citations) Sigma SEM (28 citations) Sigma 300 SEM (21 citations) Gemini 300 SEM (12 citations) FEG-SEM (10 citations) Gemini Sigma 300 (9 citations) Sigma 300 FEG-SEM (2 citations) Sigma FEG SEM (2 citations)

4 protocols using gemini sigma 300 feg sem

1

Imaging with Scanning Electron Microscope

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Scanning electron micrographs were acquired using a Zeiss Gemini Sigma 300 FEG SEM at 5 keV electron beam energy. Optical micrographs were obtained with a Brunel SP202XM metallurgical microscope. A Nikon D3200 camera was attached to the microscope for the acquisition of the images using DigiCamControl open-source software.
Nunez-Bajo E., Silva Pinto Collins A., Kasimatis M., Cotur Y., Asfour T., Tanriverdi U., Grell M., Kaisti M., Senesi G., Stevenson K, & Güder F. (2020). Disposable silicon-based all-in-one micro-qPCR for apid on-site detection of pathogens. Nature Communications, 11, 6176.
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2

Comprehensive Characterization Techniques

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SEM micrographs were acquired using a Zeiss Gemini Sigma 300 FEG SEM at 5 keV electron beam energy. For elemental analysis, we used an Oxford Instruments X-act X-ray detector. Optical micrographs were obtained with a Brunel SP202XM metallurgical microscope. A Nikon D3200 type camera was attached to the microscope, and the images were processed through to a PC in real time using open-source DigiCamControl software to extract scale parameters.
Kasimatis M., Nunez-Bajo E., Grell M., Cotur Y., Barandun G., Kim J.S, & Güder F. (2019). Monolithic Solder-On Nanoporous Si-Cu Contacts for Stretchable Silicone Composite Sensors. ACS applied materials & interfaces, 11(50), 47577-47586.
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3

Titanium Surface Morphological Analysis

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Morphological observations of the titanium surfaces were obtained by scanning electron microscopy (SEM) using a Zeiss Gemini SIGMA 300 FEG SEM (Jena, Germany). Micrographs were obtained at 5 kV, with a backscattered detector and working distance of 7.5 mm.
De Santis S., Rossi E., Sebastiani M., Sennato S., Bemporad E, & Orsini M. (2021). A Nanoindentation Approach for Time-Dependent Evaluation of Surface Free Energy in Micro- and Nano-Structured Titanium. Materials, 15(1), 287.
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4

Comprehensive Characterization Techniques

Check if the same lab product or an alternative is used in the 5 most similar protocols
SEM micrographs were acquired using a Zeiss Gemini Sigma 300 FEG SEM at 5 keV electron beam energy. For elemental analysis, we used an Oxford Instruments X-act X-ray detector. Optical micrographs were obtained with a Brunel SP202XM metallurgical microscope. A Nikon D3200 type camera was attached to the microscope, and the images were processed through to a PC in real time using open-source DigiCamControl software to extract scale parameters.
Kasimatis M., Nunez-Bajo E., Grell M., Cotur Y., Barandun G., Kim J.S, & Güder F. (2019). Monolithic Solder-On Nanoporous Si-Cu Contacts for Stretchable Silicone Composite Sensors. ACS applied materials & interfaces, 11(50), 47577-47586.
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